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Andrey Ponomarenko
2020-11-03 14:43:05 +03:00
parent f8d5dc7417
commit 51569f7bd1
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smartctl 7.1 2019-12-30 r5022 [x86_64-unknown-openbsd6.8] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Apple SD/SM/TS...E/F/G SSDs
Device Model: APPLE SSD SM0128G
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: BXZ33A0Q
User Capacity: 121,332,826,112 bytes [121 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Oct 20 17:25:13 2020 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x001a 200 200 000 Old_age Always - 0
5 Reallocated_Sector_Ct 0x0033 100 100 000 Pre-fail Always - 0
9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 2947
12 Power_Cycle_Count 0x0032 096 096 000 Old_age Always - 4011
169 Unknown_Apple_Attrib 0x0013 253 253 010 Pre-fail Always - 725887222240
173 Wear_Leveling_Count 0x0032 197 197 100 Old_age Always - 98792046647
174 Host_Reads_MiB 0x0022 099 099 000 Old_age Always - 4064171
175 Host_Writes_MiB 0x0022 099 099 000 Old_age Always - 4742519
192 Power-Off_Retract_Count 0x0012 099 099 000 Old_age Always - 102
194 Temperature_Celsius 0x0022 050 027 000 Old_age Always - 50 (Min/Max 18/73)
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
199 UDMA_CRC_Error_Count 0x001a 200 199 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

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smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p6 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Apple SD/SM/TS...E/F/G SSDs
Device Model: APPLE SSD SM0128G
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: BXZ33A0Q
User Capacity: 121,332,826,112 bytes [121 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun Oct 4 07:22:02 2020 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O-RC- 200 200 000 - 0
5 Reallocated_Sector_Ct PO--CK 100 100 000 - 0
9 Power_On_Hours -O--CK 099 099 000 - 1429
12 Power_Cycle_Count -O--CK 097 097 000 - 2730
169 Unknown_Apple_Attrib PO--C- 253 253 010 - 867621143008
173 Wear_Leveling_Count -O--CK 193 193 100 - 34373763133
174 Host_Reads_MiB -O---K 099 099 000 - 8018730
175 Host_Writes_MiB -O---K 099 099 000 - 2771710
192 Power-Off_Retract_Count -O--C- 099 099 000 - 64
194 Temperature_Celsius -O---K 060 028 000 - 40 (Min/Max 20/72)
197 Current_Pending_Sector -O---K 100 100 000 - 0
199 UDMA_CRC_Error_Count -O-RC- 200 200 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xaa GPL,SL VS 4 Device vendor specific log
0xab GPL,SL VS 1 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x000a 4 35 Device-to-host register FISes sent due to a COMRESET
0x8fff 14: Invalid entry

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smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p6 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Apple SD/SM/TS...E/F/G SSDs
Device Model: APPLE SSD SM0512G
Serial Number: --
LU WWN Device Id: 5 002538 ...
Firmware Version: BXZ13A0Q
User Capacity: 500,277,790,720 bytes [500 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Sep 21 23:01:58 2020 BST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O-RC- 200 200 000 - 0
5 Reallocated_Sector_Ct PO--CK 100 100 000 - 0
9 Power_On_Hours -O--CK 099 099 000 - 4091
12 Power_Cycle_Count -O--CK 087 087 000 - 13070
169 Unknown_Apple_Attrib PO--C- 253 253 010 - 2933613660032
173 Wear_Leveling_Count -O--CK 194 194 100 - 42963107907
174 Host_Reads_MiB -O---K 099 099 000 - 23241814
175 Host_Writes_MiB -O---K 099 099 000 - 25031291
192 Power-Off_Retract_Count -O--C- 099 099 000 - 229
194 Temperature_Celsius -O---K 067 022 000 - 33 (Min/Max 0/78)
197 Current_Pending_Sector -O---K 100 100 000 - 0
199 UDMA_CRC_Error_Count -O-RC- 200 200 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xaa GPL,SL VS 13 Device vendor specific log
0xab GPL,SL VS 1 Device vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x000a 4 4 Device-to-host register FISes sent due to a COMRESET
0x8fff 14: Invalid entry