1
0
mirror of https://github.com/bsdhw/SMART.git synced 2025-05-31 16:21:41 +05:30
Files
2025-01-05 02:37:11 +03:00

158 lines
7.2 KiB
Plaintext

smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.1-RELEASE-p2 amd64] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: WD Green M.2 2280 240GB
Serial Number: --
LU WWN Device Id: 5 001b44 ...
Firmware Version: 42051100
User Capacity: 240,057,409,536 bytes [240 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: M.2
TRIM Command: Available, deterministic
Device is: Not in smartctl database 7.3/5528
ATA Version is: ACS-4, ACS-2 T13/2015-D revision 3
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun Jul 28 02:43:40 2024 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x71) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.
Conveyance self-test routine
recommended polling time: ( 1) minutes.
SMART Attributes Data Structure revision number: 0
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct -O--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 100 100 000 - 2
12 Power_Cycle_Count -O--CK 100 100 000 - 12
165 Unknown_Attribute -O--CK 100 100 000 - 9775498660126
166 Unknown_Attribute -O--CK 100 100 000 - 84
167 Unknown_Attribute -O--CK 100 100 000 - 88
168 Unknown_Attribute -O--CK 100 100 000 - 135
169 Unknown_Attribute -O--CK 100 100 000 - 202
170 Unknown_Attribute -O--CK 100 100 000 - 0
171 Unknown_Attribute -O--CK 100 100 000 - 0
172 Unknown_Attribute -O--CK 100 100 000 - 0
173 Unknown_Attribute -O--CK 100 100 005 - 107
174 Unknown_Attribute -O--CK 100 100 000 - 1
184 End-to-End_Error -O--CK 100 100 097 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
188 Command_Timeout -O--CK 100 100 000 - 0
194 Temperature_Celsius -O---K 100 100 014 - 48 (Min/Max 24/58)
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
230 Unknown_SSD_Attribute -O--CK 100 100 000 - 5854395368787
232 Available_Reservd_Space PO--CK 100 100 000 - 63
233 Media_Wearout_Indicator -O--CK 100 100 000 - 0
234 Unknown_Attribute -O--CK 100 100 000 - 37853
241 Total_LBAs_Written ----CK 253 253 000 - 6595
242 Total_LBAs_Read ----CK 253 253 000 - 38
244 Unknown_Attribute -O--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x03 GPL R/O 16 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0-0xa1 GPL,SL VS 1 Device vendor specific log
0xa2 GPL,SL VS 2 Device vendor specific log
0xa3-0xa7 GPL,SL VS 1 Device vendor specific log
0xde GPL,SL VS 1 Device vendor specific log
Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum.
SMART Extended Comprehensive Error Log Version: 1 (16 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (empty) ==
0x05 ===== = = === == Temperature Statistics (empty) ==
0x07 ===== = = === == Solid State Device Statistics (empty) ==
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 44 Device-to-host register FISes sent due to a COMRESET
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC