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https://github.com/bsdhw/SMART.git
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157 lines
6.8 KiB
Plaintext
157 lines
6.8 KiB
Plaintext
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build)
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Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Family: SAMSUNG SpinPoint M7
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Device Model: SAMSUNG HM320II
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Serial Number: --
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LU WWN Device Id: 5 0024e9 ...
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Firmware Version: 2AC101C4
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User Capacity: 320,072,933,376 bytes [320 GB]
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Sector Size: 512 bytes logical/physical
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Form Factor: 2.5 inches
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Device is: In smartctl database 7.3/5319
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ATA Version is: ATA8-ACS T13/1699-D revision 6
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SATA Version is: SATA 2.6, 3.0 Gb/s
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Local Time is: Sun Mar 12 15:02:05 2023 UTC
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Disabled
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APM feature is: Disabled
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Rd look-ahead is: Enabled
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Write cache is: Enabled
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DSN feature is: Unavailable
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ATA Security is: Disabled, NOT FROZEN [SEC1]
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Write SCT (Get) Feature Control Command failed: Read of ATA output registers not implemented [JMicron]
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Wt Cache Reorder: Unknown (SCT Feature Control command failed)
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x00) Offline data collection activity
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was never started.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 5220) seconds.
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Offline data collection
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capabilities: (0x5b) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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No Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 87) minutes.
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SCT capabilities: (0x003f) SCT Status supported.
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SCT Error Recovery Control supported.
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SCT Feature Control supported.
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SCT Data Table supported.
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SMART Attributes Data Structure revision number: 16
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate POSR-K 100 100 051 - 0
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2 Throughput_Performance -OS--K 252 252 000 - 0
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3 Spin_Up_Time PO---K 091 086 025 - 2940
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4 Start_Stop_Count -O--CK 100 100 000 - 391
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5 Reallocated_Sector_Ct PO--CK 252 252 010 - 0
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7 Seek_Error_Rate -OSR-K 252 252 051 - 0
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8 Seek_Time_Performance --S--K 252 252 015 - 0
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9 Power_On_Hours -O--CK 100 100 000 - 610
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10 Spin_Retry_Count -O--CK 252 252 051 - 0
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11 Calibration_Retry_Count -O--CK 100 100 000 - 7
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12 Power_Cycle_Count -O--CK 100 100 000 - 612
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191 G-Sense_Error_Rate -O---K 100 100 000 - 10
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192 Power-Off_Retract_Count -O---K 252 252 000 - 0
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194 Temperature_Celsius -O---- 064 057 000 - 27 (Min/Max 15/43)
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195 Hardware_ECC_Recovered -O-RCK 100 100 000 - 0
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196 Reallocated_Event_Count -O--CK 252 252 000 - 0
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197 Current_Pending_Sector -O--CK 252 252 000 - 0
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198 Offline_Uncorrectable ----CK 252 252 000 - 0
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199 UDMA_CRC_Error_Count -OS-CK 100 100 000 - 10
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200 Multi_Zone_Error_Rate -O-R-K 100 100 000 - 21426
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223 Load_Retry_Count -O--CK 100 100 000 - 7
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225 Load_Cycle_Count -O--CK 069 069 000 - 323012
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented [JMicron]
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Read GP Log Directory failed
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SMART Log Directory Version 1 [multi-sector log support]
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Address Access R/W Size Description
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0x00 SL R/O 1 Log Directory
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0x01 SL R/O 1 Summary SMART error log
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0x02 SL R/O 2 Comprehensive SMART error log
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0x06 SL R/O 1 SMART self-test log
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0x09 SL R/W 1 Selective self-test log
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0x80-0x9f SL R/W 16 Host vendor specific log
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0xe0 SL R/W 1 SCT Command/Status
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0xe1 SL R/W 1 SCT Data Transfer
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SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
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SMART Error Log Version: 1
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No Errors Logged
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SMART Extended Self-test Log (GP Log 0x07) not supported
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SMART Self-test log structure revision number 1
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No self-tests have been logged. [To run self-tests, use: smartctl -t]
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SMART Selective self-test log data structure revision number 0
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Note: revision number not 1 implies that no selective self-test has ever been run
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Completed [00% left] (0-65535)
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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SCT Status Version: 2
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SCT Version (vendor specific): 256 (0x0100)
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Device State: Active (0)
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Current Temperature: 26 Celsius
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Power Cycle Min/Max Temperature: 26/26 Celsius
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Lifetime Min/Max Temperature: 18/46 Celsius
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Specified Max Operating Temperature: 80 Celsius
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Under/Over Temperature Limit Count: 0/0
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SCT Temperature History Version: 2
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Temperature Sampling Period: 5 minutes
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Temperature Logging Interval: 5 minutes
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Min/Max recommended Temperature: -5/80 Celsius
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Min/Max Temperature Limit: -10/85 Celsius
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Temperature History Size (Index): 128 (112)
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Write SCT (Get) Error Recovery Control Command failed: Read of ATA output registers not implemented [JMicron]
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SCT (Get) Error Recovery Control command failed
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Device Statistics (GP/SMART Log 0x04) not supported
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Pending Defects log (GP Log 0x0c) not supported
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ATA_READ_LOG_EXT (addr=0x11:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented [JMicron]
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Read SATA Phy Event Counters failed
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