smartctl 7.2 2021-09-14 r5236 [FreeBSD 12.1-RELEASE-p21-HBSD amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Intel 525 Series SSDs Device Model: INTEL SSDMCEAC030B3 Serial Number: -- LU WWN Device Id: 5 5cd2e4 ... Firmware Version: LLLi User Capacity: 30,016,659,456 bytes [30.0 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device TRIM Command: Available, deterministic Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2 (minor revision not indicated) SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Jan 12 21:10:45 2022 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 732) seconds. Offline data collection capabilities: (0x7f) SMART execute Offline immediate. Auto Offline data collection on/off support. Abort Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 48) minutes. Conveyance self-test routine recommended polling time: ( 2) minutes. SCT capabilities: (0x0021) SCT Status supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct -O--CK 100 100 000 - 0 9 Power_On_Hours_and_Msec -O--CK 100 100 000 - 5698h+34m+15.490s 12 Power_Cycle_Count -O--CK 100 100 000 - 1917 170 Available_Reservd_Space PO--CK 100 100 010 - 0 171 Program_Fail_Count -O--CK 100 100 000 - 0 172 Erase_Fail_Count -O--CK 100 100 000 - 0 174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 411 183 SATA_Downshift_Count -O--CK 100 100 000 - 2 184 End-to-End_Error PO--CK 100 100 090 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 050 - 0 190 Airflow_Temperature_Cel -O---K 038 090 000 - 38 (Min/Max 14/90) 192 Power-Off_Retract_Count -O--CK 100 100 000 - 411 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0 225 Host_Writes_32MiB -O--CK 100 100 000 - 33112 226 Workld_Media_Wear_Indic -O--CK 100 100 000 - 65535 227 Workld_Host_Reads_Perc -O--CK 100 100 000 - 31 228 Workload_Minutes -O--CK 100 100 000 - 65535 232 Available_Reservd_Space PO--CK 100 100 010 - 0 233 Media_Wearout_Indicator -O--CK 100 100 000 - 0 241 Host_Writes_32MiB -O--CK 100 100 000 - 33112 242 Host_Reads_32MiB -O--CK 100 100 000 - 15256 249 NAND_Writes_1GiB PO--C- 100 100 000 - 1034 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x04 GPL,SL R/O 1 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xb7 GPL,SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log not supported SMART Extended Self-test Log Version: 0 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 0 (0x0000) Device State: Active (0) Current Temperature: 37 Celsius Power Cycle Min/Max Temperature: 27/45 Celsius Lifetime Min/Max Temperature: 14/90 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 0 (Unknown, should be 2) Temperature Sampling Period: 1 minute Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/ 0 Celsius Min/Max Temperature Limit: 0/ 0 Celsius Temperature History Size (Index): 0 (75) Temperature History is empty SCT Error Recovery Control command not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 2) == 0x01 0x008 4 1925 --- Lifetime Power-On Resets 0x01 0x010 4 5706 --- Power-on Hours 0x01 0x018 6 2261115377 --- Logical Sectors Written 0x01 0x028 6 1075625162 --- Logical Sectors Read 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 25609 --- Resets Between Cmd Acceptance and Completion 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 25609 --- Number of Hardware Resets 0x06 0x010 4 8790 --- Number of ASR Events 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 255 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 10 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 7 Device-to-host register FISes sent due to a COMRESET 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC 0x0002 2 0 R_ERR response for data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS