mirror of
https://github.com/bsdhw/SMART.git
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192 lines
8.7 KiB
Plaintext
192 lines
8.7 KiB
Plaintext
smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-STABLE amd64] (local build)
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Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Family: SAMSUNG SpinPoint M6
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Device Model: SAMSUNG HM251JI
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Serial Number: --
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LU WWN Device Id: 5 0f0000 ...
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Firmware Version: 2SS00_01
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User Capacity: 250,059,350,016 bytes [250 GB]
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Sector Size: 512 bytes logical/physical
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Device is: In smartctl database [for details use: -P show]
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ATA Version is: ATA8-ACS, ATA/ATAPI-7 T13/1532D revision 0
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SATA Version is: SATA 2.5, 1.5 Gb/s
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Local Time is: Fri Oct 22 15:36:07 2021 CEST
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Disabled
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APM feature is: Disabled
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Rd look-ahead is: Enabled
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Write cache is: Enabled
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DSN feature is: Unavailable
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ATA Security is: Disabled, NOT FROZEN [SEC1]
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Write SCT (Get) Feature Control Command failed: Read of ATA output registers not implemented [JMicron]
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Wt Cache Reorder: Unknown (SCT Feature Control command failed)
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x00) Offline data collection activity
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was never started.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 85) seconds.
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Offline data collection
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capabilities: (0x5b) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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No Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 85) minutes.
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SCT capabilities: (0x003f) SCT Status supported.
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SCT Error Recovery Control supported.
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SCT Feature Control supported.
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SCT Data Table supported.
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SMART Attributes Data Structure revision number: 16
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate POSR-- 100 100 051 - 0
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3 Spin_Up_Time POS--- 252 252 025 - 3187
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4 Start_Stop_Count -O--CK 072 072 000 - 29252
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5 Reallocated_Sector_Ct PO--CK 252 252 010 - 0
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7 Seek_Error_Rate -OSR-- 252 252 051 - 0
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8 Seek_Time_Performance --S--K 252 252 015 - 0
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9 Power_On_Hours -O--CK 252 252 000 - 27
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10 Spin_Retry_Count -O--CK 100 100 051 - 27
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12 Power_Cycle_Count -O--CK 100 100 000 - 70
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191 G-Sense_Error_Rate -O--CK 252 252 000 - 0
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192 Power-Off_Retract_Count -O--CK 100 100 000 - 58
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194 Temperature_Celsius -O---K 154 154 000 - 28 (Min/Max 12/48)
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195 Hardware_ECC_Recovered -O-RC- 100 100 000 - 0
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196 Reallocated_Event_Count -O--CK 252 252 000 - 0
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197 Current_Pending_Sector -O--C- 252 252 000 - 0
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198 Offline_Uncorrectable ----CK 252 252 000 - 0
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199 UDMA_CRC_Error_Count -OS-CK 200 200 000 - 1
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200 Multi_Zone_Error_Rate -O-R-- 100 100 000 - 0
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201 Soft_Read_Error_Rate -O--CK 252 252 000 - 0
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223 Load_Retry_Count -O--CK 099 099 000 - 1290
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225 Load_Cycle_Count -O--CK 067 067 000 - 343084
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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General Purpose Log Directory Version 1
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SMART Log Directory Version 1 [multi-sector log support]
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Address Access R/W Size Description
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0x00 GPL,SL R/O 1 Log Directory
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0x01 SL R/O 1 Summary SMART error log
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0x02 SL R/O 2 Comprehensive SMART error log
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0x03 GPL R/O 2 Ext. Comprehensive SMART error log
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0x06 SL R/O 1 SMART self-test log
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0x08 SL R/O 1 Power Conditions log
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0x10 GPL R/O 1 NCQ Command Error log
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0x11 GPL R/O 1 SATA Phy Event Counters log
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0x80 GPL,SL R/W 16 Host vendor specific log
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0x81-0x9f SL R/W 16 Host vendor specific log
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0xe0 GPL,SL R/W 1 SCT Command/Status
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0xe1 GPL,SL R/W 1 SCT Data Transfer
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SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
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Device Error Count: 1
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CR = Command Register
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FEATR = Features Register
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COUNT = Count (was: Sector Count) Register
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LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
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LH = LBA High (was: Cylinder High) Register ] LBA
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LM = LBA Mid (was: Cylinder Low) Register ] Register
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LL = LBA Low (was: Sector Number) Register ]
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DV = Device (was: Device/Head) Register
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DC = Device Control Register
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ER = Error register
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ST = Status register
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Powered_Up_Time is measured from power on, and printed as
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DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
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SS=sec, and sss=millisec. It "wraps" after 49.710 days.
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Error 1 [0] occurred at disk power-on lifetime: 15 hours (0 days + 15 hours)
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When the command that caused the error occurred, the device was in an unknown state.
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After command completion occurred, registers were:
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ER -- ST COUNT LBA_48 LH LM LL DV DC
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-- -- -- == -- == == == -- -- -- -- --
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84 -- 51 00 01 00 00 00 00 00 02 e0 00 Error: ICRC, ABRT 1 sectors at LBA = 0x00000002 = 2
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Commands leading to the command that caused the error were:
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CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
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-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
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25 00 00 00 01 00 00 00 00 00 02 e0 00 2d+18:04:56.863 READ DMA EXT
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e1 00 00 00 00 00 00 00 00 00 00 e0 00 2d+18:04:54.238 IDLE IMMEDIATE
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e5 00 00 00 00 00 00 00 00 00 00 a0 00 2d+18:04:49.738 CHECK POWER MODE
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e5 00 00 00 00 00 00 00 00 00 00 a0 00 2d+18:04:43.176 CHECK POWER MODE
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e5 00 00 00 00 00 00 00 00 00 00 a0 00 2d+18:04:36.613 CHECK POWER MODE
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SMART Extended Self-test Log (GP Log 0x07) not supported
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SMART Self-test log structure revision number 1
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No self-tests have been logged. [To run self-tests, use: smartctl -t]
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SMART Selective self-test log data structure revision number 0
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Note: revision number not 1 implies that no selective self-test has ever been run
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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SCT Status Version: 2
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SCT Version (vendor specific): 256 (0x0100)
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Device State: Active (0)
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Current Temperature: 28 Celsius
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Power Cycle Min/Max Temperature: 17/28 Celsius
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Lifetime Min/Max Temperature: 12/55 Celsius
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Under/Over Temperature Limit Count: 0/0
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SCT Temperature History Version: 2
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Temperature Sampling Period: 1 minute
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Temperature Logging Interval: 1 minute
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Min/Max recommended Temperature: 15/55 Celsius
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Min/Max Temperature Limit: 10/60 Celsius
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Temperature History Size (Index): 128 (13)
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Write SCT (Get) Error Recovery Control Command failed: Read of ATA output registers not implemented [JMicron]
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SCT (Get) Error Recovery Control command failed
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Device Statistics (GP/SMART Log 0x04) not supported
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Pending Defects log (GP Log 0x0c) not supported
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SATA Phy Event Counters (GP Log 0x11)
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ID Size Value Description
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0x0001 2 0 Command failed due to ICRC error
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0x000a 2 0 Device-to-host register FISes sent due to a COMRESET
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0x0008 2 0 Device-to-host non-data FIS retries
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0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
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0x000b 2 0 CRC errors within host-to-device FIS
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0x000d 2 0 Non-CRC errors within host-to-device FIS
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0x8001 2 0 Vendor specific
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