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https://github.com/bsdhw/SMART.git
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131 lines
5.3 KiB
Plaintext
131 lines
5.3 KiB
Plaintext
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p1 amd64] (local build)
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Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Device Model: Raid VD
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Serial Number: --
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Firmware Version: MV.R00-0
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User Capacity: 249,975,406,592 bytes [249 GB]
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Sector Size: 512 bytes logical/physical
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TRIM Command: Available
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Device is: Not in smartctl database 7.3/5319
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ATA Version is: ATA8-ACS, ATA/ATAPI-7 T13/1532D revision 4a
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Local Time is: Thu Aug 18 20:35:53 2022 +05
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Unavailable
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APM feature is: Unavailable
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Rd look-ahead is: Enabled
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Write cache is: Enabled
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DSN feature is: Unavailable
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ATA Security is: Unavailable
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Wt Cache Reorder: Unavailable
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=== START OF READ SMART DATA SECTION ===
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SMART Status command failed
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Please get assistance from https://www.smartmontools.org/
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Register values returned from SMART Status command are:
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ERR=0x00, SC=0x00, LL=0x00, LM=0x00, LH=0x00, DEV=...., STS=....
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SMART Status not supported: Invalid ATA output register values
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SMART overall-health self-assessment test result: PASSED
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Warning: This result is based on an Attribute check.
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General SMART Values:
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Offline data collection status: (0x00) Offline data collection activity
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was never started.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 4800) seconds.
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Offline data collection
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capabilities: (0x53) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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No Offline surface scan supported.
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Self-test supported.
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No Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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No General Purpose Logging support.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 80) minutes.
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SMART Attributes Data Structure revision number: 1
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
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9 Power_On_Hours -O--CK 087 087 000 - 63280
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12 Power_Cycle_Count -O--CK 099 099 000 - 257
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177 Wear_Leveling_Count PO--C- 048 048 000 - 630
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179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
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181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
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182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
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183 Runtime_Bad_Block PO--C- 100 100 010 - 0
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187 Reported_Uncorrect -O--CK 100 100 000 - 0
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190 Airflow_Temperature_Cel -O--CK 057 042 000 - 43
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195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
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199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
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235 Unknown_Attribute -O--C- 099 099 000 - 239
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241 Total_LBAs_Written -O--CK 099 099 000 - 83631225603
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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General Purpose Log Directory not supported
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SMART Log Directory Version 1 [multi-sector log support]
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Address Access R/W Size Description
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0x00 SL R/O 1 Log Directory
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0x01 SL R/O 1 Summary SMART error log
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0x02 SL R/O 1 Comprehensive SMART error log
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0x06 SL R/O 1 SMART self-test log
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0x09 SL R/W 1 Selective self-test log
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0x30 SL R/O 9 IDENTIFY DEVICE data log
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0x80-0x9f SL R/W 16 Host vendor specific log
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0xa1 SL VS 16 Device vendor specific log
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0xce SL VS 16 Device vendor specific log
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0xde SL VS 1 Device vendor specific log
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0xe0 SL R/W 1 SCT Command/Status
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0xe1 SL R/W 1 SCT Data Transfer
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SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
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SMART Error Log Version: 1
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No Errors Logged
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SMART Extended Self-test Log (GP Log 0x07) not supported
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SMART Self-test log structure revision number 1
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No self-tests have been logged. [To run self-tests, use: smartctl -t]
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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SCT Commands not supported
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Device Statistics (GP/SMART Log 0x04) not supported
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Pending Defects log (GP Log 0x0c) not supported
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SATA Phy Event Counters (GP Log 0x11) not supported
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