mirror of
https://github.com/bsdhw/SMART.git
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146 lines
6.4 KiB
Plaintext
146 lines
6.4 KiB
Plaintext
smartctl 7.4 2023-08-01 r5530 [FreeBSD 13.2-RELEASE-p5 amd64] (local build)
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Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Family: Samsung based SSDs
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Device Model: SAMSUNG SSD PM830 mSATA 32GB
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Serial Number: --
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LU WWN Device Id: 5 002538 ...
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Firmware Version: CXM13D1Q
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User Capacity: 32,017,047,552 bytes [32.0 GB]
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Sector Size: 512 bytes logical/physical
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Rotation Rate: Solid State Device
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TRIM Command: Available
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Device is: In smartctl database 7.3/5528
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ATA Version is: ATA8-ACS T13/1699-D revision 4c
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SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
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Local Time is: Fri Dec 8 09:33:38 2023 PST
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Disabled
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APM feature is: Unavailable
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Rd look-ahead is: Enabled
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Write cache is: Enabled
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DSN feature is: Unavailable
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ATA Security is: Disabled, frozen [SEC2]
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Wt Cache Reorder: Unavailable
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x02) Offline data collection activity
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was completed without error.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 180) seconds.
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Offline data collection
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capabilities: (0x53) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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No Offline surface scan supported.
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Self-test supported.
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No Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 3) minutes.
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SMART Attributes Data Structure revision number: 1
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
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9 Power_On_Hours -O--CK 089 089 000 - 50528
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12 Power_Cycle_Count -O--CK 099 099 000 - 185
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175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0
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176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0
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177 Wear_Leveling_Count PO--C- 026 026 010 - 2693
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178 Used_Rsvd_Blk_Cnt_Chip PO--C- 090 090 010 - 40
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179 Used_Rsvd_Blk_Cnt_Tot PO--C- 091 091 010 - 68
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180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 091 091 010 - 748
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181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
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182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
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183 Runtime_Bad_Block PO--C- 100 100 010 - 0
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187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0
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195 ECC_Error_Rate -O-RC- 200 200 000 - 0
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198 Offline_Uncorrectable ----CK 100 100 000 - 0
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199 CRC_Error_Count -OSRCK 253 253 000 - 0
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232 Available_Reservd_Space PO--C- 090 090 000 - 368
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241 Total_LBAs_Written -O--CK 099 099 000 - 94653787633
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242 Total_LBAs_Read -O--CK 099 099 000 - 20301053761
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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General Purpose Log Directory Version 1
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SMART Log Directory Version 1 [multi-sector log support]
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Address Access R/W Size Description
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0x00 GPL,SL R/O 1 Log Directory
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0x01 GPL,SL R/O 1 Summary SMART error log
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0x02 GPL,SL R/O 2 Comprehensive SMART error log
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0x03 GPL,SL R/O 2 Ext. Comprehensive SMART error log
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0x06 GPL,SL R/O 1 SMART self-test log
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0x07 GPL,SL R/O 2 Extended self-test log
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0x09 GPL,SL R/W 1 Selective self-test log
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0x10 GPL,SL R/O 1 NCQ Command Error log
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0x11 GPL,SL R/O 1 SATA Phy Event Counters log
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0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
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No Errors Logged
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SMART Extended Self-test Log Version: 1 (2 sectors)
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No self-tests have been logged. [To run self-tests, use: smartctl -t]
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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SCT Commands not supported
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Device Statistics (GP/SMART Log 0x04) not supported
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Pending Defects log (GP Log 0x0c) not supported
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SATA Phy Event Counters (GP Log 0x11)
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ID Size Value Description
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0x0001 2 0 Command failed due to ICRC error
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0x0002 2 49152 R_ERR response for data FIS
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0x0003 2 53248 R_ERR response for device-to-host data FIS
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0x0004 2 57344 R_ERR response for host-to-device data FIS
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0x0005 2 7952 R_ERR response for non-data FIS
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0x0006 2 2562 R_ERR response for device-to-host non-data FIS
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0x0007 2 4096 R_ERR response for host-to-device non-data FIS
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0x0008 2 7952 Device-to-host non-data FIS retries
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0x0009 2 7953 Transition from drive PhyRdy to drive PhyNRdy
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0x000a 2 2943 Device-to-host register FISes sent due to a COMRESET
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0x000b 2 6145 CRC errors within host-to-device FIS
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0x000d 2 7953 Non-CRC errors within host-to-device FIS
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0x000f 2 8176 R_ERR response for host-to-device data FIS, CRC
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0x0010 2 15 R_ERR response for host-to-device data FIS, non-CRC
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0x0012 2 49153 R_ERR response for host-to-device non-data FIS, CRC
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0x0013 2 12112 R_ERR response for host-to-device non-data FIS, non-CRC
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