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193 lines
8.9 KiB
Plaintext
193 lines
8.9 KiB
Plaintext
smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.1-RELEASE-p6 amd64] (local build)
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Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Device Model: VK0800GDJYA
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Serial Number: --
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LU WWN Device Id: 5 5cd2e4 ...
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Firmware Version: 4IWVHPG1
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User Capacity: 800,166,076,416 bytes [800 GB]
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Sector Size: 512 bytes logical/physical
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Rotation Rate: Solid State Device
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Form Factor: 2.5 inches
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TRIM Command: Available, deterministic, zeroed
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Device is: Not in smartctl database 7.3/5528
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ATA Version is: ATA8-ACS T13/1699-D revision 4
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SATA Version is: SATA 2.6, 6.0 Gb/s (current: 6.0 Gb/s)
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Local Time is: Thu Nov 7 11:16:11 2024 EST
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Unavailable
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APM feature is: Unavailable
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Rd look-ahead is: Enabled
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Write cache is: Enabled
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DSN feature is: Unavailable
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ATA Security is: Unavailable
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Wt Cache Reorder: Enabled
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x02) Offline data collection activity
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was completed without error.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 2) seconds.
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Offline data collection
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capabilities: (0x79) SMART execute Offline immediate.
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No Auto Offline data collection support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 1) minutes.
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Extended self-test routine
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recommended polling time: ( 2) minutes.
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Conveyance self-test routine
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recommended polling time: ( 2) minutes.
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SCT capabilities: (0x0039) SCT Status supported.
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SCT Error Recovery Control supported.
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SCT Feature Control supported.
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SCT Data Table supported.
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SMART Attributes Data Structure revision number: 1
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate POSR-- 130 130 039 - 12642742
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5 Reallocated_Sector_Ct PO--CK 096 096 001 - 0
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9 Power_On_Hours -O--CK 100 100 000 - 59839
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173 Unknown_Attribute PO--CK 077 077 001 - 0
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175 Program_Fail_Count_Chip PO--CK 100 100 010 - 1383415349903
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180 Unused_Rsvd_Blk_Cnt_Tot PO-RCK 130 130 039 - 720519102
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194 Temperature_Celsius -O---K 100 100 000 - 31
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196 Reallocated_Event_Count PO--CK 100 100 010 - 0
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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General Purpose Log Directory Version 1
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SMART Log Directory Version 1 [multi-sector log support]
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Address Access R/W Size Description
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0x00 GPL,SL R/O 1 Log Directory
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0x01 GPL,SL R/O 1 Summary SMART error log
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0x02 GPL,SL R/O 8 Comprehensive SMART error log
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0x03 GPL,SL R/O 20 Ext. Comprehensive SMART error log
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0x04 GPL,SL R/O 8 Device Statistics log
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0x06 GPL,SL R/O 1 SMART self-test log
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0x07 GPL,SL R/O 2 Extended self-test log
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0x09 GPL,SL R/W 1 Selective self-test log
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0x10 GPL,SL R/O 1 NCQ Command Error log
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0x11 GPL,SL R/O 1 SATA Phy Event Counters log
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0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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0xb0 GPL,SL VS 1 Device vendor specific log
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0xb1 GPL,SL VS 33 Device vendor specific log
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0xb5 GPL,SL VS 1 Device vendor specific log
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0xb6 GPL,SL VS 127 Device vendor specific log
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0xd0 GPL,SL VS 1 Device vendor specific log
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0xd1 GPL VS 13056 Device vendor specific log
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0xdf GPL VS 1152 Device vendor specific log
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0xdf SL VS 128 Device vendor specific log
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0xe0 GPL,SL R/W 1 SCT Command/Status
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0xe1 GPL,SL R/W 1 SCT Data Transfer
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SMART Extended Comprehensive Error Log Version: 1 (20 sectors)
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No Errors Logged
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SMART Extended Self-test Log Version: 1 (2 sectors)
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Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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# 1 Short offline Completed without error 00% 47680 -
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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SCT Status Version: 3
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SCT Version (vendor specific): 1 (0x0001)
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Device State: Active (0)
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Current Temperature: 31 Celsius
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Power Cycle Min/Max Temperature: 19/32 Celsius
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Lifetime Min/Max Temperature: 9/33 Celsius
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Specified Max Operating Temperature: 55 Celsius
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Under/Over Temperature Limit Count: 0/0
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SCT Temperature History Version: 2
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Temperature Sampling Period: 1 minute
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Temperature Logging Interval: 1 minute
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Min/Max recommended Temperature: 0/55 Celsius
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Min/Max Temperature Limit: 0/55 Celsius
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Temperature History Size (Index): 478 (386)
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SCT Error Recovery Control:
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Read: Disabled
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Write: Disabled
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Device Statistics (GP Log 0x04)
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Page Offset Size Value Flags Description
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0x01 ===== = = === == General Statistics (rev 1) ==
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0x01 0x008 4 186 --- Lifetime Power-On Resets
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0x01 0x018 6 454604670816 --- Logical Sectors Written
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0x01 0x020 6 11400999069 --- Number of Write Commands
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0x01 0x028 6 254716508339 --- Logical Sectors Read
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0x01 0x030 6 11759408035 --- Number of Read Commands
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0x04 ===== = = === == General Errors Statistics (rev 1) ==
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0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
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0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
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0x05 ===== = = === == Temperature Statistics (rev 1) ==
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0x05 0x008 1 31 --- Current Temperature
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0x05 0x010 1 31 --- Average Short Term Temperature
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0x05 0x018 1 25 --- Average Long Term Temperature
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0x05 0x020 1 32 --- Highest Temperature
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0x05 0x028 1 12 --- Lowest Temperature
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0x05 0x030 1 31 --- Highest Average Short Term Temperature
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0x05 0x038 1 12 --- Lowest Average Short Term Temperature
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0x05 0x040 1 25 --- Highest Average Long Term Temperature
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0x05 0x048 1 12 --- Lowest Average Long Term Temperature
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0x05 0x050 4 0 --- Time in Over-Temperature
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0x05 0x058 1 55 --- Specified Maximum Operating Temperature
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0x05 0x060 4 0 --- Time in Under-Temperature
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0x05 0x068 1 0 --- Specified Minimum Operating Temperature
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0x06 ===== = = === == Transport Statistics (rev 1) ==
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0x06 0x008 4 116073 --- Number of Hardware Resets
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0x06 0x010 4 686 --- Number of ASR Events
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0x06 0x018 4 0 --- Number of Interface CRC Errors
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0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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0x07 0x008 1 23 --- Percentage Used Endurance Indicator
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|||_ C monitored condition met
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||__ D supports DSN
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|___ N normalized value
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Pending Defects log (GP Log 0x0c) not supported
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SATA Phy Event Counters (GP Log 0x11)
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ID Size Value Description
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0x0001 4 0 Command failed due to ICRC error
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0x0003 4 0 R_ERR response for device-to-host data FIS
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0x0004 4 0 R_ERR response for host-to-device data FIS
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0x0006 4 0 R_ERR response for device-to-host non-data FIS
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0x000a 4 19 Device-to-host register FISes sent due to a COMRESET
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0x000b 4 0 CRC errors within host-to-device FIS
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0x000d 4 0 Non-CRC errors within host-to-device FIS
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