mirror of
https://github.com/bsdhw/SMART.git
synced 2025-05-31 16:21:41 +05:30
188 lines
8.1 KiB
Plaintext
188 lines
8.1 KiB
Plaintext
smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build)
|
|
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
|
|
|
|
=== START OF INFORMATION SECTION ===
|
|
Model Family: SAMSUNG SpinPoint F3
|
|
Device Model: SAMSUNG HD502HJ
|
|
Serial Number: --
|
|
LU WWN Device Id: 5 0024e9 ...
|
|
Firmware Version: 1AJ10001
|
|
User Capacity: 500,107,862,016 bytes [500 GB]
|
|
Sector Size: 512 bytes logical/physical
|
|
Rotation Rate: 7200 rpm
|
|
Form Factor: 3.5 inches
|
|
Device is: In smartctl database [for details use: -P show]
|
|
ATA Version is: ATA8-ACS T13/1699-D revision 6
|
|
SATA Version is: SATA 2.6, 3.0 Gb/s
|
|
Local Time is: Wed Feb 10 15:47:21 2021 EST
|
|
SMART support is: Available - device has SMART capability.
|
|
SMART support is: Enabled
|
|
AAM feature is: Disabled
|
|
APM feature is: Disabled
|
|
Rd look-ahead is: Enabled
|
|
Write cache is: Enabled
|
|
DSN feature is: Unavailable
|
|
ATA Security is: Disabled, NOT FROZEN [SEC1]
|
|
Write SCT (Get) Feature Control Command failed: Read of ATA output registers not implemented [JMicron]
|
|
Wt Cache Reorder: Unknown (SCT Feature Control command failed)
|
|
|
|
=== START OF READ SMART DATA SECTION ===
|
|
SMART overall-health self-assessment test result: PASSED
|
|
|
|
General SMART Values:
|
|
Offline data collection status: (0x00) Offline data collection activity
|
|
was never started.
|
|
Auto Offline Data Collection: Disabled.
|
|
Self-test execution status: ( 0) The previous self-test routine completed
|
|
without error or no self-test has ever
|
|
been run.
|
|
Total time to complete Offline
|
|
data collection: ( 4560) seconds.
|
|
Offline data collection
|
|
capabilities: (0x5b) SMART execute Offline immediate.
|
|
Auto Offline data collection on/off support.
|
|
Suspend Offline collection upon new
|
|
command.
|
|
Offline surface scan supported.
|
|
Self-test supported.
|
|
No Conveyance Self-test supported.
|
|
Selective Self-test supported.
|
|
SMART capabilities: (0x0003) Saves SMART data before entering
|
|
power-saving mode.
|
|
Supports SMART auto save timer.
|
|
Error logging capability: (0x01) Error logging supported.
|
|
General Purpose Logging supported.
|
|
Short self-test routine
|
|
recommended polling time: ( 2) minutes.
|
|
Extended self-test routine
|
|
recommended polling time: ( 76) minutes.
|
|
SCT capabilities: (0x003f) SCT Status supported.
|
|
SCT Error Recovery Control supported.
|
|
SCT Feature Control supported.
|
|
SCT Data Table supported.
|
|
|
|
SMART Attributes Data Structure revision number: 16
|
|
Vendor Specific SMART Attributes with Thresholds:
|
|
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
|
|
1 Raw_Read_Error_Rate POSR-K 100 100 051 - 6
|
|
2 Throughput_Performance -OS--K 252 252 000 - 0
|
|
3 Spin_Up_Time PO---K 082 082 025 - 5564
|
|
4 Start_Stop_Count -O--CK 100 100 000 - 144
|
|
5 Reallocated_Sector_Ct PO--CK 252 252 010 - 0
|
|
7 Seek_Error_Rate -OSR-K 252 252 051 - 0
|
|
8 Seek_Time_Performance --S--K 252 252 015 - 0
|
|
9 Power_On_Hours -O--CK 100 100 000 - 45051
|
|
10 Spin_Retry_Count -O--CK 252 252 051 - 0
|
|
11 Calibration_Retry_Count -O--CK 252 252 000 - 0
|
|
12 Power_Cycle_Count -O--CK 100 100 000 - 150
|
|
191 G-Sense_Error_Rate -O---K 252 252 000 - 0
|
|
192 Power-Off_Retract_Count -O---K 252 252 000 - 0
|
|
194 Temperature_Celsius -O---- 064 048 000 - 35 (Min/Max 17/53)
|
|
195 Hardware_ECC_Recovered -O-RCK 100 100 000 - 0
|
|
196 Reallocated_Event_Count -O--CK 252 252 000 - 0
|
|
197 Current_Pending_Sector -O--CK 252 252 000 - 0
|
|
198 Offline_Uncorrectable ----CK 252 252 000 - 0
|
|
199 UDMA_CRC_Error_Count -OS-CK 100 100 000 - 18
|
|
200 Multi_Zone_Error_Rate -O-R-K 100 100 000 - 7
|
|
223 Load_Retry_Count -O--CK 252 252 000 - 0
|
|
225 Load_Cycle_Count -O--CK 100 100 000 - 151
|
|
||||||_ K auto-keep
|
|
|||||__ C event count
|
|
||||___ R error rate
|
|
|||____ S speed/performance
|
|
||_____ O updated online
|
|
|______ P prefailure warning
|
|
|
|
ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented [JMicron]
|
|
Read GP Log Directory failed
|
|
|
|
SMART Log Directory Version 1 [multi-sector log support]
|
|
Address Access R/W Size Description
|
|
0x00 SL R/O 1 Log Directory
|
|
0x01 SL R/O 1 Summary SMART error log
|
|
0x02 SL R/O 2 Comprehensive SMART error log
|
|
0x06 SL R/O 1 SMART self-test log
|
|
0x09 SL R/W 1 Selective self-test log
|
|
0x80-0x9f SL R/W 16 Host vendor specific log
|
|
0xe0 SL R/W 1 SCT Command/Status
|
|
0xe1 SL R/W 1 SCT Data Transfer
|
|
|
|
SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
|
|
|
|
SMART Error Log Version: 1
|
|
ATA Error Count: 1
|
|
CR = Command Register [HEX]
|
|
FR = Features Register [HEX]
|
|
SC = Sector Count Register [HEX]
|
|
SN = Sector Number Register [HEX]
|
|
CL = Cylinder Low Register [HEX]
|
|
CH = Cylinder High Register [HEX]
|
|
DH = Device/Head Register [HEX]
|
|
DC = Device Command Register [HEX]
|
|
ER = Error register [HEX]
|
|
ST = Status register [HEX]
|
|
Powered_Up_Time is measured from power on, and printed as
|
|
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
|
|
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
|
|
|
|
Error 1 occurred at disk power-on lifetime: 18658 hours (777 days + 10 hours)
|
|
When the command that caused the error occurred, the device was active or idle.
|
|
|
|
After command completion occurred, registers were:
|
|
ER ST SC SN CL CH DH
|
|
-- -- -- -- -- -- --
|
|
84 51 01 00 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000000 = 0
|
|
|
|
Commands leading to the command that caused the error were:
|
|
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
|
|
-- -- -- -- -- -- -- -- ---------------- --------------------
|
|
c8 00 01 00 00 00 e0 00 00:08:16.000 READ DMA
|
|
ef 03 42 00 00 00 a0 00 00:08:16.000 SET FEATURES [Set transfer mode]
|
|
ec 00 00 00 00 00 a0 00 00:08:16.000 IDENTIFY DEVICE
|
|
00 00 01 01 00 00 00 00 00:08:16.000 NOP [Abort queued commands]
|
|
00 00 01 01 00 00 00 00 00:08:15.996 NOP [Abort queued commands]
|
|
|
|
SMART Extended Self-test Log (GP Log 0x07) not supported
|
|
|
|
SMART Self-test log structure revision number 1
|
|
No self-tests have been logged. [To run self-tests, use: smartctl -t]
|
|
|
|
SMART Selective self-test log data structure revision number 0
|
|
Note: revision number not 1 implies that no selective self-test has ever been run
|
|
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
|
|
1 0 0 Completed [00% left] (0-65535)
|
|
2 0 0 Not_testing
|
|
3 0 0 Not_testing
|
|
4 0 0 Not_testing
|
|
5 0 0 Not_testing
|
|
Selective self-test flags (0x0):
|
|
After scanning selected spans, do NOT read-scan remainder of disk.
|
|
If Selective self-test is pending on power-up, resume after 0 minute delay.
|
|
|
|
SCT Status Version: 2
|
|
SCT Version (vendor specific): 256 (0x0100)
|
|
Device State: Active (0)
|
|
Current Temperature: 35 Celsius
|
|
Power Cycle Min/Max Temperature: 21/35 Celsius
|
|
Lifetime Min/Max Temperature: 20/67 Celsius
|
|
Specified Max Operating Temperature: 80 Celsius
|
|
Under/Over Temperature Limit Count: 0/0
|
|
|
|
SCT Temperature History Version: 2
|
|
Temperature Sampling Period: 5 minutes
|
|
Temperature Logging Interval: 5 minutes
|
|
Min/Max recommended Temperature: -5/80 Celsius
|
|
Min/Max Temperature Limit: -10/85 Celsius
|
|
Temperature History Size (Index): 128 (0)
|
|
|
|
Write SCT (Get) Error Recovery Control Command failed: Read of ATA output registers not implemented [JMicron]
|
|
SCT (Get) Error Recovery Control command failed
|
|
|
|
Device Statistics (GP/SMART Log 0x04) not supported
|
|
|
|
Pending Defects log (GP Log 0x0c) not supported
|
|
|
|
ATA_READ_LOG_EXT (addr=0x11:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented [JMicron]
|
|
Read SATA Phy Event Counters failed
|
|
|