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232 lines
10 KiB
Plaintext
232 lines
10 KiB
Plaintext
smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.1-RELEASE-p4 amd64] (local build)
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Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Family: Seagate Barracuda 7200.7 and 7200.7 Plus
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Device Model: ST3120026AS
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Serial Number: --
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Firmware Version: 3.18
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User Capacity: 120,034,123,776 bytes [120 GB]
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Sector Size: 512 bytes logical/physical
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Device is: In smartctl database 7.3/5528
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ATA Version is: ATA/ATAPI-6 T13/1410D revision 2
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Local Time is: Thu Sep 26 12:07:46 2024 MSK
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Unavailable
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APM feature is: Unavailable
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Rd look-ahead is: Enabled
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Write cache is: Enabled
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DSN feature is: Unavailable
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ATA Security is: Disabled, NOT FROZEN [SEC1]
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Wt Cache Reorder: Unavailable
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x82) Offline data collection activity
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was completed without error.
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Auto Offline Data Collection: Enabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 430) seconds.
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Offline data collection
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capabilities: (0x5b) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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No Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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No General Purpose Logging support.
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Short self-test routine
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recommended polling time: ( 1) minutes.
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Extended self-test routine
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recommended polling time: ( 85) minutes.
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SMART Attributes Data Structure revision number: 10
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate POSR-- 058 051 006 - 42085316
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3 Spin_Up_Time PO---- 096 096 000 - 0
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4 Start_Stop_Count -O--CK 098 098 020 - 2067
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5 Reallocated_Sector_Ct PO--CK 100 100 036 - 0
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7 Seek_Error_Rate POSR-- 084 060 030 - 291022942
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9 Power_On_Hours -O--CK 033 033 000 - 59418
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10 Spin_Retry_Count PO--C- 100 100 097 - 0
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12 Power_Cycle_Count -O--CK 099 099 020 - 1288
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194 Temperature_Celsius -O---K 039 059 000 - 39
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195 Hardware_ECC_Recovered -O-RC- 058 051 000 - 42085316
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197 Current_Pending_Sector -O--C- 100 100 000 - 0
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198 Offline_Uncorrectable ----C- 100 100 000 - 0
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199 UDMA_CRC_Error_Count -OSRCK 200 199 000 - 5
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200 Multi_Zone_Error_Rate ------ 100 253 000 - 0
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202 Data_Address_Mark_Errs -O--CK 100 253 000 - 0
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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General Purpose Log Directory not supported
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SMART Log Directory Version 1 [multi-sector log support]
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Address Access R/W Size Description
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0x00 SL R/O 1 Log Directory
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0x01 SL R/O 1 Summary SMART error log
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0x02 SL R/O 5 Comprehensive SMART error log
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0x03 SL R/O 5 Ext. Comprehensive SMART error log
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0x06 SL R/O 1 SMART self-test log
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0x07 SL R/O 1 Extended self-test log
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0x09 SL R/W 1 Selective self-test log
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0x20 SL R/O 1 Streaming performance log
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0x21 SL R/O 1 Write stream error log
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0x22 SL R/O 1 Read stream error log
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0x23 SL R/O 1 Delayed sector log
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0x80-0x9f SL R/W 16 Host vendor specific log
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0xa0 SL VS 1 Device vendor specific log
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0xa1 SL VS 20 Device vendor specific log
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0xa2 SL VS 101 Device vendor specific log
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0xa8 SL VS 20 Device vendor specific log
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0xa9 SL VS 1 Device vendor specific log
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SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
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SMART Error Log Version: 1
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ATA Error Count: 5
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CR = Command Register [HEX]
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FR = Features Register [HEX]
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SC = Sector Count Register [HEX]
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SN = Sector Number Register [HEX]
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CL = Cylinder Low Register [HEX]
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CH = Cylinder High Register [HEX]
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DH = Device/Head Register [HEX]
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DC = Device Command Register [HEX]
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ER = Error register [HEX]
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ST = Status register [HEX]
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Powered_Up_Time is measured from power on, and printed as
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DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
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SS=sec, and sss=millisec. It "wraps" after 49.710 days.
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Error 5 occurred at disk power-on lifetime: 35958 hours (1498 days + 6 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 51 c4 c4 2b 02 e0 Error: UNC 196 sectors at LBA = 0x00022bc4 = 142276
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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c8 00 00 00 2b 02 e0 00 00:04:11.975 READ DMA
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c8 00 00 00 2a 02 e0 00 00:04:11.973 READ DMA
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c8 00 00 00 29 02 e0 00 00:04:11.971 READ DMA
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c8 00 00 00 28 02 e0 00 00:04:11.970 READ DMA
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c8 00 00 00 27 02 e0 00 00:04:11.967 READ DMA
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Error 4 occurred at disk power-on lifetime: 5367 hours (223 days + 15 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 51 06 44 50 35 e0 Error: UNC 6 sectors at LBA = 0x00355044 = 3493956
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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25 00 42 3e 50 35 e0 00 20:26:58.673 READ DMA EXT
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25 00 42 3e 50 35 e0 00 20:26:58.672 READ DMA EXT
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25 00 3e 80 73 2d e0 00 20:26:58.671 READ DMA EXT
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e7 00 00 00 00 00 e0 00 20:26:58.662 FLUSH CACHE
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35 00 08 67 57 13 e0 00 20:26:58.661 WRITE DMA EXT
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Error 3 occurred at disk power-on lifetime: 5367 hours (223 days + 15 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 51 06 44 50 35 e0 Error: UNC 6 sectors at LBA = 0x00355044 = 3493956
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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25 00 42 3e 50 35 e0 00 20:26:58.673 READ DMA EXT
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25 00 3e 80 73 2d e0 00 20:26:58.672 READ DMA EXT
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e7 00 00 00 00 00 e0 00 20:26:58.671 FLUSH CACHE
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35 00 08 67 57 13 e0 00 20:26:58.662 WRITE DMA EXT
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e7 00 00 20 4d 45 e0 00 20:26:58.661 FLUSH CACHE
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Error 2 occurred at disk power-on lifetime: 5367 hours (223 days + 15 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 51 06 44 50 35 e0 Error: UNC 6 sectors at LBA = 0x00355044 = 3493956
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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25 00 42 3e 50 35 e0 00 20:25:36.347 READ DMA EXT
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25 00 42 3e 50 35 e0 00 20:25:36.339 READ DMA EXT
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35 00 61 1f 92 9d e0 00 20:25:36.330 WRITE DMA EXT
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25 00 61 1f 92 9d e0 00 20:25:36.329 READ DMA EXT
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35 00 80 00 92 9d e0 00 20:25:36.314 WRITE DMA EXT
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Error 1 occurred at disk power-on lifetime: 5367 hours (223 days + 15 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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40 51 06 44 50 35 e0 Error: UNC 6 sectors at LBA = 0x00355044 = 3493956
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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25 00 42 3e 50 35 e0 00 20:25:36.347 READ DMA EXT
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35 00 61 1f 92 9d e0 00 20:25:36.339 WRITE DMA EXT
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25 00 61 1f 92 9d e0 00 20:25:36.330 READ DMA EXT
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35 00 80 00 92 9d e0 00 20:25:36.329 WRITE DMA EXT
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25 00 80 00 92 9d e0 00 20:25:36.314 READ DMA EXT
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SMART Extended Self-test Log (GP Log 0x07) not supported
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SMART Self-test log structure revision number 1
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Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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# 1 Short offline Completed without error 00% 59371 -
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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SCT Commands not supported
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Device Statistics (GP/SMART Log 0x04) not supported
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Pending Defects log (GP Log 0x0c) not supported
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SATA Phy Event Counters (GP Log 0x11) not supported
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