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Andrey Ponomarenko
2023-02-18 02:02:03 +03:00
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SSD/Samsung/MZ7/MZ7L3240HCHQ-00A07 240GB/68778A73AAD4 Normal file
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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p5 amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZ7L3240HCHQ-00A07
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: JXTC304Q
User Capacity: 240,057,409,536 bytes [240 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database 7.3/5319
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Feb 14 12:33:49 2023 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 25) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 201
12 Power_Cycle_Count -O--CK 099 099 000 - 10
177 Wear_Leveling_Count PO--C- 099 099 005 - 1
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 222
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 057 052 000 - 43
194 Temperature_Celsius -O---K 057 052 000 - 43 (Min/Max 26/48)
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
202 Unknown_SSD_Attribute PO--CK 100 100 010 - 0
235 Unknown_Attribute -O--C- 099 099 000 - 5
241 Total_LBAs_Written -O--CK 099 099 000 - 360978890
242 Total_LBAs_Read -O--CK 099 099 000 - 1783221
243 Unknown_Attribute -O--CK 100 100 000 - 0
244 Unknown_Attribute -O--CK 100 100 000 - 0
245 Unknown_Attribute -O--CK 100 100 000 - 65535
246 Unknown_Attribute -O--CK 100 100 000 - 65535
247 Unknown_Attribute -O--CK 100 100 000 - 65535
251 Unknown_Attribute -O--CK 100 100 000 - 430262912
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x12 GPL R/O 1 SATA NCQ Non-Data log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
256 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 43 Celsius
Power Cycle Min/Max Temperature: 26/45 Celsius
Lifetime Min/Max Temperature: 26/48 Celsius
Specified Max Operating Temperature: 70 Celsius
Under/Over Temperature Limit Count: 0/0
SMART Status: 0xc24f (PASSED)
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (62)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 10 --- Lifetime Power-On Resets
0x01 0x010 4 201 --- Power-on Hours
0x01 0x018 6 360978890 --- Logical Sectors Written
0x01 0x020 6 12504689 --- Number of Write Commands
0x01 0x028 6 1783221 --- Logical Sectors Read
0x01 0x030 6 85115 --- Number of Read Commands
0x01 0x038 6 838000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 43 --- Current Temperature
0x05 0x020 1 48 --- Highest Temperature
0x05 0x028 1 26 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 49 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

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smartctl 7.3 2022-02-28 r5338 [FreeBSD 14.0-CURRENT amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: MZMPC032HBCD-000L1
Serial Number: --
Firmware Version: CXM13L1Q
User Capacity: 32,017,047,552 bytes [32.0 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database 7.3/5319
ATA Version is: ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri Feb 17 16:16:41 2023
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 180) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 3) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
9 Power_On_Hours -O--CK 098 098 000 - 8319
12 Power_Cycle_Count -O--CK 095 095 000 - 4343
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 093 093 017 - 243
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 089 089 010 - 44
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 092 092 010 - 58
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 092 092 010 - 758
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 059 041 000 - 41
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 253 253 000 - 0
233 Media_Wearout_Indicator -O-RCK 198 198 000 - 311
234 Unknown_Attribute -O--C- 100 100 000 - 0
235 Unknown_Attribute -O--C- 099 099 000 - 74
236 Unknown_Attribute -O--C- 099 099 000 - 82
237 Unknown_Attribute -O--C- 099 099 000 - 243
238 Unknown_Attribute -O--C- 099 099 000 - 58
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 2 Comprehensive SMART error log
0x03 GPL,SL R/O 2 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 2 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 414 -
# 2 Short offline Completed without error 00% 184 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 49152 R_ERR response for data FIS
0x0003 2 53248 R_ERR response for device-to-host data FIS
0x0004 2 57344 R_ERR response for host-to-device data FIS
0x0005 2 7952 R_ERR response for non-data FIS
0x0006 2 2562 R_ERR response for device-to-host non-data FIS
0x0007 2 4096 R_ERR response for host-to-device non-data FIS
0x0008 2 7952 Device-to-host non-data FIS retries
0x0009 2 7953 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 23857 Device-to-host register FISes sent due to a COMRESET
0x000b 2 6145 CRC errors within host-to-device FIS
0x000d 2 7953 Non-CRC errors within host-to-device FIS
0x000f 2 8176 R_ERR response for host-to-device data FIS, CRC
0x0010 2 15 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 49153 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 12112 R_ERR response for host-to-device non-data FIS, non-CRC

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smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-RELEASE amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 850 EVO 250GB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: EMT02B6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Feb 15 14:36:16 2023 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 133) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 097 097 000 - 14451
12 Power_Cycle_Count -O--CK 099 099 000 - 844
177 Wear_Leveling_Count PO--C- 097 097 000 - 58
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 074 061 000 - 26
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 4
241 Total_LBAs_Written -O--CK 099 099 000 - 30839925486
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: ? Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: 20/40 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (2)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 7 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 7 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

196
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smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p6 amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 860 EVO M.2 1TB
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: RVT24B6Q
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: M.2
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database 7.3/5319
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Feb 16 18:39:34 2023 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 4422
12 Power_Cycle_Count -O--CK 099 099 000 - 15
177 Wear_Leveling_Count PO--C- 100 100 000 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 060 054 000 - 40
195 ECC_Error_Rate -O-RC- 200 200 000 - 0
199 CRC_Error_Count -OSRCK 100 100 000 - 0
235 POR_Recovery_Count -O--C- 099 099 000 - 9
241 Total_LBAs_Written -O--CK 099 099 000 - 1098385632
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xa5 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 40 Celsius
Power Cycle Min/Max Temperature: 37/46 Celsius
Lifetime Min/Max Temperature: 26/46 Celsius
Specified Max Operating Temperature: 70 Celsius
Under/Over Temperature Limit Count: 0/0
SMART Status: 0xc24f (PASSED)
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: 0/70 Celsius
Temperature History Size (Index): 128 (62)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 15 --- Lifetime Power-On Resets
0x01 0x010 4 4422 --- Power-on Hours
0x01 0x018 6 1098385632 --- Logical Sectors Written
0x01 0x020 6 19671188 --- Number of Write Commands
0x01 0x028 6 12345014 --- Logical Sectors Read
0x01 0x030 6 278924 --- Number of Read Commands
0x01 0x038 6 1480000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 9 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 40 --- Current Temperature
0x05 0x020 1 46 --- Highest Temperature
0x05 0x028 1 26 --- Lowest Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 66 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 2 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 31 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 31 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC