mirror of
https://github.com/bsdhw/SMART.git
synced 2025-05-31 16:21:41 +05:30
Update of reports (new: 1098, modified: 0)
This commit is contained in:
107
SSD/Transcend/TS256/TS256GMTS400/93888CF64EF2
Normal file
107
SSD/Transcend/TS256/TS256GMTS400/93888CF64EF2
Normal file
@@ -0,0 +1,107 @@
|
||||
smartctl 7.1 2019-12-30 r5022 [x86_64-unknown-openbsd6.8] (local build)
|
||||
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Silicon Motion based SSDs
|
||||
Device Model: TS256GMTS400
|
||||
Serial Number: --
|
||||
Firmware Version: O1225G
|
||||
User Capacity: 256,060,514,304 bytes [256 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
Device is: In smartctl database [for details use: -P show]
|
||||
ATA Version is: ACS-2 (minor revision not indicated)
|
||||
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Tue Oct 20 06:13:04 2020 MSK
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART Status not supported: Incomplete response, ATA output registers missing
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
Warning: This result is based on an Attribute check.
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x00) Offline data collection activity
|
||||
was never started.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 0) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x71) SMART execute Offline immediate.
|
||||
No Auto Offline data collection support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0002) Does not save SMART data before
|
||||
entering power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 1) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 1) minutes.
|
||||
Conveyance self-test routine
|
||||
recommended polling time: ( 1) minutes.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
|
||||
1 Raw_Read_Error_Rate 0x0000 100 100 000 Old_age Offline - 0
|
||||
5 Reallocated_Sector_Ct 0x0000 100 100 000 Old_age Offline - 0
|
||||
9 Power_On_Hours 0x0000 100 100 000 Old_age Offline - 341
|
||||
12 Power_Cycle_Count 0x0000 100 100 000 Old_age Offline - 3579
|
||||
160 Uncorrectable_Error_Cnt 0x0000 100 100 000 Old_age Offline - 0
|
||||
161 Valid_Spare_Block_Cnt 0x0000 100 100 000 Old_age Offline - 142
|
||||
163 Initial_Bad_Block_Count 0x0000 100 100 000 Old_age Offline - 23
|
||||
164 Total_Erase_Count 0x0000 100 100 000 Old_age Offline - 59281
|
||||
165 Max_Erase_Count 0x0000 100 100 000 Old_age Offline - 106
|
||||
166 Min_Erase_Count 0x0000 100 100 000 Old_age Offline - 1
|
||||
167 Average_Erase_Count 0x0000 100 100 000 Old_age Offline - 28
|
||||
168 Max_Erase_Count_of_Spec 0x0000 100 100 000 Old_age Offline - 3000
|
||||
169 Remaining_Lifetime_Perc 0x0000 100 100 000 Old_age Offline - 100
|
||||
175 Program_Fail_Count_Chip 0x0000 100 100 000 Old_age Offline - 0
|
||||
176 Erase_Fail_Count_Chip 0x0000 100 100 000 Old_age Offline - 0
|
||||
177 Wear_Leveling_Count 0x0000 100 100 050 Old_age Offline - 25
|
||||
178 Runtime_Invalid_Blk_Cnt 0x0000 100 100 000 Old_age Offline - 0
|
||||
181 Program_Fail_Cnt_Total 0x0000 100 100 000 Old_age Offline - 0
|
||||
182 Erase_Fail_Count_Total 0x0000 100 100 000 Old_age Offline - 0
|
||||
192 Power-Off_Retract_Count 0x0000 100 100 000 Old_age Offline - 33
|
||||
194 Temperature_Celsius 0x0000 100 100 000 Old_age Offline - 44
|
||||
195 Hardware_ECC_Recovered 0x0000 100 100 000 Old_age Offline - 6838
|
||||
196 Reallocated_Event_Count 0x0000 100 100 016 Old_age Offline - 0
|
||||
197 Current_Pending_Sector 0x0000 100 100 000 Old_age Offline - 0
|
||||
198 Offline_Uncorrectable 0x0000 100 100 000 Old_age Offline - 0
|
||||
199 UDMA_CRC_Error_Count 0x0000 100 100 050 Old_age Offline - 0
|
||||
232 Available_Reservd_Space 0x0000 100 100 000 Old_age Offline - 100
|
||||
241 Host_Writes_32MiB 0x0000 100 100 000 Old_age Offline - 135233
|
||||
242 Host_Reads_32MiB 0x0000 100 100 000 Old_age Offline - 165339
|
||||
245 TLC_Writes_32MiB 0x0000 100 100 000 Old_age Offline - 237124
|
||||
|
||||
SMART Error Log Version: 1
|
||||
No Errors Logged
|
||||
|
||||
SMART Self-test log structure revision number 1
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
6 0 65535 Read_scanning was never started
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
|
||||
|
164
SSD/Transcend/TS256/TS256GSSD230S/0B66BE1B7774
Normal file
164
SSD/Transcend/TS256/TS256GSSD230S/0B66BE1B7774
Normal file
@@ -0,0 +1,164 @@
|
||||
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-STABLE amd64] (local build)
|
||||
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
|
||||
|
||||
=== START OF INFORMATION SECTION ===
|
||||
Model Family: Silicon Motion based SSDs
|
||||
Device Model: TS256GSSD230S
|
||||
Serial Number: --
|
||||
LU WWN Device Id: 5 7c3548 ...
|
||||
Firmware Version: S0423A
|
||||
User Capacity: 256,060,514,304 bytes [256 GB]
|
||||
Sector Size: 512 bytes logical/physical
|
||||
Rotation Rate: Solid State Device
|
||||
Device is: In smartctl database [for details use: -P show]
|
||||
ATA Version is: ACS-2 (minor revision not indicated)
|
||||
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
|
||||
Local Time is: Wed Aug 19 16:26:47 2020 EEST
|
||||
SMART support is: Available - device has SMART capability.
|
||||
SMART support is: Enabled
|
||||
AAM feature is: Unavailable
|
||||
APM feature is: Unavailable
|
||||
Rd look-ahead is: Enabled
|
||||
Write cache is: Enabled
|
||||
DSN feature is: Disabled
|
||||
ATA Security is: Disabled, frozen [SEC2]
|
||||
Wt Cache Reorder: Unavailable
|
||||
|
||||
=== START OF READ SMART DATA SECTION ===
|
||||
SMART overall-health self-assessment test result: PASSED
|
||||
|
||||
General SMART Values:
|
||||
Offline data collection status: (0x00) Offline data collection activity
|
||||
was never started.
|
||||
Auto Offline Data Collection: Disabled.
|
||||
Self-test execution status: ( 0) The previous self-test routine completed
|
||||
without error or no self-test has ever
|
||||
been run.
|
||||
Total time to complete Offline
|
||||
data collection: ( 0) seconds.
|
||||
Offline data collection
|
||||
capabilities: (0x71) SMART execute Offline immediate.
|
||||
No Auto Offline data collection support.
|
||||
Suspend Offline collection upon new
|
||||
command.
|
||||
No Offline surface scan supported.
|
||||
Self-test supported.
|
||||
Conveyance Self-test supported.
|
||||
Selective Self-test supported.
|
||||
SMART capabilities: (0x0003) Saves SMART data before entering
|
||||
power-saving mode.
|
||||
Supports SMART auto save timer.
|
||||
Error logging capability: (0x01) Error logging supported.
|
||||
General Purpose Logging supported.
|
||||
Short self-test routine
|
||||
recommended polling time: ( 1) minutes.
|
||||
Extended self-test routine
|
||||
recommended polling time: ( 2) minutes.
|
||||
Conveyance self-test routine
|
||||
recommended polling time: ( 1) minutes.
|
||||
|
||||
SMART Attributes Data Structure revision number: 1
|
||||
Vendor Specific SMART Attributes with Thresholds:
|
||||
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
||||
1 Raw_Read_Error_Rate ------ 100 100 000 - 0
|
||||
5 Reallocated_Sector_Ct ------ 100 100 000 - 0
|
||||
9 Power_On_Hours ------ 100 100 000 - 3538
|
||||
12 Power_Cycle_Count ------ 100 100 000 - 585
|
||||
148 Total_SLC_Erase_Ct ------ 100 100 000 - 27770
|
||||
149 Max_SLC_Erase_Ct ------ 100 100 000 - 387
|
||||
150 Min_SLC_Erase_Ct ------ 100 100 000 - 201
|
||||
151 Average_SLC_Erase_Ct ------ 100 100 000 - 375
|
||||
164 Total_Erase_Count ------ 100 100 000 - 5470
|
||||
165 Max_Erase_Count ------ 100 100 000 - 33
|
||||
166 Min_Erase_Count ------ 100 100 000 - 0
|
||||
167 Average_Erase_Count ------ 100 100 000 - 4
|
||||
159 Unkn_SiliconMotion_Attr ------ 100 100 000 - 0
|
||||
160 Uncorrectable_Error_Cnt ------ 100 100 000 - 0
|
||||
161 Valid_Spare_Block_Cnt ------ 100 100 000 - 49
|
||||
163 Initial_Bad_Block_Count ------ 100 100 000 - 5
|
||||
168 Max_Erase_Count_of_Spec ------ 100 100 000 - 1000
|
||||
169 Remaining_Lifetime_Perc ------ 100 100 000 - 100
|
||||
177 Wear_Leveling_Count ------ 100 100 050 - 3
|
||||
181 Program_Fail_Cnt_Total ------ 100 100 000 - 0
|
||||
182 Erase_Fail_Count_Total ------ 100 100 000 - 0
|
||||
192 Power-Off_Retract_Count ------ 100 100 000 - 113
|
||||
194 Temperature_Celsius ------ 100 100 000 - 45
|
||||
195 Hardware_ECC_Recovered ------ 100 100 000 - 0
|
||||
196 Reallocated_Event_Count ------ 100 100 016 - 0
|
||||
199 UDMA_CRC_Error_Count ------ 100 100 050 - 530
|
||||
232 Available_Reservd_Space ------ 100 100 000 - 100
|
||||
241 Host_Writes_32MiB ------ 100 100 000 - 42741
|
||||
242 Host_Reads_32MiB ------ 100 100 000 - 16516
|
||||
245 TLC_Writes_32MiB ------ 100 100 000 - 21880
|
||||
||||||_ K auto-keep
|
||||
|||||__ C event count
|
||||
||||___ R error rate
|
||||
|||____ S speed/performance
|
||||
||_____ O updated online
|
||||
|______ P prefailure warning
|
||||
|
||||
General Purpose Log Directory Version 1
|
||||
SMART Log Directory Version 1 [multi-sector log support]
|
||||
Address Access R/W Size Description
|
||||
0x00 GPL,SL R/O 1 Log Directory
|
||||
0x01 SL R/O 1 Summary SMART error log
|
||||
0x02 SL R/O 1 Comprehensive SMART error log
|
||||
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
|
||||
0x04 GPL,SL R/O 8 Device Statistics log
|
||||
0x06 SL R/O 1 SMART self-test log
|
||||
0x07 GPL R/O 1 Extended self-test log
|
||||
0x09 SL R/W 1 Selective self-test log
|
||||
0x0a GPL R/W 8 Device Statistics Notification
|
||||
0x10 GPL R/O 1 NCQ Command Error log
|
||||
0x24 GPL R/O 88 Current Device Internal Status Data log
|
||||
0x25 GPL R/O 64 Saved Device Internal Status Data log
|
||||
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
||||
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
||||
|
||||
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
|
||||
No Errors Logged
|
||||
|
||||
SMART Extended Self-test Log Version: 0 (1 sectors)
|
||||
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
||||
|
||||
SMART Selective self-test log data structure revision number 1
|
||||
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
||||
1 0 0 Not_testing
|
||||
2 0 0 Not_testing
|
||||
3 0 0 Not_testing
|
||||
4 0 0 Not_testing
|
||||
5 0 0 Not_testing
|
||||
6 0 65535 Read_scanning was never started
|
||||
Selective self-test flags (0x0):
|
||||
After scanning selected spans, do NOT read-scan remainder of disk.
|
||||
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
||||
|
||||
SCT Commands not supported
|
||||
|
||||
Device Statistics (GP Log 0x04)
|
||||
Page Offset Size Value Flags Description
|
||||
0x01 ===== = = === == General Statistics (rev 1) ==
|
||||
0x01 0x008 4 585 --- Lifetime Power-On Resets
|
||||
0x01 0x010 4 3538 --- Power-on Hours
|
||||
0x01 0x018 6 2801120287 --- Logical Sectors Written
|
||||
0x01 0x020 6 54416529 --- Number of Write Commands
|
||||
0x01 0x028 6 1082436037 --- Logical Sectors Read
|
||||
0x01 0x030 6 13275685 --- Number of Read Commands
|
||||
0x04 ===== = = === == General Errors Statistics (rev 1) ==
|
||||
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
|
||||
0x04 0x010 4 117 --- Resets Between Cmd Acceptance and Completion
|
||||
0x06 ===== = = === == Transport Statistics (rev 1) ==
|
||||
0x06 0x008 4 9188494 --- Number of Hardware Resets
|
||||
0x06 0x018 4 530 --- Number of Interface CRC Errors
|
||||
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
|
||||
0x07 0x008 1 0 --- Percentage Used Endurance Indicator
|
||||
|||_ C monitored condition met
|
||||
||__ D supports DSN
|
||||
|___ N normalized value
|
||||
|
||||
Pending Defects log (GP Log 0x0c) not supported
|
||||
|
||||
SATA Phy Event Counters (GP Log 0x11) not supported
|
||||
|
||||
|
||||
|
Reference in New Issue
Block a user