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Update of reports (new: 1098, modified: 0)
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HDD/Fujitsu/MHS2040/MHS2040AT D/76130F47F4FF
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HDD/Fujitsu/MHS2040/MHS2040AT D/76130F47F4FF
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smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p7 i386] (local build)
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Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Family: Fujitsu MHS AT
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Device Model: FUJITSU MHS2040AT D
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Serial Number: --
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Firmware Version: 8004
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User Capacity: 40,007,761,920 bytes [40.0 GB]
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Sector Size: 512 bytes logical/physical
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Device is: In smartctl database [for details use: -P show]
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ATA Version is: ATA/ATAPI-6 T13/1410D revision 3a
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Local Time is: Thu Jul 9 18:25:59 2020 JST
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM level is: 64 (unknown/retired), recommended: 0
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APM level is: 128 (minimum power consumption without standby)
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Rd look-ahead is: Enabled
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Write cache is: Enabled
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DSN feature is: Unavailable
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ATA Security is: Disabled, frozen [SEC2]
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Wt Cache Reorder: Unavailable
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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See vendor-specific Attribute list for marginal Attributes.
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General SMART Values:
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Offline data collection status: (0x00) Offline data collection activity
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was never started.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 414) seconds.
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Offline data collection
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capabilities: (0x7b) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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No General Purpose Logging support.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 55) minutes.
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Conveyance self-test routine
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recommended polling time: ( 2) minutes.
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SMART Attributes Data Structure revision number: 16
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate POSR-- 100 100 046 - 124800
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2 Throughput_Performance P-S--- 100 100 030 - 0
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3 Spin_Up_Time PO---- 097 076 025 - 24832
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4 Start_Stop_Count -O--CK 034 034 000 - 39599
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5 Reallocated_Sector_Ct PO--CK 099 099 024 - 26
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7 Seek_Error_Rate POSR-- 100 081 047 - 3144
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8 Seek_Time_Performance P-S--- 100 100 019 - 0
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9 Power_On_Seconds -O--CK 001 001 000 - 32035h+20m+11s
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10 Spin_Retry_Count PO--C- 100 010 020 Past 0
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12 Power_Cycle_Count -O--CK 001 001 000 - 35055
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192 Emerg_Retract_Cycle_Ct -O--CK 098 098 000 - 399
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193 Load_Cycle_Count -O--CK 001 001 000 - 1480255
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194 Temperature_Celsius -O---K 100 040 000 - 43 (Min/Max 9/67)
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195 Hardware_ECC_Recovered -O-RC- 100 100 000 - 756
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196 Reallocated_Event_Count -O--CK 099 099 000 - 7
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197 Current_Pending_Sector -O--C- 100 090 000 - 0
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198 Offline_Scan_UNC_SectCt ----C- 097 097 000 - 6
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199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 0
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200 Write_Error_Count POSR-- 100 100 060 - 20484
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203 Run_Out_Cancel -O---- 097 097 000 - 2619843413278
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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General Purpose Log Directory not supported
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SMART Log Directory Version 1 [multi-sector log support]
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Address Access R/W Size Description
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0x00 SL R/O 1 Log Directory
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0x01 SL R/O 1 Summary SMART error log
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0x02 SL R/O 51 Comprehensive SMART error log
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0x06 SL R/O 1 SMART self-test log
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0x09 SL R/W 1 Selective self-test log
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0x80-0x9f SL R/W 16 Host vendor specific log
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0xa1-0xa3 SL VS 1 Device vendor specific log
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SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
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SMART Error Log Version: 1
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ATA Error Count: 1079 (device log contains only the most recent five errors)
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CR = Command Register [HEX]
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FR = Features Register [HEX]
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SC = Sector Count Register [HEX]
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SN = Sector Number Register [HEX]
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CL = Cylinder Low Register [HEX]
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CH = Cylinder High Register [HEX]
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DH = Device/Head Register [HEX]
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DC = Device Command Register [HEX]
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ER = Error register [HEX]
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ST = Status register [HEX]
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Powered_Up_Time is measured from power on, and printed as
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DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
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SS=sec, and sss=millisec. It "wraps" after 49.710 days.
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Error 1079 occurred at disk power-on lifetime: 30149 hours (1256 days + 5 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 59 04 24 0a 66 e0 Error: UNC 4 sectors at LBA = 0x00660a24 = 6687268
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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c8 00 08 20 0a 66 e0 00 00:01:08.223 READ DMA
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Error 1078 occurred at disk power-on lifetime: 30149 hours (1256 days + 5 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 59 04 24 0a 66 e0 Error: UNC 4 sectors at LBA = 0x00660a24 = 6687268
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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c8 00 08 20 0a 66 e0 00 00:01:03.137 READ DMA
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Error 1077 occurred at disk power-on lifetime: 14338 hours (597 days + 10 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 59 2a f8 e7 2d e3 Error: UNC 42 sectors at LBA = 0x032de7f8 = 53340152
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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c8 00 40 e2 e7 2d e3 00 22d+05:29:07.677 READ DMA
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Error 1076 occurred at disk power-on lifetime: 14338 hours (597 days + 10 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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01 51 40 e2 1e 2e e3 Error: AMNF 64 sectors at LBA = 0x032e1ee2 = 53354210
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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c8 00 40 e2 1e 2e e3 00 22d+05:28:58.960 READ DMA
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Error 1075 occurred at disk power-on lifetime: 5660 hours (235 days + 20 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 59 01 33 24 66 e2 Error: UNC at LBA = 0x02662433 = 40248371
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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20 ff 01 33 24 66 e2 00 01:11:04.895 READ SECTOR(S)
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SMART Extended Self-test Log (GP Log 0x07) not supported
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SMART Self-test log structure revision number 1
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No self-tests have been logged. [To run self-tests, use: smartctl -t]
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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SCT Commands not supported
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Device Statistics (GP/SMART Log 0x04) not supported
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Pending Defects log (GP Log 0x0c) not supported
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SATA Phy Event Counters (GP Log 0x11) not supported
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