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Andrey Ponomarenko
2020-11-03 14:43:05 +03:00
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smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p8 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.7 and 7200.7 Plus
Device Model: ST380817AS
Serial Number: --
Firmware Version: 3.42
User Capacity: 80,025,280,000 bytes [80.0 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-6 T13/1410D revision 2
Local Time is: Thu Aug 6 13:51:23 2020 +05
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 47) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-- 057 049 006 - 74175094
3 Spin_Up_Time PO---- 098 098 000 - 0
4 Start_Stop_Count -O--CK 099 099 020 - 1746
5 Reallocated_Sector_Ct PO--CK 100 100 036 - 0
7 Seek_Error_Rate POSR-- 088 060 030 - 717210961
9 Power_On_Hours -O--CK 073 073 000 - 23935
10 Spin_Retry_Count PO--C- 100 100 097 - 0
12 Power_Cycle_Count -O--CK 099 099 020 - 1715
194 Temperature_Celsius -O---K 036 047 000 - 36 (0 15 0 0 0)
195 Hardware_ECC_Recovered -O-RC- 057 049 000 - 74175094
197 Current_Pending_Sector -O--C- 100 100 000 - 0
198 Offline_Uncorrectable ----C- 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 0
200 Multi_Zone_Error_Rate ------ 100 253 000 - 0
202 Data_Address_Mark_Errs -O--CK 100 253 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory not supported
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 5 Comprehensive SMART error log
0x03 SL R/O 5 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 SL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x20 SL R/O 1 Streaming performance log [OBS-8]
0x21 SL R/O 1 Write stream error log
0x22 SL R/O 1 Read stream error log
0x23 SL R/O 1 Delayed sector log [OBS-8]
0x80-0x9f SL R/W 16 Host vendor specific log
0xa0 SL VS 1 Device vendor specific log
0xa1 SL VS 20 Device vendor specific log
0xa2 SL VS 101 Device vendor specific log
0xa8 SL VS 20 Device vendor specific log
0xa9 SL VS 1 Device vendor specific log
0xe0 SL R/W 1 SCT Command/Status
0xe1 SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
SMART Error Log Version: 1
ATA Error Count: 54 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 54 occurred at disk power-on lifetime: 22112 hours (921 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 10 60 f0 50 e0 Error: IDNF 16 sectors at LBA = 0x0050f060 = 5304416
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 20 10 60 f0 50 e0 00 11:02:14.065 READ DMA EXT
25 20 10 f0 ee 50 e0 00 11:02:14.064 READ DMA EXT
25 20 10 e0 ee 50 e0 00 11:02:14.064 READ DMA EXT
25 20 10 d0 ee 50 e0 00 11:02:14.060 READ DMA EXT
25 20 10 c0 ee 50 e0 00 11:02:14.069 READ DMA EXT
Error 53 occurred at disk power-on lifetime: 22098 hours (920 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 10 60 f0 50 e0 Error: IDNF 16 sectors at LBA = 0x0050f060 = 5304416
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 20 10 60 f0 50 e0 00 21:37:51.656 READ DMA EXT
25 20 10 f0 ee 50 e0 00 21:37:51.656 READ DMA EXT
25 20 10 e0 ee 50 e0 00 21:37:51.656 READ DMA EXT
25 20 10 d0 ee 50 e0 00 21:37:51.656 READ DMA EXT
25 20 10 c0 ee 50 e0 00 21:37:51.655 READ DMA EXT
Error 52 occurred at disk power-on lifetime: 22029 hours (917 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 10 60 f0 50 e0 Error: IDNF 16 sectors at LBA = 0x0050f060 = 5304416
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 20 10 60 f0 50 e0 00 00:00:28.800 READ DMA EXT
25 20 10 f0 ee 50 e0 00 00:00:28.799 READ DMA EXT
25 20 10 e0 ee 50 e0 00 00:00:28.799 READ DMA EXT
25 20 10 d0 ee 50 e0 00 00:00:28.799 READ DMA EXT
25 20 10 c0 ee 50 e0 00 00:00:28.799 READ DMA EXT
Error 51 occurred at disk power-on lifetime: 22029 hours (917 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 10 60 f0 50 e0 Error: IDNF 16 sectors at LBA = 0x0050f060 = 5304416
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 20 10 60 f0 50 e0 00 00:06:38.221 READ DMA EXT
25 20 10 f0 ee 50 e0 00 00:06:38.220 READ DMA EXT
25 20 10 e0 ee 50 e0 00 00:06:38.220 READ DMA EXT
25 20 10 d0 ee 50 e0 00 00:06:38.220 READ DMA EXT
25 20 10 c0 ee 50 e0 00 00:06:38.219 READ DMA EXT
Error 50 occurred at disk power-on lifetime: 22029 hours (917 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 10 60 f0 50 e0 Error: IDNF 16 sectors at LBA = 0x0050f060 = 5304416
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 20 10 60 f0 50 e0 00 00:01:21.205 READ DMA EXT
25 20 10 f0 ee 50 e0 00 00:01:21.204 READ DMA EXT
25 20 10 e0 ee 50 e0 00 00:01:21.204 READ DMA EXT
25 20 10 d0 ee 50 e0 00 00:01:21.200 READ DMA EXT
25 20 10 c0 ee 50 e0 00 00:01:21.209 READ DMA EXT
SMART Extended Self-test Log (GP Log 0x07) not supported
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11) not supported