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Andrey Ponomarenko
2020-06-01 15:47:06 +03:00
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smartctl 7.1 2019-12-30 r5022 [x86_64-unknown-openbsd6.7] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Crucial/Micron BX/MX1/2/3/500, M5/600, 1100 SSDs
Device Model: Micron_1100_MTFDDAK256TBN
Serial Number: --
LU WWN Device Id: 5 00a075 ...
Firmware Version: M0MA032
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue May 26 22:41:16 2020 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 769) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 5) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 000 Pre-fail Always - 0
5 Reallocate_NAND_Blk_Cnt 0x0032 100 100 010 Old_age Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 2776
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 349
171 Program_Fail_Count 0x0032 100 100 000 Old_age Always - 0
172 Erase_Fail_Count 0x0032 100 100 000 Old_age Always - 0
173 Ave_Block-Erase_Count 0x0032 098 098 000 Old_age Always - 31
174 Unexpect_Power_Loss_Ct 0x0032 100 100 000 Old_age Always - 17
183 SATA_Interfac_Downshift 0x0032 100 100 000 Old_age Always - 0
184 Error_Correction_Count 0x0032 100 100 000 Old_age Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
194 Temperature_Celsius 0x0022 059 055 000 Old_age Always - 41 (Min/Max 17/45)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 0
202 Percent_Lifetime_Remain 0x0030 098 098 001 Old_age Offline - 2
206 Write_Error_Rate 0x000e 100 100 000 Old_age Always - 0
246 Total_LBAs_Written 0x0032 100 100 000 Old_age Always - 8555791889
247 Host_Program_Page_Count 0x0032 100 100 000 Old_age Always - 272041452
248 FTL_Program_Page_Count 0x0032 100 100 000 Old_age Always - 47060083
180 Unused_Reserve_NAND_Blk 0x0033 000 000 000 Pre-fail Always - 2048
210 Success_RAIN_Recov_Cnt 0x0032 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Vendor (0xff) Completed without error 00% 2748 -
# 2 Vendor (0xff) Completed without error 00% 2458 -
# 3 Vendor (0xff) Completed without error 00% 2313 -
# 4 Vendor (0xff) Completed without error 00% 1945 -
# 5 Vendor (0xff) Completed without error 00% 1635 -
# 6 Vendor (0xff) Completed without error 00% 1369 -
# 7 Vendor (0xff) Completed without error 00% 968 -
# 8 Vendor (0xff) Completed without error 00% 876 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Completed [00% left] (21478-87013)
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

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smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p2 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Micron 5100 Pro / 5200 SSDs
Device Model: Micron_5100_MTFDDAK240TCB
Serial Number: --
LU WWN Device Id: 5 00a075 ...
Firmware Version: D0MU037
User Capacity: 240,057,409,536 bytes [240 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon May 25 14:02:09 2020 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x04) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 81) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 5) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
5 Reallocated_Sector_Ct -O--CK 100 100 001 - 0
9 Power_On_Hours -O--CK 100 100 001 - 18712
12 Power_Cycle_Count -O--CK 100 100 001 - 16
170 Reserved_Block_Pct PO--CK 100 100 010 - 0
171 Program_Fail_Count -O--CK 100 100 000 - 0
172 Erase_Fail_Count -O--CK 100 100 001 - 0
173 Avg_Block-Erase_Count -O--CK 071 071 000 - 958
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 15
183 SATA_Int_Downshift_Ct -O--CK 100 100 000 - 0
184 End-to-End_Error -O--CK 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 11
194 Temperature_Celsius -O---K 071 060 000 - 29 (Min/Max 18/40)
195 Hardware_ECC_Recovered -O--CK 100 100 000 - 0
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
202 Percent_Lifetime_Remain ----CK 071 071 001 - 29
206 Write_Error_Rate -OSR-- 100 100 000 - 0
246 Unknown_Attribute -O--CK 100 100 000 - 603178634573
247 Host_Program_Page_Count -O--CK 100 100 000 - 18812400996
248 Bckgnd_Program_Page_Cnt -O--CK 100 100 000 - 3522949287
180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 000 000 000 - 4652
210 RAIN_Success_Recovered -O--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x24 GPL R/O 8000 Current Device Internal Status Data log
0x25 GPL R/O 8000 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 35328 Device vendor specific log
0xa1 GPL,SL VS 4 Device vendor specific log
0xa3 GPL VS 13824 Device vendor specific log
0xa4 GPL VS 354 Device vendor specific log
0xa4 SL VS 98 Device vendor specific log
0xa5 GPL VS 8000 Device vendor specific log
0xa5 SL VS 64 Device vendor specific log
0xa6 GPL VS 8000 Device vendor specific log
0xa6 SL VS 64 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Vendor (0xff) Completed without error 00% 16910 -
# 2 Vendor (0xff) Completed without error 00% 14729 -
# 3 Vendor (0xff) Completed without error 00% 13896 -
# 4 Vendor (0xff) Completed without error 00% 12125 -
# 5 Vendor (0xff) Completed without error 00% 11409 -
# 6 Vendor (0xff) Completed without error 00% 10743 -
# 7 Vendor (0xff) Completed without error 00% 10091 -
# 8 Vendor (0xff) Completed without error 00% 9419 -
# 9 Vendor (0xff) Completed without error 00% 8611 -
#10 Vendor (0xff) Completed without error 00% 7876 -
#11 Vendor (0xff) Completed without error 00% 7340 -
#12 Vendor (0xff) Completed without error 00% 6908 -
#13 Vendor (0xff) Completed without error 00% 6489 -
#14 Vendor (0xff) Completed without error 00% 6038 -
#15 Vendor (0xff) Completed without error 00% 5603 -
#16 Vendor (0xff) Completed without error 00% 5098 -
#17 Vendor (0xff) Completed without error 00% 4719 -
#18 Vendor (0xff) Completed without error 00% 4342 -
#19 Vendor (0xff) Completed without error 00% 3873 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: SMART Off-line Data Collection executing in background (4)
Current Temperature: 29 Celsius
Power Cycle Min/Max Temperature: 18/32 Celsius
Lifetime Min/Max Temperature: 18/40 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (18)
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 16 --- Lifetime Power-On Resets
0x01 0x010 4 18712 --- Power-on Hours
0x01 0x018 6 603178634589 --- Logical Sectors Written
0x01 0x020 6 12586254065 --- Number of Write Commands
0x01 0x028 6 6236085013 --- Logical Sectors Read
0x01 0x030 6 112525782 --- Number of Read Commands
0x01 0x038 6 67365900000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 11 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 29 --- Current Temperature
0x05 0x010 1 28 --- Average Short Term Temperature
0x05 0x018 1 26 --- Average Long Term Temperature
0x05 0x020 1 40 --- Highest Temperature
0x05 0x028 1 18 --- Lowest Temperature
0x05 0x030 1 35 --- Highest Average Short Term Temperature
0x05 0x038 1 25 --- Lowest Average Short Term Temperature
0x05 0x040 1 31 --- Highest Average Long Term Temperature
0x05 0x048 1 25 --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 225 --- Number of Hardware Resets
0x06 0x010 4 75 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 29 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x0003 4 0 R_ERR response for device-to-host data FIS
0x0004 4 0 R_ERR response for host-to-device data FIS
0x0006 4 0 R_ERR response for device-to-host non-data FIS
0x000a 4 9 Device-to-host register FISes sent due to a COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS

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smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p2 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Micron 5100 Pro / 5200 SSDs
Device Model: Micron_5100_MTFDDAK240TCB
Serial Number: --
LU WWN Device Id: 5 00a075 ...
Firmware Version: D0MU037
User Capacity: 240,057,409,536 bytes [240 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon May 25 14:02:12 2020 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x04) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 533) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 5) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
5 Reallocated_Sector_Ct -O--CK 100 100 001 - 0
9 Power_On_Hours -O--CK 100 100 001 - 18674
12 Power_Cycle_Count -O--CK 100 100 001 - 17
170 Reserved_Block_Pct PO--CK 100 100 010 - 0
171 Program_Fail_Count -O--CK 100 100 000 - 0
172 Erase_Fail_Count -O--CK 100 100 001 - 0
173 Avg_Block-Erase_Count -O--CK 099 099 000 - 36
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 12
183 SATA_Int_Downshift_Ct -O--CK 100 100 000 - 0
184 End-to-End_Error -O--CK 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 16
194 Temperature_Celsius -O---K 072 060 000 - 28 (Min/Max 21/40)
195 Hardware_ECC_Recovered -O--CK 100 100 000 - 0
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
202 Percent_Lifetime_Remain ----CK 099 099 001 - 1
206 Write_Error_Rate -OSR-- 100 100 000 - 0
246 Unknown_Attribute -O--CK 100 100 000 - 21334079857
247 Host_Program_Page_Count -O--CK 100 100 000 - 666620230
248 Bckgnd_Program_Page_Cnt -O--CK 100 100 000 - 177521085
180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 000 000 000 - 4652
210 RAIN_Success_Recovered -O--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x24 GPL R/O 8000 Current Device Internal Status Data log
0x25 GPL R/O 8000 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 35328 Device vendor specific log
0xa1 GPL,SL VS 4 Device vendor specific log
0xa3 GPL VS 13824 Device vendor specific log
0xa4 GPL VS 354 Device vendor specific log
0xa4 SL VS 98 Device vendor specific log
0xa5 GPL VS 8000 Device vendor specific log
0xa5 SL VS 64 Device vendor specific log
0xa6 GPL VS 8000 Device vendor specific log
0xa6 SL VS 64 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Vendor (0xff) Completed without error 00% 18674 -
# 2 Vendor (0xff) Completed without error 00% 18598 -
# 3 Vendor (0xff) Completed without error 00% 18477 -
# 4 Vendor (0xff) Completed without error 00% 18354 -
# 5 Vendor (0xff) Completed without error 00% 18232 -
# 6 Vendor (0xff) Completed without error 00% 18116 -
# 7 Vendor (0xff) Completed without error 00% 17994 -
# 8 Vendor (0xff) Completed without error 00% 17873 -
# 9 Vendor (0xff) Completed without error 00% 17764 -
#10 Vendor (0xff) Completed without error 00% 17635 -
#11 Vendor (0xff) Completed without error 00% 17514 -
#12 Vendor (0xff) Completed without error 00% 17393 -
#13 Vendor (0xff) Completed without error 00% 17271 -
#14 Vendor (0xff) Completed without error 00% 17152 -
#15 Vendor (0xff) Completed without error 00% 17029 -
#16 Vendor (0xff) Completed without error 00% 16914 -
#17 Vendor (0xff) Completed without error 00% 16840 -
#18 Vendor (0xff) Completed without error 00% 16741 -
#19 Vendor (0xff) Completed without error 00% 16615 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: SMART Off-line Data Collection executing in background (4)
Current Temperature: 28 Celsius
Power Cycle Min/Max Temperature: 23/30 Celsius
Lifetime Min/Max Temperature: 21/40 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (174)
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 17 --- Lifetime Power-On Resets
0x01 0x010 4 18674 --- Power-on Hours
0x01 0x018 6 21334079857 --- Logical Sectors Written
0x01 0x020 6 426946599 --- Number of Write Commands
0x01 0x028 6 1316070937 --- Logical Sectors Read
0x01 0x030 6 42497602 --- Number of Read Commands
0x01 0x038 6 67229460000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 16 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 28 --- Current Temperature
0x05 0x010 1 27 --- Average Short Term Temperature
0x05 0x018 1 26 --- Average Long Term Temperature
0x05 0x020 1 40 --- Highest Temperature
0x05 0x028 1 21 --- Lowest Temperature
0x05 0x030 1 35 --- Highest Average Short Term Temperature
0x05 0x038 1 24 --- Lowest Average Short Term Temperature
0x05 0x040 1 31 --- Highest Average Long Term Temperature
0x05 0x048 1 24 --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 464 --- Number of Hardware Resets
0x06 0x010 4 136 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 1 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x0003 4 0 R_ERR response for device-to-host data FIS
0x0004 4 0 R_ERR response for host-to-device data FIS
0x0006 4 0 R_ERR response for device-to-host non-data FIS
0x000a 4 9 Device-to-host register FISes sent due to a COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS

233
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smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p2 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Micron 5100 Pro / 5200 SSDs
Device Model: Micron_5100_MTFDDAK240TCB
Serial Number: --
LU WWN Device Id: 5 00a075 ...
Firmware Version: D0MU037
User Capacity: 240,057,409,536 bytes [240 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon May 25 14:02:12 2020 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x04) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 526) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 5) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
5 Reallocated_Sector_Ct -O--CK 100 100 001 - 0
9 Power_On_Hours -O--CK 100 100 001 - 18674
12 Power_Cycle_Count -O--CK 100 100 001 - 17
170 Reserved_Block_Pct PO--CK 100 100 010 - 0
171 Program_Fail_Count -O--CK 100 100 000 - 0
172 Erase_Fail_Count -O--CK 100 100 001 - 0
173 Avg_Block-Erase_Count -O--CK 099 099 000 - 36
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 12
183 SATA_Int_Downshift_Ct -O--CK 100 100 000 - 0
184 End-to-End_Error -O--CK 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 16
194 Temperature_Celsius -O---K 072 060 000 - 28 (Min/Max 21/40)
195 Hardware_ECC_Recovered -O--CK 100 100 000 - 0
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
202 Percent_Lifetime_Remain ----CK 099 099 001 - 1
206 Write_Error_Rate -OSR-- 100 100 000 - 0
246 Unknown_Attribute -O--CK 100 100 000 - 21332054849
247 Host_Program_Page_Count -O--CK 100 100 000 - 666558100
248 Bckgnd_Program_Page_Cnt -O--CK 100 100 000 - 177312411
180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 000 000 000 - 4652
210 RAIN_Success_Recovered -O--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x24 GPL R/O 8000 Current Device Internal Status Data log
0x25 GPL R/O 8000 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 35328 Device vendor specific log
0xa1 GPL,SL VS 4 Device vendor specific log
0xa3 GPL VS 13824 Device vendor specific log
0xa4 GPL VS 354 Device vendor specific log
0xa4 SL VS 98 Device vendor specific log
0xa5 GPL VS 8000 Device vendor specific log
0xa5 SL VS 64 Device vendor specific log
0xa6 GPL VS 8000 Device vendor specific log
0xa6 SL VS 64 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Vendor (0xff) Completed without error 00% 18674 -
# 2 Vendor (0xff) Completed without error 00% 18597 -
# 3 Vendor (0xff) Completed without error 00% 18476 -
# 4 Vendor (0xff) Completed without error 00% 18352 -
# 5 Vendor (0xff) Completed without error 00% 18229 -
# 6 Vendor (0xff) Completed without error 00% 18115 -
# 7 Vendor (0xff) Completed without error 00% 17993 -
# 8 Vendor (0xff) Completed without error 00% 17873 -
# 9 Vendor (0xff) Completed without error 00% 17764 -
#10 Vendor (0xff) Completed without error 00% 17635 -
#11 Vendor (0xff) Completed without error 00% 17513 -
#12 Vendor (0xff) Completed without error 00% 17393 -
#13 Vendor (0xff) Completed without error 00% 17271 -
#14 Vendor (0xff) Completed without error 00% 17151 -
#15 Vendor (0xff) Completed without error 00% 17029 -
#16 Vendor (0xff) Completed without error 00% 16913 -
#17 Vendor (0xff) Completed without error 00% 16842 -
#18 Vendor (0xff) Completed without error 00% 16738 -
#19 Vendor (0xff) Completed without error 00% 16614 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: SMART Off-line Data Collection executing in background (4)
Current Temperature: 28 Celsius
Power Cycle Min/Max Temperature: 22/30 Celsius
Lifetime Min/Max Temperature: 21/40 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (176)
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 17 --- Lifetime Power-On Resets
0x01 0x010 4 18674 --- Power-on Hours
0x01 0x018 6 21332054849 --- Logical Sectors Written
0x01 0x020 6 426360666 --- Number of Write Commands
0x01 0x028 6 1263761206 --- Logical Sectors Read
0x01 0x030 6 40064539 --- Number of Read Commands
0x01 0x038 6 67229040000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 16 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 28 --- Current Temperature
0x05 0x010 1 27 --- Average Short Term Temperature
0x05 0x018 1 25 --- Average Long Term Temperature
0x05 0x020 1 40 --- Highest Temperature
0x05 0x028 1 21 --- Lowest Temperature
0x05 0x030 1 35 --- Highest Average Short Term Temperature
0x05 0x038 1 24 --- Lowest Average Short Term Temperature
0x05 0x040 1 31 --- Highest Average Long Term Temperature
0x05 0x048 1 24 --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 445 --- Number of Hardware Resets
0x06 0x010 4 131 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 1 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x0003 4 0 R_ERR response for device-to-host data FIS
0x0004 4 0 R_ERR response for host-to-device data FIS
0x0006 4 0 R_ERR response for device-to-host non-data FIS
0x000a 4 9 Device-to-host register FISes sent due to a COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS

233
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smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p2 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Micron 5100 Pro / 5200 SSDs
Device Model: Micron_5100_MTFDDAK240TCB
Serial Number: --
LU WWN Device Id: 5 00a075 ...
Firmware Version: D0MU037
User Capacity: 240,057,409,536 bytes [240 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon May 25 14:02:09 2020 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x04) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 68) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 5) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
5 Reallocated_Sector_Ct -O--CK 100 100 001 - 0
9 Power_On_Hours -O--CK 100 100 001 - 18712
12 Power_Cycle_Count -O--CK 100 100 001 - 16
170 Reserved_Block_Pct PO--CK 100 100 010 - 0
171 Program_Fail_Count -O--CK 100 100 000 - 0
172 Erase_Fail_Count -O--CK 100 100 001 - 0
173 Avg_Block-Erase_Count -O--CK 071 071 000 - 958
174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 15
183 SATA_Int_Downshift_Ct -O--CK 100 100 000 - 0
184 End-to-End_Error -O--CK 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 11
194 Temperature_Celsius -O---K 071 059 000 - 29 (Min/Max 19/41)
195 Hardware_ECC_Recovered -O--CK 100 100 000 - 0
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
202 Percent_Lifetime_Remain ----CK 071 071 001 - 29
206 Write_Error_Rate -OSR-- 100 100 000 - 0
246 Unknown_Attribute -O--CK 100 100 000 - 603199265477
247 Host_Program_Page_Count -O--CK 100 100 000 - 18813824568
248 Bckgnd_Program_Page_Cnt -O--CK 100 100 000 - 3533127673
180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 000 000 000 - 4652
210 RAIN_Success_Recovered -O--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x24 GPL R/O 8000 Current Device Internal Status Data log
0x25 GPL R/O 8000 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 35328 Device vendor specific log
0xa1 GPL,SL VS 4 Device vendor specific log
0xa3 GPL VS 13824 Device vendor specific log
0xa4 GPL VS 354 Device vendor specific log
0xa4 SL VS 98 Device vendor specific log
0xa5 GPL VS 8000 Device vendor specific log
0xa5 SL VS 64 Device vendor specific log
0xa6 GPL VS 8000 Device vendor specific log
0xa6 SL VS 64 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Vendor (0xff) Completed without error 00% 16910 -
# 2 Vendor (0xff) Completed without error 00% 14729 -
# 3 Vendor (0xff) Completed without error 00% 13876 -
# 4 Vendor (0xff) Completed without error 00% 12122 -
# 5 Vendor (0xff) Completed without error 00% 11395 -
# 6 Vendor (0xff) Completed without error 00% 10728 -
# 7 Vendor (0xff) Completed without error 00% 10077 -
# 8 Vendor (0xff) Completed without error 00% 9425 -
# 9 Vendor (0xff) Completed without error 00% 8621 -
#10 Vendor (0xff) Completed without error 00% 7905 -
#11 Vendor (0xff) Completed without error 00% 7371 -
#12 Vendor (0xff) Completed without error 00% 6918 -
#13 Vendor (0xff) Completed without error 00% 6491 -
#14 Vendor (0xff) Completed without error 00% 6020 -
#15 Vendor (0xff) Completed without error 00% 5584 -
#16 Vendor (0xff) Completed without error 00% 5067 -
#17 Vendor (0xff) Completed without error 00% 4710 -
#18 Vendor (0xff) Completed without error 00% 4353 -
#19 Vendor (0xff) Completed without error 00% 3863 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: SMART Off-line Data Collection executing in background (4)
Current Temperature: 29 Celsius
Power Cycle Min/Max Temperature: 19/32 Celsius
Lifetime Min/Max Temperature: 19/41 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (369)
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 16 --- Lifetime Power-On Resets
0x01 0x010 4 18712 --- Power-on Hours
0x01 0x018 6 603199265477 --- Logical Sectors Written
0x01 0x020 6 12586531306 --- Number of Write Commands
0x01 0x028 6 6300354038 --- Logical Sectors Read
0x01 0x030 6 113277045 --- Number of Read Commands
0x01 0x038 6 67365900000 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 11 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 29 --- Current Temperature
0x05 0x010 1 28 --- Average Short Term Temperature
0x05 0x018 1 27 --- Average Long Term Temperature
0x05 0x020 1 41 --- Highest Temperature
0x05 0x028 1 19 --- Lowest Temperature
0x05 0x030 1 36 --- Highest Average Short Term Temperature
0x05 0x038 1 26 --- Lowest Average Short Term Temperature
0x05 0x040 1 32 --- Highest Average Long Term Temperature
0x05 0x048 1 26 --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 225 --- Number of Hardware Resets
0x06 0x010 4 75 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 29 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x0003 4 0 R_ERR response for device-to-host data FIS
0x0004 4 0 R_ERR response for host-to-device data FIS
0x0006 4 0 R_ERR response for device-to-host non-data FIS
0x000a 4 9 Device-to-host register FISes sent due to a COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS

195
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smartctl 7.1 2019-12-30 r5022 [FreeBSD 13.0-CURRENT amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: MTFDDAV256MBF-1AN15ABHA
Serial Number: --
LU WWN Device Id: 5 00a075 ...
Firmware Version: M6T3
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: < 1.8 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-3 T13/2161-D revision 4
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri May 29 22:08:12 2020 EEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 814) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 15) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 32
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 100 100 000 - 511
11 Unknown_SSD_Attribute -O---K 100 100 000 - 65
12 Power_Cycle_Count -O--CK 100 100 000 - 3646
171 Unknown_Attribute -O---K 100 100 000 - 0
172 Unknown_Attribute -O--CK 100 100 000 - 0
173 Unknown_Attribute PO--CK 097 097 010 - 99
174 Unknown_Attribute -O--CK 100 100 000 - 65
181 Program_Fail_Cnt_Total -O---K 100 100 000 - 7499036034416
183 Runtime_Bad_Block -O--CK 100 100 000 - 127
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 3722
194 Temperature_Celsius -O---K 059 032 000 - 41 (Min/Max 9/68)
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O---K 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x24 GPL R/O 16000 Current Device Internal Status Data log
0x25 GPL R/O 16000 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 2000 Device vendor specific log
0xa0 SL VS 208 Device vendor specific log
0xa1-0xb5 GPL,SL VS 1 Device vendor specific log
0xb6 GPL VS 8193 Device vendor specific log
0xb7-0xbf GPL,SL VS 1 Device vendor specific log
0xc0 GPL,SL VS 80 Device vendor specific log
0xc1-0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 2 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 41 Celsius
Power Cycle Min/Max Temperature: 41/67 Celsius
Lifetime Min/Max Temperature: 9/68 Celsius
Specified Max Operating Temperature: 70 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (37)
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 2) ==
0x01 0x008 4 3646 --- Lifetime Power-On Resets
0x01 0x010 4 511 --- Power-on Hours
0x01 0x018 6 17770408198 --- Logical Sectors Written
0x01 0x020 6 190198633 --- Number of Write Commands
0x01 0x028 6 36943649678 --- Logical Sectors Read
0x01 0x030 6 550884215 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 3722 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 41 --- Current Temperature
0x05 0x010 1 47 --- Average Short Term Temperature
0x05 0x018 1 - --- Average Long Term Temperature
0x05 0x020 1 68 --- Highest Temperature
0x05 0x028 1 9 --- Lowest Temperature
0x05 0x030 1 47 --- Highest Average Short Term Temperature
0x05 0x038 1 46 --- Lowest Average Short Term Temperature
0x05 0x040 1 - --- Highest Average Long Term Temperature
0x05 0x048 1 - --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 8024 --- Number of Hardware Resets
0x06 0x010 4 3239 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 3 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x000a 4 3 Device-to-host register FISes sent due to a COMRESET

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Micron Solid State Drives
=========================
This is a list of all tested Micron solid state drive models and their MTBFs. See
more info on reliability test in the [README](https://github.com/bsdhw/SMART).
Contents
--------
1. [ SSD by Model ](#ssd-by-model)
2. [ SSD by Family ](#ssd-by-family)
SSD by Model
------------
Please take all columns into account when reading the table. Pay attention on the
number of tested samples and power-on days. Simultaneous high values of both MTBF
and errors are possible if only rare drives in the subset encounter errors.
Days — avg. days per sample,
Err — avg. errors per sample,
MTBF — avg. MTBF in years per sample.
| MFG | Model | Size | Samples | Days | Err | MTBF |
|-----------|--------------------|--------|---------|-------|-------|--------|
| Micron | 5100_MTFDDAK240TCB | 240 GB | 4 | 778 | 0 | 2.13 |
| Micron | 1100_MTFDDAK256TBN | 256 GB | 1 | 115 | 0 | 0.32 |
| Micron | MTFDDAV256MBF-1... | 256 GB | 1 | 21 | 0 | 0.06 |
SSD by Family
-------------
Please take all columns into account when reading the table. Pay attention on the
number of tested samples and power-on days. Simultaneous high values of both MTBF
and errors are possible if only rare drives in the subset encounter errors.
Days — avg. days per sample,
Err — avg. errors per sample,
MTBF — avg. MTBF in years per sample.
| MFG | Family | Models | Samples | Days | Err | MTBF |
|-----------|------------------------|--------|---------|-------|-------|--------|
| Micron | 5100 Pro / 5200 SSDs | 1 | 4 | 778 | 0 | 2.13 |
| Micron | BX/MX1/2/3/500, M5/... | 2 | 2 | 68 | 0 | 0.19 |