mirror of
https://github.com/bsdhw/SMART.git
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206 lines
9.7 KiB
Plaintext
206 lines
9.7 KiB
Plaintext
smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.1-RELEASE-p5 amd64] (local build)
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Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Family: Samsung based SSDs
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Device Model: SAMSUNG MZ7LN256HAJQ-000H1
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Serial Number: --
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LU WWN Device Id: 5 002538 ...
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Firmware Version: MVT03H3Q
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User Capacity: 256,060,514,304 bytes [256 GB]
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Sector Sizes: 512 bytes logical, 4096 bytes physical
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Rotation Rate: Solid State Device
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Form Factor: 2.5 inches
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TRIM Command: Available, deterministic, zeroed
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Device is: In smartctl database 7.3/5528
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ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 4c
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SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
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Local Time is: Sun Oct 13 22:11:12 2024 EEST
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Unavailable
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APM feature is: Disabled
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Rd look-ahead is: Enabled
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Write cache is: Enabled
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DSN feature is: Disabled
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ATA Security is: Disabled, NOT FROZEN [SEC1]
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Wt Cache Reorder: Enabled
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x02) Offline data collection activity
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was completed without error.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 5100) seconds.
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Offline data collection
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capabilities: (0x5b) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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No Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 85) minutes.
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SCT capabilities: (0x003d) SCT Status supported.
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SCT Error Recovery Control supported.
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SCT Feature Control supported.
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SCT Data Table supported.
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SMART Attributes Data Structure revision number: 1
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
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5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0
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9 Power_On_Hours -O--CK 100 100 000 - 45472
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12 Power_Cycle_Count -O--CK 100 100 000 - 101
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171 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
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172 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
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173 Wear_Leveling_Count -O--CK 095 095 005 - 54
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174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 69
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176 Erase_Fail_Count_Chip -O---K 100 100 000 - 630
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181 Program_Fail_Cnt_Total -O---K 097 001 000 - 4226263
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183 Runtime_Bad_Block -O--CK 100 100 000 - 0
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184 End-to-End_Error PO-RCK 100 100 097 - 0
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187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
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188 Command_Timeout -O--CK 100 100 000 - 0
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194 Temperature_Celsius -O---K 043 051 000 - 43 (Min/Max 40/46)
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198 Offline_Uncorrectable ----CK 100 100 000 - 0
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199 CRC_Error_Count -O--CK 100 100 000 - 0
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201 Supercap_Status PO---K 100 100 005 - 100
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241 Total_LBAs_Written -O--CK 100 100 000 - 1090963
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242 Total_LBAs_Read -O--CK 100 100 000 - 1101600
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243 SATA_Downshift_Ct -O--CK 100 100 000 - 1090963
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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General Purpose Log Directory Version 1
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SMART Log Directory Version 1 [multi-sector log support]
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Address Access R/W Size Description
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0x00 GPL,SL R/O 1 Log Directory
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0x01 SL R/O 1 Summary SMART error log
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0x02 SL R/O 1 Comprehensive SMART error log
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0x03 GPL R/O 1 Ext. Comprehensive SMART error log
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0x04 GPL,SL R/O 8 Device Statistics log
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0x06 SL R/O 1 SMART self-test log
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0x07 GPL R/O 1 Extended self-test log
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0x09 SL R/W 1 Selective self-test log
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0x0a GPL R/W 1 Device Statistics Notification
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0x0c GPL R/O 1 Pending Defects log
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0x0d GPL,SL R/O 1 LPS Mis-alignment log
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0x10 GPL R/O 1 NCQ Command Error log
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0x11 GPL R/O 1 SATA Phy Event Counters log
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0x13 GPL R/O 1 SATA NCQ Send and Receive log
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0x19 GPL R/O 8 LBA Status log
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0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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0xce SL VS 16 Device vendor specific log
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0xe0 GPL,SL R/W 1 SCT Command/Status
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0xe1 GPL,SL R/W 1 SCT Data Transfer
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SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
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No Errors Logged
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SMART Extended Self-test Log Version: 1 (1 sectors)
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Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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# 1 Short offline Completed without error 00% 0 -
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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255 0 65535 Read_scanning was completed without error
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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SCT Status Version: 3
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SCT Version (vendor specific): 256 (0x0100)
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Device State: Active (0)
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Current Temperature: ? Celsius
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Power Cycle Min/Max Temperature: 44/44 Celsius
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Lifetime Min/Max Temperature: 24/49 Celsius
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Under/Over Temperature Limit Count: 0/0
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SCT Temperature History Version: 2
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Temperature Sampling Period: 1 minute
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Temperature Logging Interval: 10 minutes
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Min/Max recommended Temperature: 0/70 Celsius
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Min/Max Temperature Limit: 0/70 Celsius
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Temperature History Size (Index): 128 (21)
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SCT Error Recovery Control:
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Read: Disabled
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Write: Disabled
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Device Statistics (GP Log 0x04)
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Page Offset Size Value Flags Description
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0x01 ===== = = === == General Statistics (rev 1) ==
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0x01 0x008 4 101 -D- Lifetime Power-On Resets
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0x01 0x010 4 45472 -D- Power-on Hours
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0x01 0x018 6 35748699966 -D- Logical Sectors Written
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0x01 0x020 6 1182898317 -D- Number of Write Commands
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0x01 0x028 6 36097239794 -D- Logical Sectors Read
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0x01 0x030 6 523644912 -D- Number of Read Commands
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0x04 ===== = = === == General Errors Statistics (rev 1) ==
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0x04 0x008 4 0 -D- Number of Reported Uncorrectable Errors
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0x04 0x010 4 0 -D- Resets Between Cmd Acceptance and Completion
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0x05 ===== = = === == Temperature Statistics (rev 1) ==
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0x05 0x008 1 -128 -D- Current Temperature
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0x05 0x020 1 49 -D- Highest Temperature
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0x05 0x028 1 24 -D- Lowest Temperature
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0x05 0x058 1 55 -D- Specified Maximum Operating Temperature
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0x06 ===== = = === == Transport Statistics (rev 1) ==
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0x06 0x008 4 480 -D- Number of Hardware Resets
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0x06 0x010 4 0 -D- Number of ASR Events
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0x06 0x018 4 0 -D- Number of Interface CRC Errors
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0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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0x07 0x008 1 4 ND- Percentage Used Endurance Indicator
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|||_ C monitored condition met
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||__ D supports DSN
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|___ N normalized value
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Pending Defects log (GP Log 0x0c)
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No Defects Logged
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SATA Phy Event Counters (GP Log 0x11)
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ID Size Value Description
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0x0001 2 0 Command failed due to ICRC error
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0x0002 2 0 R_ERR response for data FIS
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0x0003 2 0 R_ERR response for device-to-host data FIS
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0x0004 2 0 R_ERR response for host-to-device data FIS
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0x0005 2 0 R_ERR response for non-data FIS
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0x0006 2 0 R_ERR response for device-to-host non-data FIS
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0x0007 2 0 R_ERR response for host-to-device non-data FIS
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0x0008 2 0 Device-to-host non-data FIS retries
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0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
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0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
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0x000b 2 0 CRC errors within host-to-device FIS
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0x000d 2 0 Non-CRC errors within host-to-device FIS
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0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
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0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
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0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
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0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
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