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Update of reports (new: 1098, modified: 0)

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Andrey Ponomarenko
2020-11-03 14:43:05 +03:00
parent f8d5dc7417
commit 51569f7bd1
1098 changed files with 194109 additions and 0 deletions

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smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p7 i386] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Fujitsu MHS AT
Device Model: FUJITSU MHS2040AT D
Serial Number: --
Firmware Version: 8004
User Capacity: 40,007,761,920 bytes [40.0 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-6 T13/1410D revision 3a
Local Time is: Thu Jul 9 18:25:59 2020 JST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM level is: 64 (unknown/retired), recommended: 0
APM level is: 128 (minimum power consumption without standby)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 414) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 55) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-- 100 100 046 - 124800
2 Throughput_Performance P-S--- 100 100 030 - 0
3 Spin_Up_Time PO---- 097 076 025 - 24832
4 Start_Stop_Count -O--CK 034 034 000 - 39599
5 Reallocated_Sector_Ct PO--CK 099 099 024 - 26
7 Seek_Error_Rate POSR-- 100 081 047 - 3144
8 Seek_Time_Performance P-S--- 100 100 019 - 0
9 Power_On_Seconds -O--CK 001 001 000 - 32035h+20m+11s
10 Spin_Retry_Count PO--C- 100 010 020 Past 0
12 Power_Cycle_Count -O--CK 001 001 000 - 35055
192 Emerg_Retract_Cycle_Ct -O--CK 098 098 000 - 399
193 Load_Cycle_Count -O--CK 001 001 000 - 1480255
194 Temperature_Celsius -O---K 100 040 000 - 43 (Min/Max 9/67)
195 Hardware_ECC_Recovered -O-RC- 100 100 000 - 756
196 Reallocated_Event_Count -O--CK 099 099 000 - 7
197 Current_Pending_Sector -O--C- 100 090 000 - 0
198 Offline_Scan_UNC_SectCt ----C- 097 097 000 - 6
199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 0
200 Write_Error_Count POSR-- 100 100 060 - 20484
203 Run_Out_Cancel -O---- 097 097 000 - 2619843413278
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory not supported
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x09 SL R/W 1 Selective self-test log
0x80-0x9f SL R/W 16 Host vendor specific log
0xa1-0xa3 SL VS 1 Device vendor specific log
SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
SMART Error Log Version: 1
ATA Error Count: 1079 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1079 occurred at disk power-on lifetime: 30149 hours (1256 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 59 04 24 0a 66 e0 Error: UNC 4 sectors at LBA = 0x00660a24 = 6687268
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 20 0a 66 e0 00 00:01:08.223 READ DMA
Error 1078 occurred at disk power-on lifetime: 30149 hours (1256 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 59 04 24 0a 66 e0 Error: UNC 4 sectors at LBA = 0x00660a24 = 6687268
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 20 0a 66 e0 00 00:01:03.137 READ DMA
Error 1077 occurred at disk power-on lifetime: 14338 hours (597 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 59 2a f8 e7 2d e3 Error: UNC 42 sectors at LBA = 0x032de7f8 = 53340152
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 40 e2 e7 2d e3 00 22d+05:29:07.677 READ DMA
Error 1076 occurred at disk power-on lifetime: 14338 hours (597 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
01 51 40 e2 1e 2e e3 Error: AMNF 64 sectors at LBA = 0x032e1ee2 = 53354210
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 40 e2 1e 2e e3 00 22d+05:28:58.960 READ DMA
Error 1075 occurred at disk power-on lifetime: 5660 hours (235 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 59 01 33 24 66 e2 Error: UNC at LBA = 0x02662433 = 40248371
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
20 ff 01 33 24 66 e2 00 01:11:04.895 READ SECTOR(S)
SMART Extended Self-test Log (GP Log 0x07) not supported
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11) not supported