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SMART-open-study/HDD/ExcelStor/J/J8160S/101B8104D513
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smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE-p9 amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: ExcelStor Technology J8160S
Serial Number: --
LU WWN Device Id: 0 000000 ...
Firmware Version: P22OABEA
User Capacity: 160,041,885,696 bytes [160 GB]
Sector Size: 512 bytes logical/physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA/ATAPI-7 T13/1532D revision 1
Local Time is: Fri Sep 11 17:30:58 2020 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Disabled
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 2865) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 48) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate PO-R-- 099 099 016 - 65538
2 Throughput_Performance P-S--- 100 100 050 - 0
3 Spin_Up_Time POS--- 120 120 024 - 165 (Average 166)
4 Start_Stop_Count -O--C- 099 099 000 - 7526
5 Reallocated_Sector_Ct PO--CK 100 100 005 - 1
7 Seek_Error_Rate PO-R-- 100 100 067 - 0
8 Seek_Time_Performance P-S--- 100 100 020 - 0
9 Power_On_Hours -O--C- 097 097 000 - 24072
10 Spin_Retry_Count PO--C- 100 100 060 - 0
12 Power_Cycle_Count -O--CK 099 099 000 - 4632
192 Power-Off_Retract_Count -O--CK 094 094 000 - 8040
193 Load_Cycle_Count -O--C- 094 094 000 - 8040
194 Temperature_Celsius -O---- 181 181 000 - 33 (Min/Max 11/46)
196 Reallocated_Event_Count -O--CK 100 100 000 - 1
197 Current_Pending_Sector -O---K 100 100 000 - 0
198 Offline_Uncorrectable ---R-- 100 100 000 - 0
199 UDMA_CRC_Error_Count -O-R-- 200 253 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x03 GPL R/O 1 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x20 GPL R/O 1 Streaming performance log [OBS-8]
0x21 GPL R/O 1 Write stream error log
0x22 GPL R/O 1 Read stream error log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 2
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 33 Celsius
Power Cycle Min/Max Temperature: --/34 Celsius
Lifetime Min/Max Temperature: --/46 Celsius
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 5/60 Celsius
Min/Max Temperature Limit: -40/65 Celsius
Temperature History Size (Index): 128 (105)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0009 2 4 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 4 Device-to-host register FISes sent due to a COMRESET
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS