smartctl 7.4 2023-08-01 r5530 [FreeBSD 13.2-RELEASE-p10 amd64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: MK0400GCTZA Serial Number: -- LU WWN Device Id: 5 5cd2e4 ... Firmware Version: 5DV1HPG4 User Capacity: 400,088,457,216 bytes [400 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: Not in smartctl database 7.3/5528 ATA Version is: ATA8-ACS T13/1699-D revision 4 SATA Version is: SATA 2.6, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Fri Mar 22 11:39:22 2024 EDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Unavailable Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 2) seconds. Offline data collection capabilities: (0x79) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 19) minutes. Conveyance self-test routine recommended polling time: ( 19) minutes. SCT capabilities: (0x0039) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 130 130 039 - 4294967295 5 Reallocated_Sector_Ct PO--CK 100 100 001 - 0 9 Power_On_Hours -O--CK 100 100 000 - 66069 173 Unknown_Attribute PO--CK 098 098 001 - 0 175 Program_Fail_Count_Chip PO--CK 100 100 010 - 1619702645379 180 Unused_Rsvd_Blk_Cnt_Tot PO-RCK 130 130 039 - 4294967295 194 Temperature_Celsius -O---K 100 100 000 - 25 196 Reallocated_Event_Count PO--CK 100 100 010 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x02 GPL,SL R/O 8 Comprehensive SMART error log 0x03 GPL,SL R/O 20 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 GPL,SL R/O 1 SMART self-test log 0x07 GPL,SL R/O 2 Extended self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 NCQ Command Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xb0 GPL,SL VS 1 Device vendor specific log 0xb1 GPL,SL VS 33 Device vendor specific log 0xb5 GPL,SL VS 1 Device vendor specific log 0xb6 GPL,SL VS 127 Device vendor specific log 0xd0 GPL,SL VS 1 Device vendor specific log 0xd1 GPL VS 13056 Device vendor specific log 0xdf GPL VS 1152 Device vendor specific log 0xdf SL VS 128 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (20 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (2 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 64981 - # 2 Extended offline Completed without error 00% 32169 - # 3 Extended offline Completed without error 00% 30990 - # 4 Short offline Completed without error 00% 30938 - # 5 Short offline Completed without error 00% 19258 - # 6 Short offline Completed without error 00% 15724 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 1 (0x0001) Device State: Active (0) Current Temperature: 25 Celsius Power Cycle Min/Max Temperature: 15/33 Celsius Lifetime Min/Max Temperature: 8/44 Celsius Specified Max Operating Temperature: 55 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/55 Celsius Min/Max Temperature Limit: 0/55 Celsius Temperature History Size (Index): 478 (339) SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 127 --- Lifetime Power-On Resets 0x01 0x018 6 607550329427 --- Logical Sectors Written 0x01 0x020 6 4844487627 --- Number of Write Commands 0x01 0x028 6 58272474363 --- Logical Sectors Read 0x01 0x030 6 423633600 --- Number of Read Commands 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 25 --- Current Temperature 0x05 0x010 1 24 --- Average Short Term Temperature 0x05 0x018 1 23 --- Average Long Term Temperature 0x05 0x020 1 44 --- Highest Temperature 0x05 0x028 1 10 --- Lowest Temperature 0x05 0x030 1 36 --- Highest Average Short Term Temperature 0x05 0x038 1 10 --- Lowest Average Short Term Temperature 0x05 0x040 1 34 --- Highest Average Long Term Temperature 0x05 0x048 1 11 --- Lowest Average Long Term Temperature 0x05 0x050 4 0 --- Time in Over-Temperature 0x05 0x058 1 55 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 39308 --- Number of Hardware Resets 0x06 0x010 4 818 --- Number of ASR Events 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 2 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0003 4 0 R_ERR response for device-to-host data FIS 0x0004 4 0 R_ERR response for host-to-device data FIS 0x0006 4 0 R_ERR response for device-to-host non-data FIS 0x000a 4 33 Device-to-host register FISes sent due to a COMRESET 0x000b 4 0 CRC errors within host-to-device FIS 0x000d 4 0 Non-CRC errors within host-to-device FIS