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SMART-open-study/HDD/Samsung/HD161/HD161HJ/07473925B6F5
Andrey Ponomarenko a41331e270 Update of reports (new: 14, modified: 3797)
2023-02-14 02:15:20 +03:00

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smartctl 7.1 2019-12-30 r5022 [x86_64-unknown-openbsd6.8] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG HD161HJ
Serial Number: --
LU WWN Device Id: 5 0000f0 ...
Firmware Version: JF100-19
User Capacity: 160,037,658,112 bytes [160 GB]
Sector Size: 512 bytes logical/physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA/ATAPI-7, ATA8-ACS T13/1699-D revision 3b
Local Time is: Fri Jan 29 02:18:48 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 3000) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 51) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0007 253 253 025 Pre-fail Always - 4416
4 Start_Stop_Count 0x0032 096 096 000 Old_age Always - 4129
5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0
8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 21291
10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0012 253 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 097 097 000 Old_age Always - 3115
13 Read_Soft_Error_Rate 0x000e 100 100 000 Old_age Always - 286973796
184 End-to-End_Error 0x0033 253 253 099 Pre-fail Always - 0
187 Reported_Uncorrect 0x0032 253 253 000 Old_age Always - 0
188 Command_Timeout 0x0032 253 253 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 157 097 000 Old_age Always - 27 (Min/Max 9/47)
194 Temperature_Celsius 0x0022 157 094 000 Old_age Always - 27 (Min/Max 9/48)
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 286973796
196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 253 253 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0
201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0
202 Data_Address_Mark_Errs 0x0032 100 100 000 Old_age Always - 41
SMART Error Log Version: 1
ATA Error Count: 75 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 75 occurred at disk power-on lifetime: 11763 hours (490 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 00 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 00 00 00 e0 00 00:01:25.688 READ DMA
ec 00 00 00 00 00 a0 00 00:01:25.688 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 00 00:01:25.688 SET FEATURES [Set transfer mode]
ec 00 00 00 00 00 a0 00 00:01:25.688 IDENTIFY DEVICE
00 00 01 01 00 00 a0 00 00:01:25.500 NOP [Abort queued commands]
Error 74 occurred at disk power-on lifetime: 11763 hours (490 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 08 00 00 00 e0 Error: ICRC, ABRT 8 sectors at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 00 00 00 e0 00 00:03:25.125 READ DMA
ec 00 00 00 00 00 a0 00 00:03:25.125 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 00 00:03:25.125 SET FEATURES [Set transfer mode]
ec 00 00 00 00 00 a0 00 00:03:25.125 IDENTIFY DEVICE
00 00 01 01 00 00 a0 00 00:03:25.000 NOP [Abort queued commands]
Error 73 occurred at disk power-on lifetime: 11763 hours (490 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 08 00 00 00 e0 Error: ICRC, ABRT 8 sectors at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 00 00 00 e0 00 00:03:13.688 READ DMA
e0 00 00 00 00 00 a0 00 00:03:12.313 STANDBY IMMEDIATE
ec 00 00 00 00 00 a0 00 00:03:12.313 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 00 00:03:12.313 SET FEATURES [Set transfer mode]
ec 00 00 00 00 00 a0 00 00:03:12.313 IDENTIFY DEVICE
Error 72 occurred at disk power-on lifetime: 11763 hours (490 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 05 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000005 = 5
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 05 00 00 e0 00 00:02:41.813 READ DMA
c8 00 01 04 00 00 e0 00 00:02:41.813 READ DMA
c8 00 01 03 00 00 e0 00 00:02:41.813 READ DMA
c8 00 01 02 00 00 e0 00 00:02:41.813 READ DMA
c8 00 01 01 00 00 e0 00 00:02:41.813 READ DMA
Error 71 occurred at disk power-on lifetime: 11763 hours (490 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 04 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000004 = 4
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 04 00 00 e0 00 00:02:35.188 READ DMA
c8 00 01 03 00 00 e0 00 00:02:35.125 READ DMA
c8 00 01 02 00 00 e0 00 00:02:35.125 READ DMA
ec 00 00 00 00 00 a0 00 00:02:35.125 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 00 00:02:35.125 SET FEATURES [Set transfer mode]
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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