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SMART-open-study/HDD/Toshiba/MQ01/MQ01ABD100H/5B72F4EF25D7
Andrey Ponomarenko a41331e270 Update of reports (new: 14, modified: 3797)
2023-02-14 02:15:20 +03:00

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smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-CURRENT amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA MQ01ABD100H
Serial Number: --
LU WWN Device Id: 5 000039 ...
Firmware Version: AUF01H
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Sun Jan 10 06:51:35 2021 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 128 (minimum power consumption without standby)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate PO-R-- 100 100 050 - 0
2 Throughput_Performance P-S--- 100 100 050 - 0
3 Spin_Up_Time POS--K 100 100 001 - 2640
4 Start_Stop_Count -O--CK 100 100 000 - 1643
5 Reallocated_Sector_Ct PO--CK 100 100 050 - 0
7 Seek_Error_Rate PO-R-- 100 100 050 - 0
8 Seek_Time_Performance P-S--- 100 100 050 - 0
9 Power_On_Hours -O--CK 094 094 000 - 2694
10 Spin_Retry_Count PO--CK 132 100 030 - 0
12 Power_Cycle_Count -O--CK 100 100 000 - 1624
191 G-Sense_Error_Rate -O--CK 100 100 000 - 21
192 Power-Off_Retract_Count -O--CK 099 099 000 - 918474
193 Load_Cycle_Count -O--CK 095 095 000 - 54225
194 Temperature_Celsius -O---K 100 100 000 - 35 (Min/Max 8/46)
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 200 200 000 - 0
220 Disk_Shift -O---- 100 100 000 - 0
222 Loaded_Hours -O--CK 100 100 000 - 158
223 Load_Retry_Count -O--CK 100 100 000 - 0
224 Load_Friction -O---K 100 100 000 - 0
226 Load-in_Time -OS--K 100 100 000 - 262
240 Head_Flying_Hours P----- 100 100 001 - 0
254 Free_Fall_Sensor -O--CK 100 100 000 - 14
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 64 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xb7 GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (64 sectors)
Device Error Count: 1
CR = Command Register
FEATR = Features Register
COUNT = Count (was: Sector Count) Register
LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
LH = LBA High (was: Cylinder High) Register ] LBA
LM = LBA Mid (was: Cylinder Low) Register ] Register
LL = LBA Low (was: Sector Number) Register ]
DV = Device (was: Device/Head) Register
DC = Device Control Register
ER = Error register
ST = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 [0] occurred at disk power-on lifetime: 1 hours (0 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER -- ST COUNT LBA_48 LH LM LL DV DC
-- -- -- == -- == == == -- -- -- -- --
40 -- 01 00 98 00 00 02 fe 3a 57 40 00 Error: WP at LBA = 0x02fe3a57 = 50215511
Commands leading to the command that caused the error were:
CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
-- == -- == -- == == == -- -- -- -- -- --------------- --------------------
61 00 08 00 80 00 00 02 49 be 70 40 00 01:07:34.146 WRITE FPDMA QUEUED
61 00 08 00 78 00 00 02 fc b4 60 40 00 01:07:34.146 WRITE FPDMA QUEUED
61 00 08 00 00 00 00 02 1c 92 58 40 00 01:07:34.146 WRITE FPDMA QUEUED
61 00 08 00 70 00 00 02 2e 40 28 40 00 01:07:34.144 WRITE FPDMA QUEUED
61 00 08 00 68 00 00 00 a5 dd d8 40 00 01:07:34.143 WRITE FPDMA QUEUED
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 2
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 35 Celsius
Power Cycle Min/Max Temperature: 34/37 Celsius
Lifetime Min/Max Temperature: 8/46 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 5/55 Celsius
Min/Max Temperature Limit: 5/55 Celsius
Temperature History Size (Index): 478 (50)
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 2) ==
0x01 0x008 4 1624 --- Lifetime Power-On Resets
0x01 0x010 4 2694 --- Power-on Hours
0x01 0x018 6 6122294846 --- Logical Sectors Written
0x01 0x020 6 56871743 --- Number of Write Commands
0x01 0x028 6 8019957147 --- Logical Sectors Read
0x01 0x030 6 69353429 --- Number of Read Commands
0x02 ===== = = === == Free-Fall Statistics (rev 1) ==
0x02 0x010 4 21 --- Overlimit Shock Events
0x03 ===== = = === == Rotating Media Statistics (rev 1) ==
0x03 0x008 4 2686 --- Spindle Motor Power-on Hours
0x03 0x010 4 158 --- Head Flying Hours
0x03 0x018 4 54225 --- Head Load Events
0x03 0x020 4 0 --- Number of Reallocated Logical Sectors
0x03 0x028 4 0 --- Read Recovery Attempts
0x03 0x030 4 0 --- Number of Mechanical Start Failures
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 35 --- Current Temperature
0x05 0x010 1 34 N-- Average Short Term Temperature
0x05 0x018 1 30 N-- Average Long Term Temperature
0x05 0x020 1 46 --- Highest Temperature
0x05 0x028 1 8 --- Lowest Temperature
0x05 0x030 1 38 N-- Highest Average Short Term Temperature
0x05 0x038 1 24 N-- Lowest Average Short Term Temperature
0x05 0x040 1 35 N-- Highest Average Long Term Temperature
0x05 0x048 1 29 N-- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 55 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 5 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 3879 --- Number of Hardware Resets
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 4 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x0002 4 0 R_ERR response for data FIS
0x0003 4 0 R_ERR response for device-to-host data FIS
0x0004 4 0 R_ERR response for host-to-device data FIS
0x0005 4 0 R_ERR response for non-data FIS
0x0006 4 0 R_ERR response for device-to-host non-data FIS
0x0007 4 0 R_ERR response for host-to-device non-data FIS
0x0008 4 0 Device-to-host non-data FIS retries
0x0009 4 4 Transition from drive PhyRdy to drive PhyNRdy
0x000a 4 3 Device-to-host register FISes sent due to a COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS
0x000f 4 0 R_ERR response for host-to-device data FIS, CRC
0x0010 4 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 4 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 4 0 R_ERR response for host-to-device non-data FIS, non-CRC
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