mirror of
https://github.com/bsdhw/SMART.git
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197 lines
9.7 KiB
Plaintext
197 lines
9.7 KiB
Plaintext
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p7 amd64] (local build)
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Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Family: Silicon Motion based SSDs
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Device Model: TS256GMSA230S
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Serial Number: --
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LU WWN Device Id: 5 7c3548 ...
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Firmware Version: 22Z2UCFS
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User Capacity: 256,060,514,304 bytes [256 GB]
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Sector Size: 512 bytes logical/physical
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Rotation Rate: Solid State Device
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Form Factor: 2.5 inches
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TRIM Command: Available, deterministic, zeroed
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Device is: In smartctl database 7.3/5319
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ATA Version is: ACS-3 T13/2161-D revision 5
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SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s)
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Local Time is: Sun Apr 9 18:07:14 2023 BST
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Unavailable
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APM level is: 254 (maximum performance)
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Rd look-ahead is: Enabled
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Write cache is: Enabled
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DSN feature is: Unavailable
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ATA Security is: Disabled, frozen [SEC2]
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Wt Cache Reorder: Unavailable
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x00) Offline data collection activity
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was never started.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 0) seconds.
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Offline data collection
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capabilities: (0x7b) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0002) Does not save SMART data before
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entering power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 2) minutes.
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Extended self-test routine
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recommended polling time: ( 30) minutes.
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Conveyance self-test routine
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recommended polling time: ( 2) minutes.
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SMART Attributes Data Structure revision number: 16
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate ------ 100 100 000 - 0
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5 Reallocated_Sector_Ct ------ 100 100 000 - 0
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9 Power_On_Hours ------ 100 100 000 - 5
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12 Power_Cycle_Count ------ 100 100 000 - 31
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148 Total_SLC_Erase_Ct ------ 100 100 000 - 66
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149 Max_SLC_Erase_Ct ------ 100 100 000 - 4
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150 Min_SLC_Erase_Ct ------ 100 100 000 - 0
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151 Average_SLC_Erase_Ct ------ 100 100 000 - 0
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159 DRAM_1_Bit_Error_Count ------ 100 100 000 - 0
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160 Uncorrectable_Error_Cnt ------ 100 100 000 - 0
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161 Valid_Spare_Block_Cnt ------ 100 100 000 - 74
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163 Initial_Bad_Block_Count ------ 100 100 000 - 45
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164 Total_Erase_Count ------ 100 100 000 - 294
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165 Max_Erase_Count ------ 100 100 000 - 2
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166 Min_Erase_Count ------ 100 100 000 - 0
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167 Average_Erase_Count ------ 100 100 000 - 0
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168 Max_Erase_Count_of_Spec ------ 100 100 000 - 3000
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169 Remaining_Lifetime_Perc ------ 100 100 000 - 100
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177 Wear_Leveling_Count ------ 100 100 050 - 0
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181 Program_Fail_Cnt_Total ------ 100 100 000 - 0
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182 Erase_Fail_Count_Total ------ 100 100 000 - 0
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192 Power-Off_Retract_Count ------ 100 100 000 - 9
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194 Temperature_Celsius ------ 100 100 000 - 61
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195 Hardware_ECC_Recovered ------ 100 100 000 - 0
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196 Reallocated_Event_Count ------ 100 100 016 - 0
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199 UDMA_CRC_Error_Count ------ 100 100 050 - 1
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232 Available_Reservd_Space ------ 100 100 000 - 100
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241 Host_Writes_32MiB ------ 100 100 000 - 381
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242 Host_Reads_32MiB ------ 100 100 000 - 346
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245 TLC_Writes_32MiB ------ 100 100 000 - 1543
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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General Purpose Log Directory Version 1
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SMART Log Directory Version 1 [multi-sector log support]
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Address Access R/W Size Description
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0x00 GPL,SL R/O 1 Log Directory
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0x01 SL R/O 1 Summary SMART error log
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0x02 SL R/O 1 Comprehensive SMART error log
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0x03 GPL R/O 1 Ext. Comprehensive SMART error log
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0x04 GPL,SL R/O 8 Device Statistics log
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0x06 SL R/O 1 SMART self-test log
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0x07 GPL R/O 1 Extended self-test log
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0x09 SL R/W 1 Selective self-test log
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0x10 GPL R/O 1 NCQ Command Error log
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0x11 GPL R/O 1 SATA Phy Event Counters log
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0x24 GPL R/O 88 Current Device Internal Status Data log
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0x25 GPL R/O 64 Saved Device Internal Status Data log
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0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
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No Errors Logged
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SMART Extended Self-test Log Version: 1 (1 sectors)
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No self-tests have been logged. [To run self-tests, use: smartctl -t]
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SMART Selective self-test log data structure revision number 1
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Completed [00% left] (0-65535)
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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SCT Commands not supported
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Device Statistics (GP Log 0x04)
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Page Offset Size Value Flags Description
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0x01 ===== = = === == General Statistics (rev 1) ==
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0x01 0x008 4 31 --- Lifetime Power-On Resets
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0x01 0x010 4 5 --- Power-on Hours
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0x01 0x018 6 25020613 --- Logical Sectors Written
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0x01 0x020 6 417519 --- Number of Write Commands
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0x01 0x028 6 22731468 --- Logical Sectors Read
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0x01 0x030 6 453309 --- Number of Read Commands
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0x01 0x038 6 21067718 --- Date and Time TimeStamp
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0x04 ===== = = === == General Errors Statistics (rev 1) ==
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0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
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0x04 0x010 4 10 --- Resets Between Cmd Acceptance and Completion
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0x05 ===== = = === == Temperature Statistics (rev 1) ==
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0x05 0x008 1 61 --- Current Temperature
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0x05 0x010 1 51 --- Average Short Term Temperature
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0x05 0x018 1 46 --- Average Long Term Temperature
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0x05 0x020 1 72 --- Highest Temperature
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0x05 0x028 1 25 --- Lowest Temperature
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0x05 0x030 1 51 --- Highest Average Short Term Temperature
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0x05 0x038 1 0 --- Lowest Average Short Term Temperature
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0x05 0x040 1 46 --- Highest Average Long Term Temperature
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0x05 0x048 1 0 --- Lowest Average Long Term Temperature
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0x05 0x050 4 10 --- Time in Over-Temperature
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0x05 0x058 1 65 --- Specified Maximum Operating Temperature
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0x05 0x060 4 0 --- Time in Under-Temperature
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0x05 0x068 1 0 --- Specified Minimum Operating Temperature
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0x06 ===== = = === == Transport Statistics (rev 1) ==
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0x06 0x008 4 36 --- Number of Hardware Resets
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0x06 0x010 4 0 --- Number of ASR Events
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0x06 0x018 4 1 --- Number of Interface CRC Errors
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0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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0x07 0x008 1 0 --- Percentage Used Endurance Indicator
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|||_ C monitored condition met
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||__ D supports DSN
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|___ N normalized value
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Pending Defects log (GP Log 0x0c) not supported
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SATA Phy Event Counters (GP Log 0x11)
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ID Size Value Description
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0x0001 2 0 Command failed due to ICRC error
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0x0002 2 0 R_ERR response for data FIS
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0x0003 2 0 R_ERR response for device-to-host data FIS
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0x0004 2 0 R_ERR response for host-to-device data FIS
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0x0005 2 0 R_ERR response for non-data FIS
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0x0006 2 0 R_ERR response for device-to-host non-data FIS
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0x0007 2 0 R_ERR response for host-to-device non-data FIS
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0x0008 2 0 Device-to-host non-data FIS retries
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0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
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0x000a 2 3 Device-to-host register FISes sent due to a COMRESET
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0x000b 2 0 CRC errors within host-to-device FIS
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0x000d 2 0 Non-CRC errors within host-to-device FIS
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0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
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0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
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0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
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0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
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