mirror of
https://github.com/bsdhw/SMART.git
synced 2025-05-31 16:21:41 +05:30
172 lines
7.9 KiB
Plaintext
172 lines
7.9 KiB
Plaintext
smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.1-RELEASE-p6 amd64] (local build)
|
|
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
|
|
|
|
=== START OF INFORMATION SECTION ===
|
|
Device Model: 32GB SATA Flash Drive
|
|
Serial Number: --
|
|
LU WWN Device Id: 5 dc663a ...
|
|
Firmware Version: SFDM1B3B
|
|
User Capacity: 32,017,047,552 bytes [32.0 GB]
|
|
Sector Size: 512 bytes logical/physical
|
|
Rotation Rate: Solid State Device
|
|
Form Factor: < 1.8 inches
|
|
TRIM Command: Available
|
|
Device is: Not in smartctl database 7.3/5528
|
|
ATA Version is: ACS-2 (minor revision not indicated)
|
|
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
|
|
Local Time is: Wed Dec 11 15:15:20 2024 UTC
|
|
SMART support is: Available - device has SMART capability.
|
|
SMART support is: Enabled
|
|
AAM feature is: Unavailable
|
|
APM level is: 254 (maximum performance)
|
|
Rd look-ahead is: Enabled
|
|
Write cache is: Enabled
|
|
DSN feature is: Unavailable
|
|
ATA Security is: Disabled, frozen [SEC2]
|
|
Unexpected SCT status 0x0000 (action_code=0, function_code=0)
|
|
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
|
|
|
|
=== START OF READ SMART DATA SECTION ===
|
|
SMART overall-health self-assessment test result: PASSED
|
|
|
|
General SMART Values:
|
|
Offline data collection status: (0x00) Offline data collection activity
|
|
was never started.
|
|
Auto Offline Data Collection: Disabled.
|
|
Self-test execution status: ( 32) The self-test routine was interrupted
|
|
by the host with a hard or soft reset.
|
|
Total time to complete Offline
|
|
data collection: ( 32) seconds.
|
|
Offline data collection
|
|
capabilities: (0x5b) SMART execute Offline immediate.
|
|
Auto Offline data collection on/off support.
|
|
Suspend Offline collection upon new
|
|
command.
|
|
Offline surface scan supported.
|
|
Self-test supported.
|
|
No Conveyance Self-test supported.
|
|
Selective Self-test supported.
|
|
SMART capabilities: (0x0003) Saves SMART data before entering
|
|
power-saving mode.
|
|
Supports SMART auto save timer.
|
|
Error logging capability: (0x01) Error logging supported.
|
|
General Purpose Logging supported.
|
|
Short self-test routine
|
|
recommended polling time: ( 2) minutes.
|
|
Extended self-test routine
|
|
recommended polling time: ( 12) minutes.
|
|
SCT capabilities: (0x003d) SCT Status supported.
|
|
SCT Error Recovery Control supported.
|
|
SCT Feature Control supported.
|
|
SCT Data Table supported.
|
|
|
|
SMART Attributes Data Structure revision number: 16
|
|
Vendor Specific SMART Attributes with Thresholds:
|
|
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
|
5 Reallocated_Sector_Ct -O--CK 100 100 000 - 0
|
|
9 Power_On_Hours -O--CK 100 100 000 - 32184
|
|
12 Power_Cycle_Count -O--CK 100 100 000 - 281
|
|
175 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
|
|
176 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
|
|
177 Wear_Leveling_Count -O--CK 100 100 000 - 11075898
|
|
178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 000 - 0
|
|
179 Used_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 0
|
|
180 Unused_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 216
|
|
181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 0
|
|
182 Erase_Fail_Count_Total -O--CK 100 100 000 - 0
|
|
187 Reported_Uncorrect -O--CK 100 100 000 - 0
|
|
194 Temperature_Celsius -O---K 060 060 030 - 40 (Min/Max 30/60)
|
|
195 Hardware_ECC_Recovered POSR-K 100 100 050 - 0
|
|
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
|
|
238 Unknown_Attribute -O---K 095 095 000 - 196608169
|
|
241 Total_LBAs_Written -O--CK 100 100 000 - 802320411
|
|
242 Total_LBAs_Read -O--CK 100 100 000 - 4033737084
|
|
||||||_ K auto-keep
|
|
|||||__ C event count
|
|
||||___ R error rate
|
|
|||____ S speed/performance
|
|
||_____ O updated online
|
|
|______ P prefailure warning
|
|
|
|
General Purpose Log Directory Version 1
|
|
SMART Log Directory Version 1 [multi-sector log support]
|
|
Address Access R/W Size Description
|
|
0x00 GPL,SL R/O 1 Log Directory
|
|
0x01 SL R/O 1 Summary SMART error log
|
|
0x02 SL R/O 51 Comprehensive SMART error log
|
|
0x03 GPL R/O 64 Ext. Comprehensive SMART error log
|
|
0x04 GPL,SL R/O 8 Device Statistics log
|
|
0x06 SL R/O 1 SMART self-test log
|
|
0x07 GPL R/O 1 Extended self-test log
|
|
0x09 SL R/W 1 Selective self-test log
|
|
0x10 GPL R/O 1 NCQ Command Error log
|
|
0x11 GPL R/O 1 SATA Phy Event Counters log
|
|
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
|
|
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
|
|
0xe0 GPL,SL R/W 1 SCT Command/Status
|
|
0xe1 GPL,SL R/W 1 SCT Data Transfer
|
|
|
|
SMART Extended Comprehensive Error Log Version: 1 (64 sectors)
|
|
No Errors Logged
|
|
|
|
SMART Extended Self-test Log Version: 1 (1 sectors)
|
|
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
|
|
# 1 Short offline Interrupted (host reset) 00% 1 -
|
|
|
|
SMART Selective self-test log data structure revision number 1
|
|
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
|
1 0 0 Not_testing
|
|
2 0 0 Not_testing
|
|
3 0 0 Not_testing
|
|
4 0 0 Not_testing
|
|
5 0 0 Not_testing
|
|
Selective self-test flags (0x0):
|
|
After scanning selected spans, do NOT read-scan remainder of disk.
|
|
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
|
|
|
SCT Status Version: 3
|
|
SCT Version (vendor specific): 1 (0x0001)
|
|
Device State: Active (0)
|
|
Current Temperature: 0 Celsius
|
|
Power Cycle Min/Max Temperature: --/ 0 Celsius
|
|
Lifetime Min/Max Temperature: --/ 0 Celsius
|
|
|
|
Unexpected SCT status 0x0000 (action_code=0, function_code=0)
|
|
Read SCT Temperature History failed
|
|
|
|
Unexpected SCT status 0x0000 (action_code=0, function_code=0)
|
|
SCT (Get) Error Recovery Control command failed
|
|
|
|
Device Statistics (GP Log 0x04)
|
|
Page Offset Size Value Flags Description
|
|
0x01 ===== = = === == General Statistics (rev 2) ==
|
|
0x01 0x008 4 281 --- Lifetime Power-On Resets
|
|
0x01 0x018 6 801355947 --- Logical Sectors Written
|
|
0x01 0x020 6 17951482 --- Number of Write Commands
|
|
0x01 0x028 6 4033704420 --- Logical Sectors Read
|
|
0x01 0x030 6 78637310 --- Number of Read Commands
|
|
0x01 0x038 6 115862400000 --- Date and Time TimeStamp
|
|
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
|
|
0x07 0x008 1 12 N-- Percentage Used Endurance Indicator
|
|
|||_ C monitored condition met
|
|
||__ D supports DSN
|
|
|___ N normalized value
|
|
|
|
Pending Defects log (GP Log 0x0c) not supported
|
|
|
|
SATA Phy Event Counters (GP Log 0x11)
|
|
ID Size Value Description
|
|
0x0001 2 0 Command failed due to ICRC error
|
|
0x0003 2 0 R_ERR response for device-to-host data FIS
|
|
0x0004 2 0 R_ERR response for host-to-device data FIS
|
|
0x0006 2 0 R_ERR response for device-to-host non-data FIS
|
|
0x0007 2 0 R_ERR response for host-to-device non-data FIS
|
|
0x0008 2 0 Device-to-host non-data FIS retries
|
|
0x0009 4 0 Transition from drive PhyRdy to drive PhyNRdy
|
|
0x000a 4 11 Device-to-host register FISes sent due to a COMRESET
|
|
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
|
|
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
|
|
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
|
|
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
|
|
|