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https://github.com/bsdhw/SMART.git
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96 lines
4.3 KiB
Plaintext
96 lines
4.3 KiB
Plaintext
smartctl 7.3 2022-02-28 r5338 [OpenBSD 7.1 amd64] (local build)
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Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Family: Samsung based SSDs
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Device Model: Samsung SSD 860 EVO 250GB
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Serial Number: --
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LU WWN Device Id: 5 002538 ...
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Firmware Version: RVT02B6Q
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User Capacity: 250,059,350,016 bytes [250 GB]
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Sector Size: 512 bytes logical/physical
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Rotation Rate: Solid State Device
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Form Factor: 2.5 inches
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TRIM Command: Available, deterministic, zeroed
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Device is: In smartctl database 7.3/5319
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ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
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SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
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Local Time is: Wed Apr 27 18:17:58 2022 EDT
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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=== START OF READ SMART DATA SECTION ===
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SMART Status not supported: Incomplete response, ATA output registers missing
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SMART overall-health self-assessment test result: PASSED
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Warning: This result is based on an Attribute check.
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General SMART Values:
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Offline data collection status: (0x00) Offline data collection activity
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was never started.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 0) seconds.
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Offline data collection
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capabilities: (0x53) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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No Offline surface scan supported.
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Self-test supported.
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No Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 85) minutes.
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SCT capabilities: (0x003d) SCT Status supported.
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SCT Error Recovery Control supported.
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SCT Feature Control supported.
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SCT Data Table supported.
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SMART Attributes Data Structure revision number: 1
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
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5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
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9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 1056
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12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 253
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177 Wear_Leveling_Count 0x0013 099 099 000 Pre-fail Always - 6
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179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
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181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
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182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
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183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
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187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0
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190 Airflow_Temperature_Cel 0x0032 067 046 000 Old_age Always - 33
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195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0
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199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
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235 POR_Recovery_Count 0x0012 099 099 000 Old_age Always - 97
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241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 3436547254
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SMART Error Log Version: 1
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No Errors Logged
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SMART Self-test log structure revision number 1
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No self-tests have been logged. [To run self-tests, use: smartctl -t]
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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