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smartctl 7.2 2020-12-30 r5155 [FreeBSD 13.0-RELEASE-p4 amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZMPC128HBFU-000L1
Serial Number: --
Firmware Version: CXM13L1Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Nov 1 08:40:58 2021 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 540) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 9) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
9 Power_On_Hours -O--CK 099 099 000 - 2127
12 Power_Cycle_Count -O--CK 099 099 000 - 355
175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
177 Wear_Leveling_Count PO--C- 094 094 017 - 207
178 Used_Rsvd_Blk_Cnt_Chip PO--C- 094 094 010 - 88
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 095 095 010 - 142
180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 095 095 010 - 3122
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
184 End-to-End_Error PO--CK 100 100 097 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 059 048 000 - 41
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 253 253 000 - 0
233 Media_Wearout_Indicator -O-RCK 198 198 000 - 973
234 Unknown_Attribute -O--C- 100 100 000 - 0
235 Unknown_Attribute -O--C- 099 099 000 - 25
236 Unknown_Attribute -O--C- 099 099 000 - 53
237 Unknown_Attribute -O--C- 099 099 000 - 207
238 Unknown_Attribute -O--C- 099 099 000 - 142
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x02 GPL,SL R/O 2 Comprehensive SMART error log
0x03 GPL,SL R/O 2 Ext. Comprehensive SMART error log
0x06 GPL,SL R/O 1 SMART self-test log
0x07 GPL,SL R/O 2 Extended self-test log
0x09 GPL,SL R/W 1 Selective self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 2 49152 R_ERR response for data FIS
0x0003 2 53248 R_ERR response for device-to-host data FIS
0x0004 2 57344 R_ERR response for host-to-device data FIS
0x0005 2 7952 R_ERR response for non-data FIS
0x0006 2 2562 R_ERR response for device-to-host non-data FIS
0x0007 2 4096 R_ERR response for host-to-device non-data FIS
0x0008 2 7952 Device-to-host non-data FIS retries
0x0009 2 7953 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 400 Device-to-host register FISes sent due to a COMRESET
0x000b 2 6145 CRC errors within host-to-device FIS
0x000d 2 7953 Non-CRC errors within host-to-device FIS
0x000f 2 8176 R_ERR response for host-to-device data FIS, CRC
0x0010 2 15 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 49153 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 12112 R_ERR response for host-to-device non-data FIS, non-CRC