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smartctl 7.4 2023-08-01 r5530 [OpenBSD 7.5 amd64] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: LITEONIT LCS-256M6S 2.5 7mm 256GB
Serial Number: --
Firmware Version: DC8110D
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database 7.3/5528
ATA Version is: ATA8-ACS, ATA/ATAPI-7 T13/1532D revision 4a
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Sep 17 15:36:07 2024 CDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 10) seconds.
Offline data collection
capabilities: (0x15) SMART execute Offline immediate.
No Auto Offline data collection support.
Abort Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x00) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0003 100 100 000 Pre-fail Always - 0
12 Power_Cycle_Count 0x0003 100 100 000 Pre-fail Always - 21802
175 Program_Fail_Count_Chip 0x0003 100 100 000 Pre-fail Always - 0
176 Erase_Fail_Count_Chip 0x0003 100 100 000 Pre-fail Always - 0
177 Wear_Leveling_Count 0x0003 100 100 000 Pre-fail Always - 226680
178 Used_Rsvd_Blk_Cnt_Chip 0x0003 100 100 000 Pre-fail Always - 0
179 Used_Rsvd_Blk_Cnt_Tot 0x0003 100 100 000 Pre-fail Always - 0
180 Unused_Rsvd_Blk_Cnt_Tot 0x0003 100 100 005 Pre-fail Always - 1312
181 Program_Fail_Cnt_Total 0x0003 100 100 000 Pre-fail Always - 0
182 Erase_Fail_Count_Total 0x0003 100 100 000 Pre-fail Always - 0
187 Reported_Uncorrect 0x0003 100 100 000 Pre-fail Always - 0
195 Hardware_ECC_Recovered 0x0003 100 100 000 Pre-fail Always - 0
241 Total_LBAs_Written 0x0003 100 100 000 Pre-fail Always - 958066
242 Total_LBAs_Read 0x0003 100 100 000 Pre-fail Always - 308836
SMART Error Log Version: 0
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Selective Self-tests/Logging not supported
The above only provides legacy SMART information - try 'smartctl -x' for more