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mirror of https://github.com/bsdhw/SMART.git synced 2025-05-31 16:21:41 +05:30

Update of reports (new: 1098, modified: 0)

This commit is contained in:
Andrey Ponomarenko
2020-11-03 14:43:05 +03:00
parent f8d5dc7417
commit 51569f7bd1
1098 changed files with 194109 additions and 0 deletions

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smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p8 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Crucial/Micron BX/MX1/2/3/500, M5/600, 1100 SSDs
Device Model: Micron 1100 SATA 256GB
Serial Number: --
LU WWN Device Id: 5 00a075 ...
Firmware Version: M0DL003
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: M.2
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Aug 20 14:27:22 2020 +08
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 678) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 4) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocate_NAND_Blk_Cnt PO--CK 100 100 010 - 2
9 Power_On_Hours -O--CK 100 100 000 - 536
12 Power_Cycle_Count PO--CK 100 100 001 - 969
181 Program_Fail_Cnt_Total PO--CK 100 100 001 - 0
182 Erase_Fail_Count_Total PO--CK 100 100 001 - 0
177 Wear_Leveling_Count PO--CK 096 096 010 - 60
187 Reported_Uncorrect PO--CK 100 100 001 - 0
194 Temperature_Celsius -O---K 048 034 000 - 52 (Min/Max 13/66)
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
238 Unknown_Attribute ----CK 096 096 000 - 4
175 Program_Fail_Count_Chip PO--CK 100 100 000 - 0
176 Erase_Fail_Count_Chip PO--CK 100 100 000 - 0
178 Used_Rsvd_Blk_Cnt_Chip PO--CK 100 100 000 - 1
180 Unused_Reserve_NAND_Blk PO--CK 000 000 000 - 2043
195 Cumulativ_Corrected_ECC POSR-K 100 000 050 Past 0
241 Total_LBAs_Written PO--CK 100 100 000 - 14731613003
242 Total_LBAs_Read PO--CK 100 100 000 - 10873621325
179 Used_Rsvd_Blk_Cnt_Tot PO--CK 100 100 000 - 2
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x24 GPL R/O 8000 Current Device Internal Status Data log
0x25 GPL R/O 8000 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 35328 Device vendor specific log
0xa1 GPL,SL VS 3 Device vendor specific log
0xa2 GPL,SL VS 1 Device vendor specific log
0xa3 GPL VS 13824 Device vendor specific log
0xa4 GPL VS 354 Device vendor specific log
0xa4 SL VS 98 Device vendor specific log
0xa5 GPL VS 8000 Device vendor specific log
0xa5 SL VS 64 Device vendor specific log
0xa6 GPL VS 8000 Device vendor specific log
0xa6 SL VS 64 Device vendor specific log
0xa7-0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 354 -
# 2 Short offline Completed without error 00% 332 -
# 3 Short offline Completed without error 00% 299 -
# 4 Short offline Completed without error 00% 233 -
# 5 Short offline Completed without error 00% 232 -
# 6 Short offline Completed without error 00% 213 -
# 7 Short offline Completed without error 00% 211 -
# 8 Short offline Completed without error 00% 183 -
# 9 Short offline Completed without error 00% 179 -
#10 Short offline Completed without error 00% 179 -
#11 Extended offline Completed without error 00% 171 -
#12 Conveyance offline Aborted by host 00% 171 -
#13 Extended offline Aborted by host 00% 171 -
#14 Short offline Completed without error 00% 106 -
#15 Short offline Completed without error 00% 100 -
#16 Short offline Completed without error 00% 99 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 52 Celsius
Power Cycle Min/Max Temperature: 23/58 Celsius
Lifetime Min/Max Temperature: 13/66 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (236)
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 969 --- Lifetime Power-On Resets
0x01 0x010 4 536 --- Power-on Hours
0x01 0x018 6 14731613003 --- Logical Sectors Written
0x01 0x020 6 214099122 --- Number of Write Commands
0x01 0x028 6 10873621325 --- Logical Sectors Read
0x01 0x030 6 145493079 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 972 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 52 --- Current Temperature
0x05 0x010 1 48 --- Average Short Term Temperature
0x05 0x018 1 - --- Average Long Term Temperature
0x05 0x020 1 66 --- Highest Temperature
0x05 0x028 1 13 --- Lowest Temperature
0x05 0x030 1 50 --- Highest Average Short Term Temperature
0x05 0x038 1 46 --- Lowest Average Short Term Temperature
0x05 0x040 1 - --- Highest Average Long Term Temperature
0x05 0x048 1 - --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 11091 --- Number of Hardware Resets
0x06 0x010 4 277 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 4 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x000a 4 8 Device-to-host register FISes sent due to a COMRESET

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smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-STABLE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Crucial/Micron BX/MX1/2/3/500, M5/600, 1100 SSDs
Device Model: Micron 1100 SATA 512GB
Serial Number: --
LU WWN Device Id: 5 00a075 ...
Firmware Version: M0DL022
User Capacity: 512,110,190,592 bytes [512 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: M.2
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Aug 5 10:55:28 2020 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 1357) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 7) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocate_NAND_Blk_Cnt PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 100 100 000 - 879
12 Power_Cycle_Count PO--CK 100 100 001 - 1214
181 Program_Fail_Cnt_Total PO--CK 100 100 001 - 0
182 Erase_Fail_Count_Total PO--CK 100 100 001 - 0
177 Wear_Leveling_Count PO--CK 099 099 010 - 19
187 Reported_Uncorrect PO--CK 100 100 001 - 0
194 Temperature_Celsius -O---K 070 026 000 - 30 (Min/Max 10/74)
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
238 Unknown_Attribute ----CK 099 099 000 - 1
175 Program_Fail_Count_Chip PO--CK 100 100 000 - 0
176 Erase_Fail_Count_Chip PO--CK 100 100 000 - 0
178 Used_Rsvd_Blk_Cnt_Chip PO--CK 100 100 000 - 0
180 Unused_Reserve_NAND_Blk PO--CK 000 000 000 - 2458
195 Cumulativ_Corrected_ECC POSR-K 100 000 050 Past 0
241 Total_LBAs_Written PO--CK 100 100 000 - 8758374980
242 Total_LBAs_Read PO--CK 100 100 000 - 6328956429
179 Used_Rsvd_Blk_Cnt_Tot PO--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x24 GPL R/O 8000 Current Device Internal Status Data log
0x25 GPL R/O 8000 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 35328 Device vendor specific log
0xa1 GPL,SL VS 3 Device vendor specific log
0xa2 GPL,SL VS 1 Device vendor specific log
0xa3 GPL VS 13824 Device vendor specific log
0xa4 GPL VS 354 Device vendor specific log
0xa4 SL VS 98 Device vendor specific log
0xa5 GPL VS 8000 Device vendor specific log
0xa5 SL VS 64 Device vendor specific log
0xa6 GPL VS 8000 Device vendor specific log
0xa6 SL VS 64 Device vendor specific log
0xa7-0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 649 -
# 2 Short offline Completed without error 00% 648 -
# 3 Short offline Completed without error 00% 617 -
# 4 Short offline Completed without error 00% 597 -
# 5 Short offline Completed without error 00% 553 -
# 6 Short offline Completed without error 00% 552 -
# 7 Short offline Completed without error 00% 551 -
# 8 Vendor (0xff) Completed without error 00% 508 -
# 9 Vendor (0xff) Completed without error 00% 451 -
#10 Short offline Completed without error 00% 70 -
#11 Short offline Completed without error 00% 5 -
#12 Short offline Completed without error 00% 5 -
#13 Short offline Completed without error 00% 5 -
#14 Short offline Self-test routine in progress 90% 5 -
#15 Extended offline Completed without error 00% 3 -
#16 Short offline Completed without error 00% 3 -
#17 Short offline Completed without error 00% 2 -
#18 Short offline Completed without error 00% 2 -
#19 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 30 Celsius
Power Cycle Min/Max Temperature: 24/31 Celsius
Lifetime Min/Max Temperature: 10/74 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (443)
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 1214 --- Lifetime Power-On Resets
0x01 0x010 4 879 --- Power-on Hours
0x01 0x018 6 8758374980 --- Logical Sectors Written
0x01 0x020 6 127985915 --- Number of Write Commands
0x01 0x028 6 6328956429 --- Logical Sectors Read
0x01 0x030 6 71469861 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 1479 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 30 --- Current Temperature
0x05 0x010 1 39 --- Average Short Term Temperature
0x05 0x018 1 - --- Average Long Term Temperature
0x05 0x020 1 74 --- Highest Temperature
0x05 0x028 1 10 --- Lowest Temperature
0x05 0x030 1 44 --- Highest Average Short Term Temperature
0x05 0x038 1 36 --- Lowest Average Short Term Temperature
0x05 0x040 1 - --- Highest Average Long Term Temperature
0x05 0x048 1 - --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 4704 --- Number of Hardware Resets
0x06 0x010 4 382 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 1 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x000a 4 2 Device-to-host register FISes sent due to a COMRESET

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smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p8 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Crucial/Micron BX/MX1/2/3/500, M5/600, 1100 SSDs
Device Model: Micron_1100_MTFDDAK256TBN
Serial Number: --
LU WWN Device Id: 5 00a075 ...
Firmware Version: M0MU031
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Aug 20 12:38:42 2020 JST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x04) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 485) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 5) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 000 - 0
5 Reallocate_NAND_Blk_Cnt -O--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 100 100 000 - 16503
12 Power_Cycle_Count -O--CK 100 100 000 - 10
171 Program_Fail_Count -O--CK 100 100 000 - 0
172 Erase_Fail_Count -O--CK 100 100 000 - 0
173 Ave_Block-Erase_Count -O--CK 066 066 000 - 510
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 5
183 SATA_Interfac_Downshift -O--CK 100 100 000 - 0
184 Error_Correction_Count -O--CK 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
194 Temperature_Celsius -O---K 068 055 000 - 32 (Min/Max 19/45)
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
202 Percent_Lifetime_Remain ----CK 066 066 001 - 34
206 Write_Error_Rate -OSR-- 100 100 000 - 0
246 Total_LBAs_Written -O--CK 100 100 000 - 136065055136
247 Host_Program_Page_Count -O--CK 100 100 000 - 4255560446
248 FTL_Program_Page_Count -O--CK 100 100 000 - 1711415471
180 Unused_Reserve_NAND_Blk PO--CK 000 000 000 - 2062
210 Success_RAIN_Recov_Cnt -O--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x24 GPL R/O 8000 Current Device Internal Status Data log
0x25 GPL R/O 8000 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 35328 Device vendor specific log
0xa1 GPL,SL VS 3 Device vendor specific log
0xa2 GPL,SL VS 1 Device vendor specific log
0xa3 GPL VS 13824 Device vendor specific log
0xa4 GPL VS 354 Device vendor specific log
0xa4 SL VS 98 Device vendor specific log
0xa5 GPL VS 8000 Device vendor specific log
0xa5 SL VS 64 Device vendor specific log
0xa6 GPL VS 8000 Device vendor specific log
0xa6 SL VS 64 Device vendor specific log
0xa7-0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Vendor (0xff) Completed without error 00% 16500 -
# 2 Vendor (0xff) Completed without error 00% 16379 -
# 3 Vendor (0xff) Completed without error 00% 16164 -
# 4 Vendor (0xff) Completed without error 00% 15956 -
# 5 Vendor (0xff) Completed without error 00% 15752 -
# 6 Vendor (0xff) Completed without error 00% 15559 -
# 7 Vendor (0xff) Completed without error 00% 15368 -
# 8 Vendor (0xff) Completed without error 00% 15180 -
# 9 Vendor (0xff) Completed without error 00% 14951 -
#10 Vendor (0xff) Completed without error 00% 14758 -
#11 Vendor (0xff) Completed without error 00% 14533 -
#12 Vendor (0xff) Completed without error 00% 14334 -
#13 Vendor (0xff) Completed without error 00% 14128 -
#14 Vendor (0xff) Completed without error 00% 13936 -
#15 Vendor (0xff) Completed without error 00% 13749 -
#16 Vendor (0xff) Completed without error 00% 13552 -
#17 Vendor (0xff) Completed without error 00% 13357 -
#18 Vendor (0xff) Completed without error 00% 13174 -
#19 Vendor (0xff) Completed without error 00% 12970 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: SMART Off-line Data Collection executing in background (4)
Current Temperature: 32 Celsius
Power Cycle Min/Max Temperature: 20/43 Celsius
Lifetime Min/Max Temperature: 19/45 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (11)
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 10 --- Lifetime Power-On Resets
0x01 0x010 4 16503 --- Power-on Hours
0x01 0x018 6 136065055136 --- Logical Sectors Written
0x01 0x020 6 1687397789 --- Number of Write Commands
0x01 0x028 6 6604262413 --- Logical Sectors Read
0x01 0x030 6 2633520698 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 10 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 32 --- Current Temperature
0x05 0x010 1 31 --- Average Short Term Temperature
0x05 0x018 1 - --- Average Long Term Temperature
0x05 0x020 1 45 --- Highest Temperature
0x05 0x028 1 19 --- Lowest Temperature
0x05 0x030 1 31 --- Highest Average Short Term Temperature
0x05 0x038 1 30 --- Lowest Average Short Term Temperature
0x05 0x040 1 - --- Highest Average Long Term Temperature
0x05 0x048 1 - --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 253 --- Number of Hardware Resets
0x06 0x010 4 81 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 34 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x000a 4 218 Device-to-host register FISes sent due to a COMRESET

View File

@@ -0,0 +1,226 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p8 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Crucial/Micron BX/MX1/2/3/500, M5/600, 1100 SSDs
Device Model: Micron_1100_MTFDDAK256TBN
Serial Number: --
LU WWN Device Id: 5 00a075 ...
Firmware Version: M0MU031
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Aug 20 12:38:42 2020 JST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 801) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 5) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 000 - 0
5 Reallocate_NAND_Blk_Cnt -O--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 100 100 000 - 16504
12 Power_Cycle_Count -O--CK 100 100 000 - 10
171 Program_Fail_Count -O--CK 100 100 000 - 0
172 Erase_Fail_Count -O--CK 100 100 000 - 0
173 Ave_Block-Erase_Count -O--CK 067 067 000 - 507
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 5
183 SATA_Interfac_Downshift -O--CK 100 100 000 - 0
184 Error_Correction_Count -O--CK 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
194 Temperature_Celsius -O---K 070 054 000 - 30 (Min/Max 19/46)
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
202 Percent_Lifetime_Remain ----CK 067 067 001 - 33
206 Write_Error_Rate -OSR-- 100 100 000 - 0
246 Total_LBAs_Written -O--CK 100 100 000 - 135564941255
247 Host_Program_Page_Count -O--CK 100 100 000 - 4239929570
248 FTL_Program_Page_Count -O--CK 100 100 000 - 1705109243
180 Unused_Reserve_NAND_Blk PO--CK 000 000 000 - 2060
210 Success_RAIN_Recov_Cnt -O--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x24 GPL R/O 8000 Current Device Internal Status Data log
0x25 GPL R/O 8000 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 35328 Device vendor specific log
0xa1 GPL,SL VS 3 Device vendor specific log
0xa2 GPL,SL VS 1 Device vendor specific log
0xa3 GPL VS 13824 Device vendor specific log
0xa4 GPL VS 354 Device vendor specific log
0xa4 SL VS 98 Device vendor specific log
0xa5 GPL VS 8000 Device vendor specific log
0xa5 SL VS 64 Device vendor specific log
0xa6 GPL VS 8000 Device vendor specific log
0xa6 SL VS 64 Device vendor specific log
0xa7-0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Vendor (0xff) Completed without error 00% 16486 -
# 2 Vendor (0xff) Completed without error 00% 16242 -
# 3 Vendor (0xff) Completed without error 00% 16024 -
# 4 Vendor (0xff) Completed without error 00% 15823 -
# 5 Vendor (0xff) Completed without error 00% 15631 -
# 6 Vendor (0xff) Completed without error 00% 15455 -
# 7 Vendor (0xff) Completed without error 00% 15295 -
# 8 Vendor (0xff) Completed without error 00% 15088 -
# 9 Vendor (0xff) Completed without error 00% 14866 -
#10 Vendor (0xff) Completed without error 00% 14668 -
#11 Vendor (0xff) Completed without error 00% 14474 -
#12 Vendor (0xff) Completed without error 00% 14272 -
#13 Vendor (0xff) Completed without error 00% 14087 -
#14 Vendor (0xff) Completed without error 00% 13881 -
#15 Vendor (0xff) Completed without error 00% 13695 -
#16 Vendor (0xff) Completed without error 00% 13502 -
#17 Vendor (0xff) Completed without error 00% 13323 -
#18 Vendor (0xff) Completed without error 00% 13141 -
#19 Vendor (0xff) Completed without error 00% 12966 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Completed [00% left] (294021670-294087205)
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 30 Celsius
Power Cycle Min/Max Temperature: 20/44 Celsius
Lifetime Min/Max Temperature: 19/46 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (464)
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 10 --- Lifetime Power-On Resets
0x01 0x010 4 16504 --- Power-on Hours
0x01 0x018 6 135564941255 --- Logical Sectors Written
0x01 0x020 6 1689432493 --- Number of Write Commands
0x01 0x028 6 7121375215 --- Logical Sectors Read
0x01 0x030 6 2637131206 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 10 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 30 --- Current Temperature
0x05 0x010 1 31 --- Average Short Term Temperature
0x05 0x018 1 - --- Average Long Term Temperature
0x05 0x020 1 46 --- Highest Temperature
0x05 0x028 1 19 --- Lowest Temperature
0x05 0x030 1 31 --- Highest Average Short Term Temperature
0x05 0x038 1 30 --- Lowest Average Short Term Temperature
0x05 0x040 1 - --- Highest Average Long Term Temperature
0x05 0x048 1 - --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 253 --- Number of Hardware Resets
0x06 0x010 4 81 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 33 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x000a 4 218 Device-to-host register FISes sent due to a COMRESET

View File

@@ -0,0 +1,224 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 11.4-RELEASE-p2 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Crucial/Micron BX/MX1/2/3/500, M5/600, 1100 SSDs
Device Model: Micron_1100_MTFDDAK512TBN
Serial Number: --
LU WWN Device Id: 5 00a075 ...
Firmware Version: M0MU031
User Capacity: 512,110,190,592 bytes [512 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Aug 20 06:36:15 2020 EEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x04) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 839) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 6) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 000 - 0
5 Reallocate_NAND_Blk_Cnt -O--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 100 100 000 - 19161
12 Power_Cycle_Count -O--CK 100 100 000 - 7
171 Program_Fail_Count -O--CK 100 100 000 - 0
172 Erase_Fail_Count -O--CK 100 100 000 - 0
173 Ave_Block-Erase_Count -O--CK 068 068 000 - 488
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 4
183 SATA_Interfac_Downshift -O--CK 100 100 000 - 0
184 Error_Correction_Count -O--CK 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
194 Temperature_Celsius -O---K 067 053 000 - 33 (Min/Max 23/47)
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
202 Percent_Lifetime_Remain ----CK 068 068 001 - 32
206 Write_Error_Rate -OSR-- 100 100 000 - 0
246 Total_LBAs_Written -O--CK 100 100 000 - 223519330757
247 Host_Program_Page_Count -O--CK 100 100 000 - 7493147623
248 FTL_Program_Page_Count -O--CK 100 100 000 - 2459704294
180 Unused_Reserve_NAND_Blk PO--CK 000 000 000 - 2475
210 Success_RAIN_Recov_Cnt -O--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x24 GPL R/O 8000 Current Device Internal Status Data log
0x25 GPL R/O 8000 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 35328 Device vendor specific log
0xa1 GPL,SL VS 3 Device vendor specific log
0xa2 GPL,SL VS 1 Device vendor specific log
0xa3 GPL VS 13824 Device vendor specific log
0xa4 GPL VS 354 Device vendor specific log
0xa4 SL VS 98 Device vendor specific log
0xa5 GPL VS 8000 Device vendor specific log
0xa5 SL VS 64 Device vendor specific log
0xa6 GPL VS 8000 Device vendor specific log
0xa6 SL VS 64 Device vendor specific log
0xa7-0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Vendor (0xff) Completed without error 00% 19154 -
# 2 Vendor (0xff) Completed without error 00% 19053 -
# 3 Vendor (0xff) Completed without error 00% 18808 -
# 4 Vendor (0xff) Completed without error 00% 18568 -
# 5 Vendor (0xff) Completed without error 00% 18337 -
# 6 Vendor (0xff) Completed without error 00% 18094 -
# 7 Vendor (0xff) Completed without error 00% 17843 -
# 8 Vendor (0xff) Completed without error 00% 17603 -
# 9 Vendor (0xff) Completed without error 00% 17368 -
#10 Vendor (0xff) Completed without error 00% 17130 -
#11 Vendor (0xff) Completed without error 00% 16879 -
#12 Vendor (0xff) Completed without error 00% 16633 -
#13 Vendor (0xff) Completed without error 00% 16412 -
#14 Vendor (0xff) Completed without error 00% 16195 -
#15 Vendor (0xff) Completed without error 00% 15982 -
#16 Vendor (0xff) Completed without error 00% 15767 -
#17 Vendor (0xff) Completed without error 00% 15530 -
#18 Vendor (0xff) Completed without error 00% 15304 -
#19 Vendor (0xff) Completed without error 00% 15092 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: SMART Off-line Data Collection executing in background (4)
Current Temperature: 33 Celsius
Power Cycle Min/Max Temperature: 23/47 Celsius
Lifetime Min/Max Temperature: 23/47 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (283)
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 7 --- Lifetime Power-On Resets
0x01 0x010 4 19161 --- Power-on Hours
0x01 0x018 6 223519330757 --- Logical Sectors Written
0x01 0x020 6 3104819250 --- Number of Write Commands
0x01 0x028 6 15884400666 --- Logical Sectors Read
0x01 0x030 6 2808674537 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 7 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 33 --- Current Temperature
0x05 0x010 1 28 --- Average Short Term Temperature
0x05 0x018 1 - --- Average Long Term Temperature
0x05 0x020 1 47 --- Highest Temperature
0x05 0x028 1 23 --- Lowest Temperature
0x05 0x030 1 28 --- Highest Average Short Term Temperature
0x05 0x038 1 28 --- Lowest Average Short Term Temperature
0x05 0x040 1 - --- Highest Average Long Term Temperature
0x05 0x048 1 - --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 104 --- Number of Hardware Resets
0x06 0x010 4 31 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 32 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x000a 4 87 Device-to-host register FISes sent due to a COMRESET

View File

@@ -0,0 +1,226 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 11.4-RELEASE-p2 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Crucial/Micron BX/MX1/2/3/500, M5/600, 1100 SSDs
Device Model: Micron_1100_MTFDDAK512TBN
Serial Number: --
LU WWN Device Id: 5 00a075 ...
Firmware Version: M0MU031
User Capacity: 512,110,190,592 bytes [512 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Aug 20 06:36:15 2020 EEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 1272) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 7) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 000 - 0
5 Reallocate_NAND_Blk_Cnt -O--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 100 100 000 - 19162
12 Power_Cycle_Count -O--CK 100 100 000 - 7
171 Program_Fail_Count -O--CK 100 100 000 - 0
172 Erase_Fail_Count -O--CK 100 100 000 - 0
173 Ave_Block-Erase_Count -O--CK 068 068 000 - 487
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 4
183 SATA_Interfac_Downshift -O--CK 100 100 000 - 0
184 Error_Correction_Count -O--CK 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
194 Temperature_Celsius -O---K 070 051 000 - 30 (Min/Max 23/49)
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
202 Percent_Lifetime_Remain ----CK 068 068 001 - 32
206 Write_Error_Rate -OSR-- 100 100 000 - 0
246 Total_LBAs_Written -O--CK 100 100 000 - 223937118229
247 Host_Program_Page_Count -O--CK 100 100 000 - 7502198999
248 FTL_Program_Page_Count -O--CK 100 100 000 - 2453047262
180 Unused_Reserve_NAND_Blk PO--CK 000 000 000 - 2479
210 Success_RAIN_Recov_Cnt -O--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x24 GPL R/O 8000 Current Device Internal Status Data log
0x25 GPL R/O 8000 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 35328 Device vendor specific log
0xa1 GPL,SL VS 3 Device vendor specific log
0xa2 GPL,SL VS 1 Device vendor specific log
0xa3 GPL VS 13824 Device vendor specific log
0xa4 GPL VS 354 Device vendor specific log
0xa4 SL VS 98 Device vendor specific log
0xa5 GPL VS 8000 Device vendor specific log
0xa5 SL VS 64 Device vendor specific log
0xa6 GPL VS 8000 Device vendor specific log
0xa6 SL VS 64 Device vendor specific log
0xa7-0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Vendor (0xff) Completed without error 00% 19150 -
# 2 Vendor (0xff) Completed without error 00% 18913 -
# 3 Vendor (0xff) Completed without error 00% 18662 -
# 4 Vendor (0xff) Completed without error 00% 18411 -
# 5 Vendor (0xff) Completed without error 00% 18166 -
# 6 Vendor (0xff) Completed without error 00% 17923 -
# 7 Vendor (0xff) Completed without error 00% 17669 -
# 8 Vendor (0xff) Completed without error 00% 17416 -
# 9 Vendor (0xff) Completed without error 00% 17175 -
#10 Vendor (0xff) Completed without error 00% 16927 -
#11 Vendor (0xff) Completed without error 00% 16680 -
#12 Vendor (0xff) Completed without error 00% 16454 -
#13 Vendor (0xff) Completed without error 00% 16245 -
#14 Vendor (0xff) Completed without error 00% 16030 -
#15 Vendor (0xff) Completed without error 00% 15795 -
#16 Vendor (0xff) Completed without error 00% 15573 -
#17 Vendor (0xff) Completed without error 00% 15353 -
#18 Vendor (0xff) Completed without error 00% 15139 -
#19 Vendor (0xff) Completed without error 00% 14922 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Completed [00% left] (130625-196160)
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 30 Celsius
Power Cycle Min/Max Temperature: 23/49 Celsius
Lifetime Min/Max Temperature: 23/49 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (255)
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 7 --- Lifetime Power-On Resets
0x01 0x010 4 19162 --- Power-on Hours
0x01 0x018 6 223937118229 --- Logical Sectors Written
0x01 0x020 6 3103185662 --- Number of Write Commands
0x01 0x028 6 15869954023 --- Logical Sectors Read
0x01 0x030 6 2826459999 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 7 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 30 --- Current Temperature
0x05 0x010 1 29 --- Average Short Term Temperature
0x05 0x018 1 - --- Average Long Term Temperature
0x05 0x020 1 49 --- Highest Temperature
0x05 0x028 1 23 --- Lowest Temperature
0x05 0x030 1 29 --- Highest Average Short Term Temperature
0x05 0x038 1 29 --- Lowest Average Short Term Temperature
0x05 0x040 1 - --- Highest Average Long Term Temperature
0x05 0x048 1 - --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 104 --- Number of Hardware Resets
0x06 0x010 4 31 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 32 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x000a 4 87 Device-to-host register FISes sent due to a COMRESET

View File

@@ -0,0 +1,218 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p8 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Crucial/Micron BX/MX1/2/3/500, M5/600, 1100 SSDs
Device Model: Micron_M600_MTFDDAK256MBF
Serial Number: --
LU WWN Device Id: 5 00a075 ...
Firmware Version: MU05
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3 T13/2161-D revision 4
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Aug 27 08:23:06 2020 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 978) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 6) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 000 - 0
5 Reallocate_NAND_Blk_Cnt -O--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 100 100 000 - 39756
12 Power_Cycle_Count -O--CK 100 100 000 - 21
171 Program_Fail_Count -O--CK 100 100 000 - 0
172 Erase_Fail_Count -O--CK 100 100 000 - 0
173 Ave_Block-Erase_Count -O--CK 058 058 000 - 1267
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 8
180 Unused_Reserve_NAND_Blk PO--CK 000 000 000 - 1947
183 SATA_Interfac_Downshift -O--CK 100 100 000 - 0
184 Error_Correction_Count -O--CK 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
194 Temperature_Celsius -O---K 068 045 000 - 32 (Min/Max 23/55)
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
202 Percent_Lifetime_Remain ----CK 058 058 001 - 42
206 Write_Error_Rate -OSR-- 100 100 000 - 0
210 Success_RAIN_Recov_Cnt -O--CK 100 100 000 - 0
246 Total_LBAs_Written -O--CK 100 100 000 - 115882741020
247 Host_Program_Page_Count -O--CK 100 100 000 - 3646047506
248 FTL_Program_Page_Count -O--CK 100 100 000 - 11122225002
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x24 GPL R/O 16000 Current Device Internal Status Data log
0x25 GPL R/O 16000 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 2000 Device vendor specific log
0xa0 SL VS 208 Device vendor specific log
0xa1-0xbf GPL,SL VS 1 Device vendor specific log
0xc0 GPL,SL VS 80 Device vendor specific log
0xc1-0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 39750 -
# 2 Short offline Completed without error 00% 39726 -
# 3 Short offline Completed without error 00% 39702 -
# 4 Short offline Completed without error 00% 39678 -
# 5 Short offline Completed without error 00% 39654 -
# 6 Extended offline Completed without error 00% 39631 -
# 7 Short offline Completed without error 00% 39630 -
# 8 Short offline Completed without error 00% 39606 -
# 9 Short offline Completed without error 00% 39581 -
#10 Short offline Completed without error 00% 39557 -
#11 Short offline Completed without error 00% 39533 -
#12 Short offline Completed without error 00% 39509 -
#13 Short offline Completed without error 00% 39485 -
#14 Extended offline Completed without error 00% 39462 -
#15 Short offline Completed without error 00% 39461 -
#16 Short offline Completed without error 00% 39437 -
#17 Short offline Completed without error 00% 39413 -
#18 Short offline Completed without error 00% 39388 -
#19 Short offline Completed without error 00% 39364 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Completed [00% left] (57881389-57946924)
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 32 Celsius
Power Cycle Min/Max Temperature: 29/32 Celsius
Lifetime Min/Max Temperature: 23/55 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (194)
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 2) ==
0x01 0x008 4 21 --- Lifetime Power-On Resets
0x01 0x010 4 39756 --- Power-on Hours
0x01 0x018 6 115882741020 --- Logical Sectors Written
0x01 0x020 6 662996463 --- Number of Write Commands
0x01 0x028 6 3732408215 --- Logical Sectors Read
0x01 0x030 6 175499370 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 19 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 32 --- Current Temperature
0x05 0x010 1 40 --- Average Short Term Temperature
0x05 0x018 1 39 --- Average Long Term Temperature
0x05 0x020 1 55 --- Highest Temperature
0x05 0x028 1 23 --- Lowest Temperature
0x05 0x030 1 46 --- Highest Average Short Term Temperature
0x05 0x038 1 37 --- Lowest Average Short Term Temperature
0x05 0x040 1 43 --- Highest Average Long Term Temperature
0x05 0x048 1 39 --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 313 --- Number of Hardware Resets
0x06 0x010 4 117 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 42 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x000a 4 75 Device-to-host register FISes sent due to a COMRESET

View File

@@ -0,0 +1,198 @@
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p6 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Crucial/Micron RealSSD m4/C400/P400
Device Model: MTFDDAK256MAM-1K12
Serial Number: --
LU WWN Device Id: 5 00a075 ...
Firmware Version: 08TH
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Sep 22 10:50:42 2020 BST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 0 (reserved)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 1190) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 19) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 26
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 4096
9 Power_On_Hours -O--CK 100 100 000 - 1250
12 Power_Cycle_Count -O--CK 100 100 000 - 5061
170 Grown_Failing_Block_Ct PO--CK 100 100 010 - 1
171 Program_Fail_Count -O--CK 100 100 000 - 0
172 Erase_Fail_Count -O--CK 100 100 000 - 91
173 Wear_Leveling_Count PO--CK 096 096 010 - 133
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 80
181 Non4k_Aligned_Access -O---K 100 100 000 - 8635 2617 6017
183 SATA_Iface_Downshift -O--CK 100 100 000 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 0
189 Factory_Bad_Block_Ct -OSR-- 100 100 000 - 107
194 Temperature_Celsius -O---K 100 100 000 - 0
195 Hardware_ECC_Recovered -O-RCK 100 100 000 - 22870
196 Reallocated_Event_Count -O--CK 100 100 000 - 1
197 Current_Pending_Sector -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -OS-CK 100 100 000 - 1
202 Perc_Rated_Life_Used ---RC- 096 096 000 - 4
206 Write_Error_Rate -OSR-- 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 255 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x80-0x83 SL R/W 1 Host vendor specific log
0x84-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 2000 Device vendor specific log
0xa0 SL VS 208 Device vendor specific log
0xa1-0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 0 Celsius
Power Cycle Min/Max Temperature: --/ 0 Celsius
Lifetime Min/Max Temperature: --/ 0 Celsius
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (303)
SCT Error Recovery Control:
Read: 40 (4.0 seconds)
Write: 40 (4.0 seconds)
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 2) ==
0x01 0x008 4 5061 --- Lifetime Power-On Resets
0x01 0x010 4 1250 --- Power-on Hours
0x01 0x018 6 24457578352 --- Logical Sectors Written
0x01 0x020 6 532854465 --- Number of Write Commands
0x01 0x028 6 40760249138 --- Logical Sectors Read
0x01 0x030 6 943321724 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 0 --- Current Temperature
0x05 0x010 1 0 --- Average Short Term Temperature
0x05 0x018 1 0 --- Average Long Term Temperature
0x05 0x020 1 0 --- Highest Temperature
0x05 0x028 1 0 --- Lowest Temperature
0x05 0x030 1 0 --- Highest Average Short Term Temperature
0x05 0x038 1 0 --- Lowest Average Short Term Temperature
0x05 0x040 1 0 --- Highest Average Long Term Temperature
0x05 0x048 1 0 --- Lowest Average Long Term Temperature
0x05 0x050 4 - --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 - --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 86 --- Number of Hardware Resets
0x06 0x010 4 0 --- Number of ASR Events
0x06 0x018 4 1 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 5 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x000a 4 4 Device-to-host register FISes sent due to a COMRESET