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mirror of https://github.com/bsdhw/SMART.git synced 2025-05-31 16:21:41 +05:30

Update of reports (new: 321, modified: 0)

This commit is contained in:
Andrey Ponomarenko
2020-06-01 15:47:06 +03:00
parent e9f946b4e5
commit fe1dcd6109
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smartctl 7.1 2019-12-30 r5022 [x86_64-unknown-openbsd6.7] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZ7PC128HAFU-000L1
Serial Number: --
Firmware Version: CXM06L1Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun May 31 12:16:23 2020 AEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 540) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 9) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
9 Power_On_Hours 0x0032 096 096 000 Old_age Always - 16411
12 Power_Cycle_Count 0x0032 095 095 000 Old_age Always - 4790
175 Program_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
176 Erase_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
177 Wear_Leveling_Count 0x0013 087 087 017 Pre-fail Always - 466
178 Used_Rsvd_Blk_Cnt_Chip 0x0013 095 095 010 Pre-fail Always - 96
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 095 095 010 Pre-fail Always - 176
180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 095 095 010 Pre-fail Always - 3856
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0032 067 036 000 Old_age Always - 33
195 Hardware_ECC_Recovered 0x001a 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 253 253 000 Old_age Always - 0
233 Media_Wearout_Indicator 0x003a 200 200 000 Old_age Always - 0
234 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
235 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 41
236 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 273
237 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 466
238 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 176
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.