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https://github.com/bsdhw/SMART.git
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148 lines
6.8 KiB
Plaintext
148 lines
6.8 KiB
Plaintext
smartctl 7.2 2021-09-14 r5236 [FreeBSD 13.0-STABLE amd64] (local build)
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Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Device Model: SAMSUNG MZMPA024HMCD-000L1
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Serial Number: --
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Firmware Version: AXM22L1Q
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User Capacity: 24,015,495,168 bytes [24.0 GB]
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Sector Size: 512 bytes logical/physical
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Rotation Rate: Solid State Device
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TRIM Command: Available
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Device is: Not in smartctl database [for details use: -P showall]
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ATA Version is: ATA8-ACS, ATA/ATAPI-7 T13/1532D revision 1
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SATA Version is: SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s)
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Local Time is: Sun Nov 28 15:18:44 2021 PST
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Unavailable
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APM feature is: Unavailable
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Rd look-ahead is: Enabled
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Write cache is: Enabled
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DSN feature is: Unavailable
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ATA Security is: Disabled, frozen [SEC2]
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Wt Cache Reorder: Unavailable
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x00) Offline data collection activity
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was never started.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 120) seconds.
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Offline data collection
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capabilities: (0x5b) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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No Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 2) minutes.
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SMART Attributes Data Structure revision number: 1
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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9 Power_On_Hours -O--CK 099 099 --- - 1951
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12 Power_Cycle_Count -O--CK 098 098 --- - 1544
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175 Program_Fail_Count_Chip -O--CK 100 100 --- - 0
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176 Erase_Fail_Count_Chip -O--CK 100 100 --- - 0
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177 Wear_Leveling_Count PO--C- 099 099 --- - 16
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178 Used_Rsvd_Blk_Cnt_Chip PO--C- 083 083 --- - 62
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179 Used_Rsvd_Blk_Cnt_Tot PO--C- 085 085 --- - 108
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180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 085 085 --- - 648
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181 Program_Fail_Cnt_Total -O--CK 100 100 --- - 0
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182 Erase_Fail_Count_Total -O--CK 100 100 --- - 0
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183 Runtime_Bad_Block PO--C- 100 100 --- - 0
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187 Reported_Uncorrect -O--CK 100 100 --- - 0
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190 Airflow_Temperature_Cel -O---K 062 057 --- - 38
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195 Hardware_ECC_Recovered -O-RC- 200 200 --- - 0
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198 Offline_Uncorrectable ----CK 100 100 --- - 0
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199 UDMA_CRC_Error_Count -OSRCK 253 253 --- - 0
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233 Media_Wearout_Indicator -O-RCK 199 199 --- - 5
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234 Unknown_Attribute -O--C- 100 100 --- - 0
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235 Unknown_Attribute -O--C- 099 099 --- - 48
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236 Unknown_Attribute -O--C- 099 099 --- - 34
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237 Unknown_Attribute -O--C- 099 099 --- - 176
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238 Unknown_Attribute -O--C- 099 099 --- - 108
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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General Purpose Log Directory Version 1
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SMART Log Directory Version 0
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Address Access R/W Size Description
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0x00 GPL,SL R/O 1 Log Directory
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0x01 GPL,SL R/O 1 Summary SMART error log
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0x02 GPL,SL R/O 1 Comprehensive SMART error log
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0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log
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0x06 GPL,SL R/O 1 SMART self-test log
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0x07 GPL,SL R/O 1 Extended self-test log
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0x09 GPL,SL R/W 1 Selective self-test log
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0x10 GPL,SL R/O 1 NCQ Command Error log
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0x11 GPL,SL R/O 1 SATA Phy Event Counters log
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0x80-0x9f GPL,SL R/W 1 Host vendor specific log
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SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
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No Errors Logged
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Warning! SMART Extended Self-test Log Structure error: invalid SMART checksum.
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SMART Extended Self-test Log Version: 1 (1 sectors)
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Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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# 1 Short offline Completed without error 00% 87 -
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# 2 Short offline Completed without error 00% 5 -
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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SCT Commands not supported
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Device Statistics (GP/SMART Log 0x04) not supported
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Pending Defects log (GP Log 0x0c) not supported
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SATA Phy Event Counters (GP Log 0x11)
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ID Size Value Description
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0x0001 2 0 Command failed due to ICRC error
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0x0002 2 0 R_ERR response for data FIS
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0x0003 2 0 R_ERR response for device-to-host data FIS
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0x0004 2 0 R_ERR response for host-to-device data FIS
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0x0005 2 0 R_ERR response for non-data FIS
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0x0006 2 0 R_ERR response for device-to-host non-data FIS
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0x0007 2 0 R_ERR response for host-to-device non-data FIS
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0x0008 2 0 Device-to-host non-data FIS retries
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0x0009 2 11 Transition from drive PhyRdy to drive PhyNRdy
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0x000a 2 8 Device-to-host register FISes sent due to a COMRESET
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0x000b 2 0 CRC errors within host-to-device FIS
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0x000d 2 0 Non-CRC errors within host-to-device FIS
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0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
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0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
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0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
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0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
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