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https://github.com/bsdhw/SMART.git
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209 lines
10 KiB
Plaintext
209 lines
10 KiB
Plaintext
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p2 amd64] (local build)
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Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Family: Crucial/Micron RealSSD m4/C400/P400
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Device Model: M4-CT064M4SSD3
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Serial Number: --
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LU WWN Device Id: 5 00a075 ...
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Firmware Version: 07MH
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User Capacity: 64,023,257,088 bytes [64.0 GB]
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Sector Size: 512 bytes logical/physical
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Rotation Rate: Solid State Device
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Form Factor: < 1.8 inches
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TRIM Command: Available, deterministic
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Device is: In smartctl database 7.3/5319
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ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 6
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SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
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Local Time is: Sun Oct 30 11:54:35 2022 EET
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Unavailable
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APM level is: 254 (maximum performance)
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Rd look-ahead is: Enabled
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Write cache is: Enabled
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DSN feature is: Unavailable
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ATA Security is: Disabled, frozen [SEC2]
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Wt Cache Reorder: Enabled
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x80) Offline data collection activity
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was never started.
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Auto Offline Data Collection: Enabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 295) seconds.
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Offline data collection
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capabilities: (0x7b) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 4) minutes.
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Conveyance self-test routine
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recommended polling time: ( 3) minutes.
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SCT capabilities: (0x003d) SCT Status supported.
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SCT Error Recovery Control supported.
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SCT Feature Control supported.
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SCT Data Table supported.
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SMART Attributes Data Structure revision number: 16
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
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5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
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9 Power_On_Hours -O--CK 100 100 001 - 67276
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12 Power_Cycle_Count -O--CK 100 100 001 - 93
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170 Grown_Failing_Block_Ct PO--CK 100 100 010 - 0
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171 Program_Fail_Count -O--CK 100 100 001 - 0
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172 Erase_Fail_Count -O--CK 100 100 001 - 0
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173 Wear_Leveling_Count PO--CK 096 096 010 - 142
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174 Unexpect_Power_Loss_Ct -O--CK 100 100 001 - 41
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181 Non4k_Aligned_Access -O---K 100 100 001 - 5 0 5
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183 SATA_Iface_Downshift -O--CK 100 100 001 - 0
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184 End-to-End_Error PO--CK 100 100 050 - 0
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187 Reported_Uncorrect -O--CK 100 100 001 - 0
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188 Command_Timeout -O--CK 100 100 001 - 0
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189 Factory_Bad_Block_Ct -OSR-- 100 100 001 - 48
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194 Temperature_Celsius -O---K 100 100 000 - 0
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195 Hardware_ECC_Recovered -O-RCK 100 100 001 - 0
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196 Reallocated_Event_Count -O--CK 100 100 001 - 0
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197 Current_Pending_Sector -O--CK 100 100 001 - 0
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198 Offline_Uncorrectable ----CK 100 100 001 - 0
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199 UDMA_CRC_Error_Count -O--CK 100 100 001 - 0
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202 Perc_Rated_Life_Used ---RC- 096 096 001 - 4
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206 Write_Error_Rate -OSR-- 100 100 001 - 0
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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General Purpose Log Directory Version 1
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SMART Log Directory Version 1 [multi-sector log support]
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Address Access R/W Size Description
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0x00 GPL,SL R/O 1 Log Directory
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0x01 SL R/O 1 Summary SMART error log
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0x02 SL R/O 51 Comprehensive SMART error log
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0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
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0x04 GPL,SL R/O 255 Device Statistics log
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0x06 SL R/O 1 SMART self-test log
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0x07 GPL R/O 3449 Extended self-test log
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0x09 SL R/W 1 Selective self-test log
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0x10 GPL R/O 1 NCQ Command Error log
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0x11 GPL R/O 1 SATA Phy Event Counters log
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0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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0xa0 GPL VS 2000 Device vendor specific log
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0xa0 SL VS 208 Device vendor specific log
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0xa1-0xbf GPL,SL VS 1 Device vendor specific log
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0xc0 GPL VS 80 Device vendor specific log
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0xc1-0xdf GPL,SL VS 1 Device vendor specific log
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0xe0 GPL,SL R/W 1 SCT Command/Status
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0xe1 GPL,SL R/W 1 SCT Data Transfer
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SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
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No Errors Logged
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SMART Extended Self-test Log size 3449 not supported
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SMART Self-test log structure revision number 1
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Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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# 1 Vendor (0xff) Completed without error 00% 1645 -
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# 2 Short offline Completed without error 00% 1644 -
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# 3 Short offline Completed without error 00% 1095 -
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# 4 Extended offline Completed without error 00% 14112 -
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# 5 Extended offline Completed without error 00% 12262 -
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# 6 Offline Completed without error 00% 12262 -
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# 7 Short offline Completed without error 00% 12262 -
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# 8 Vendor (0xff) Completed without error 00% 1536 -
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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SCT Status Version: 3
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SCT Version (vendor specific): 1 (0x0001)
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Device State: Active (0)
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Current Temperature: 0 Celsius
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Power Cycle Min/Max Temperature: --/ 0 Celsius
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Lifetime Min/Max Temperature: --/ 0 Celsius
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SCT Temperature History Version: 2
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Temperature Sampling Period: 10 minutes
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Temperature Logging Interval: 10 minutes
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Min/Max recommended Temperature: 0/70 Celsius
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Min/Max Temperature Limit: -5/75 Celsius
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Temperature History Size (Index): 478 (93)
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SCT Error Recovery Control:
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Read: 40 (4.0 seconds)
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Write: 40 (4.0 seconds)
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Device Statistics (GP Log 0x04)
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Page Offset Size Value Flags Description
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0x01 ===== = = === == General Statistics (rev 2) ==
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0x01 0x008 4 93 --- Lifetime Power-On Resets
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0x01 0x010 4 67276 --- Power-on Hours
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0x01 0x018 6 17275569074 --- Logical Sectors Written
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0x01 0x020 6 307859231 --- Number of Write Commands
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0x01 0x028 6 775891497 --- Logical Sectors Read
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0x01 0x030 6 29984293 --- Number of Read Commands
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0x04 ===== = = === == General Errors Statistics (rev 1) ==
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0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
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0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
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0x05 ===== = = === == Temperature Statistics (rev 1) ==
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0x05 0x008 1 0 --- Current Temperature
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0x05 0x010 1 0 --- Average Short Term Temperature
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0x05 0x018 1 0 --- Average Long Term Temperature
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0x05 0x020 1 0 --- Highest Temperature
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0x05 0x028 1 0 --- Lowest Temperature
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0x05 0x030 1 0 --- Highest Average Short Term Temperature
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0x05 0x038 1 0 --- Lowest Average Short Term Temperature
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0x05 0x040 1 0 --- Highest Average Long Term Temperature
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0x05 0x048 1 0 --- Lowest Average Long Term Temperature
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0x05 0x050 4 - --- Time in Over-Temperature
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0x05 0x058 1 70 --- Specified Maximum Operating Temperature
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0x05 0x060 4 - --- Time in Under-Temperature
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0x05 0x068 1 0 --- Specified Minimum Operating Temperature
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0x06 ===== = = === == Transport Statistics (rev 1) ==
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0x06 0x008 4 0 --- Number of Hardware Resets
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0x06 0x010 4 0 --- Number of ASR Events
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0x06 0x018 4 0 --- Number of Interface CRC Errors
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0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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0x07 0x008 1 2 N-- Percentage Used Endurance Indicator
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|||_ C monitored condition met
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||__ D supports DSN
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|___ N normalized value
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Pending Defects log (GP Log 0x0c) not supported
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SATA Phy Event Counters (GP Log 0x11)
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ID Size Value Description
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0x0001 4 0 Command failed due to ICRC error
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0x000a 4 2 Device-to-host register FISes sent due to a COMRESET
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