smartctl 7.4 2023-08-01 r5530 [FreeBSD 13.2-RELEASE-p2 amd64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Silicon Motion based SSDs Device Model: TS256GMSA230S Serial Number: -- LU WWN Device Id: 5 7c3548 ... Firmware Version: 22Z2UCFS User Capacity: 256,060,514,304 bytes [256 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database 7.3/5528 ATA Version is: ACS-3 T13/2161-D revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Aug 15 10:25:25 2023 EDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 30) minutes. Conveyance self-test routine recommended polling time: ( 2) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate ------ 100 100 000 - 0 5 Reallocated_Sector_Ct ------ 100 100 000 - 0 9 Power_On_Hours ------ 100 100 000 - 38 12 Power_Cycle_Count ------ 100 100 000 - 6 148 Total_SLC_Erase_Ct ------ 100 100 000 - 175 149 Max_SLC_Erase_Ct ------ 100 100 000 - 7 150 Min_SLC_Erase_Ct ------ 100 100 000 - 0 151 Average_SLC_Erase_Ct ------ 100 100 000 - 2 159 DRAM_1_Bit_Error_Count ------ 100 100 000 - 0 160 Uncorrectable_Error_Cnt ------ 100 100 000 - 0 161 Valid_Spare_Block_Cnt ------ 100 100 000 - 110 163 Initial_Bad_Block_Count ------ 100 100 000 - 9 164 Total_Erase_Count ------ 100 100 000 - 897 165 Max_Erase_Count ------ 100 100 000 - 1 166 Min_Erase_Count ------ 100 100 000 - 0 167 Average_Erase_Count ------ 100 100 000 - 0 168 Max_Erase_Count_of_Spec ------ 100 100 000 - 3000 169 Remaining_Lifetime_Perc ------ 100 100 000 - 100 177 Wear_Leveling_Count ------ 100 100 050 - 0 181 Program_Fail_Cnt_Total ------ 100 100 000 - 0 182 Erase_Fail_Count_Total ------ 100 100 000 - 0 192 Power-Off_Retract_Count ------ 100 100 000 - 1 194 Temperature_Celsius ------ 100 100 000 - 52 195 Hardware_ECC_Recovered ------ 100 100 000 - 0 196 Reallocated_Event_Count ------ 100 100 016 - 0 199 UDMA_CRC_Error_Count ------ 100 100 050 - 0 232 Available_Reservd_Space ------ 100 100 000 - 100 241 Host_Writes_32MiB ------ 100 100 000 - 1462 242 Host_Reads_32MiB ------ 100 100 000 - 136 245 TLC_Writes_32MiB ------ 100 100 000 - 4709 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x24 GPL R/O 88 Current Device Internal Status Data log 0x25 GPL R/O 64 Saved Device Internal Status Data log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Completed [00% left] (0-65535) Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 6 --- Lifetime Power-On Resets 0x01 0x010 4 38 --- Power-on Hours 0x01 0x018 6 95854886 --- Logical Sectors Written 0x01 0x020 6 1482701 --- Number of Write Commands 0x01 0x028 6 8919203 --- Logical Sectors Read 0x01 0x030 6 406994 --- Number of Read Commands 0x01 0x038 6 137516872 --- Date and Time TimeStamp 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 1 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 52 --- Current Temperature 0x05 0x010 1 47 --- Average Short Term Temperature 0x05 0x018 1 46 --- Average Long Term Temperature 0x05 0x020 1 72 --- Highest Temperature 0x05 0x028 1 29 --- Lowest Temperature 0x05 0x030 1 52 --- Highest Average Short Term Temperature 0x05 0x038 1 46 --- Lowest Average Short Term Temperature 0x05 0x040 1 52 --- Highest Average Long Term Temperature 0x05 0x048 1 46 --- Lowest Average Long Term Temperature 0x05 0x050 4 0 --- Time in Over-Temperature 0x05 0x058 1 65 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 17 --- Number of Hardware Resets 0x06 0x010 4 3 --- Number of ASR Events 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 16 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC