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SMART-open-study/HDD/Samsung/HM250/HM250JI/94ECD4F9C42E
2020-11-03 14:43:05 +03:00

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smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: SAMSUNG SpinPoint M5
Device Model: SAMSUNG HM250JI
Serial Number: --
LU WWN Device Id: 5 0f0000 ...
Firmware Version: HS100-08
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS, ATA/ATAPI-7 T13/1532D revision 0
SATA Version is: SATA 2.5, 1.5 Gb/s
Local Time is: Mon Aug 17 09:31:52 2020 SAST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Disabled
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 32) The self-test routine was interrupted
by the host with a hard or soft reset.
Total time to complete Offline
data collection: ( 106) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 106) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-- 100 100 051 - 26131
3 Spin_Up_Time POS--- 252 252 025 - 2625
4 Start_Stop_Count -O--CK 099 099 000 - 1273
5 Reallocated_Sector_Ct PO--CK 001 001 010 NOW 18772
7 Seek_Error_Rate -OSR-- 252 252 051 - 0
8 Seek_Time_Performance --S--K 252 252 015 - 0
9 Power_On_Hours -O--CK 252 252 000 - 395
10 Spin_Retry_Count -O--CK 252 252 051 - 0
12 Power_Cycle_Count -O--CK 100 100 000 - 469
191 G-Sense_Error_Rate -O--CK 100 100 000 - 5530
192 Power-Off_Retract_Count -O--CK 100 100 000 - 333
194 Temperature_Celsius -O---K 145 061 000 - 31 (Min/Max 5/59)
195 Hardware_ECC_Recovered -O-RC- 001 001 000 - 52035
196 Reallocated_Event_Count -O--CK 252 252 000 - 0
197 Current_Pending_Sector -O--C- 252 252 000 - 0
198 Offline_Uncorrectable ----CK 252 252 000 - 0
199 UDMA_CRC_Error_Count -OS-CK 200 200 000 - 0
200 Multi_Zone_Error_Rate -O-R-- 100 100 000 - 1956
201 Soft_Read_Error_Rate -O--CK 252 252 000 - 0
223 Load_Retry_Count -O--CK 100 100 000 - 883
225 Load_Cycle_Count -O--CK 098 098 000 - 20692
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 2 Comprehensive SMART error log
0x03 GPL R/O 2 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x08 SL R/O 1 Power Conditions log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x80 GPL,SL R/W 16 Host vendor specific log
0x81-0x9f SL R/W 16 Host vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
Device Error Count: 16628 (device log contains only the most recent 8 errors)
CR = Command Register
FEATR = Features Register
COUNT = Count (was: Sector Count) Register
LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
LH = LBA High (was: Cylinder High) Register ] LBA
LM = LBA Mid (was: Cylinder Low) Register ] Register
LL = LBA Low (was: Sector Number) Register ]
DV = Device (was: Device/Head) Register
DC = Device Control Register
ER = Error register
ST = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 16628 [3] occurred at disk power-on lifetime: 8 hours (0 days + 8 hours)
When the command that caused the error occurred, the device was in an unknown state.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
04 -- 51 00 01 00 00 00 00 00 00 40 00 Error: ABRT 1 sectors at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
25 00 00 00 01 00 00 00 00 00 00 40 00 00:00:12.437 READ DMA EXT
Error 16627 [2] occurred at disk power-on lifetime: 8 hours (0 days + 8 hours)
When the command that caused the error occurred, the device was in an unknown state.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
04 -- 51 00 01 00 00 00 00 00 00 40 00 Error: ABRT 1 sectors at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
25 00 00 00 01 00 00 00 00 00 00 40 00 00:00:11.562 READ DMA EXT
Error 16626 [1] occurred at disk power-on lifetime: 8 hours (0 days + 8 hours)
When the command that caused the error occurred, the device was in an unknown state.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
04 -- 51 00 01 00 00 00 00 00 00 40 00 Error: ABRT 1 sectors at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
25 00 00 00 01 00 00 00 00 00 00 40 00 00:00:10.687 READ DMA EXT
Error 16625 [0] occurred at disk power-on lifetime: 8 hours (0 days + 8 hours)
When the command that caused the error occurred, the device was in an unknown state.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
04 -- 51 00 01 00 00 00 00 00 00 40 00 Error: ABRT 1 sectors at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
25 00 00 00 01 00 00 00 00 00 00 40 00 00:00:10.000 READ DMA EXT
ATA_READ_LOG_EXT (addr=0x03:0x00, page=1, n=1) failed: Input/output error
SMART Extended Self-test Log (GP Log 0x07) not supported
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed: handling damage?? 00% 127 0
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Interrupted [00% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 2
SCT Version (vendor specific): 256 (0x0100)
Device State: Active (0)
Current Temperature: 31 Celsius
Power Cycle Min/Max Temperature: 22/39 Celsius
Lifetime Min/Max Temperature: 8/61 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 15/55 Celsius
Min/Max Temperature Limit: 10/60 Celsius
Temperature History Size (Index): 128 (25)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x000a 2 57 Device-to-host register FISes sent due to a COMRESET
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
0x000b 2 0 CRC errors within host-to-device FIS
0x000d 2 0 Non-CRC errors within host-to-device FIS
0x8001 2 0 Vendor specific