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smartctl 7.3 2022-02-28 r5338 [OpenBSD 7.2 amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA MQ01ACF032
Serial Number: --
LU WWN Device Id: 5 000039 ...
Firmware Version: AV001D
User Capacity: 320,072,933,376 bytes [320 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 2.5 inches
Device is: Not in smartctl database 7.3/5319
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Tue Jan 10 22:41:07 2023 CST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 69) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 128
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1884
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0
9 Power_On_Hours 0x0032 087 087 000 Old_age Always - 5597
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1357
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 574
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 267
193 Load_Cycle_Count 0x0032 094 094 000 Old_age Always - 61063
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 37 (Min/Max 14/77)
199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 211161602
200 Multi_Zone_Error_Rate 0x0032 100 100 000 Old_age Always - 348161601
240 Head_Flying_Hours 0x0032 088 088 000 Old_age Always - 5127
241 Total_LBAs_Written 0x0032 100 100 000 Old_age Always - 17533663256
242 Total_LBAs_Read 0x0032 100 100 000 Old_age Always - 31351719063
254 Free_Fall_Sensor 0x0032 100 100 000 Old_age Always - 100
SMART Error Log Version: 1
ATA Error Count: 3
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 3 occurred at disk power-on lifetime: 5045 hours (210 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 50 7f 19 a5 40 Error: ICRC, ABRT at LBA = 0x00a5197f = 10819967
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 60 80 1a a5 40 00 01:02:39.118 READ FPDMA QUEUED
60 00 58 80 19 a5 40 00 01:02:39.111 READ FPDMA QUEUED
60 00 50 80 15 a5 40 00 01:02:39.111 READ FPDMA QUEUED
60 00 48 80 10 a5 40 00 01:02:39.111 READ FPDMA QUEUED
60 80 40 00 10 a5 40 00 01:02:39.103 READ FPDMA QUEUED
Error 2 occurred at disk power-on lifetime: 4235 hours (176 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 20 40 39 27 e0 Error: UNC 32 sectors at LBA = 0x00273940 = 2570560
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 40 20 39 27 e0 00 01:26:20.115 READ DMA EXT
25 00 40 e0 38 27 e0 00 01:26:20.115 READ DMA EXT
25 00 40 a0 38 27 e0 00 01:26:20.115 READ DMA EXT
25 00 40 60 38 27 e0 00 01:26:20.114 READ DMA EXT
25 00 40 20 38 27 e0 00 01:26:20.114 READ DMA EXT
Error 1 occurred at disk power-on lifetime: 4155 hours (173 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 30 f8 2a 27 e0 Error: UNC 48 sectors at LBA = 0x00272af8 = 2566904
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 36 f2 2a 27 e0 00 20:09:42.684 READ DMA EXT
25 00 35 bd 2a 27 e0 00 20:09:42.684 READ DMA EXT
25 00 35 88 2a 27 e0 00 20:09:42.684 READ DMA EXT
25 00 30 58 2a 27 e0 00 20:09:42.683 READ DMA EXT
25 00 30 28 2a 27 e0 00 20:09:42.683 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 4874 -
# 2 Short offline Completed without error 00% 4850 -
# 3 Extended offline Interrupted (host reset) 90% 4574 -
# 4 Short offline Completed without error 00% 4572 -
# 5 Short offline Completed without error 00% 4569 -
# 6 Short offline Completed without error 00% 4554 -
# 7 Short offline Completed without error 00% 4552 -
# 8 Short offline Completed without error 00% 4549 -
# 9 Short offline Completed without error 00% 4548 -
#10 Short offline Completed without error 00% 4546 -
#11 Short offline Completed without error 00% 4535 -
#12 Short offline Completed without error 00% 4532 -
#13 Short offline Completed without error 00% 4530 -
#14 Short offline Aborted by host 90% 4526 -
#15 Short offline Completed without error 00% 4524 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.