mirror of
https://github.com/bsdhw/SMART.git
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202 lines
8.4 KiB
Plaintext
202 lines
8.4 KiB
Plaintext
smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE amd64] (local build)
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Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Device Model: SAMSUNG SP0411N
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Serial Number: --
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Firmware Version: TW100-11
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User Capacity: 40,059,321,856 bytes [40.0 GB]
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Sector Size: 512 bytes logical/physical
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Device is: Not in smartctl database [for details use: -P showall]
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ATA Version is: ATA/ATAPI-7 T13/1532D revision 0
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Local Time is: Sat Apr 17 14:24:02 2021 UTC
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Disabled
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APM feature is: Unavailable
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Rd look-ahead is: Enabled
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Write cache is: Enabled
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DSN feature is: Unavailable
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ATA Security is: Disabled, frozen [SEC2]
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Wt Cache Reorder: Unavailable
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x00) Offline data collection activity
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was never started.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 900) seconds.
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Offline data collection
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capabilities: (0x1b) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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No Conveyance Self-test supported.
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No Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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No General Purpose Logging support.
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Short self-test routine
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recommended polling time: ( 1) minutes.
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Extended self-test routine
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recommended polling time: ( 15) minutes.
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SMART Attributes Data Structure revision number: 16
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate PO-R-- 100 100 051 - 40
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3 Spin_Up_Time POS--- 074 057 000 - 4736
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4 Start_Stop_Count -O--CK 096 096 000 - 4210
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5 Reallocated_Sector_Ct PO--CK 253 253 010 - 0
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7 Seek_Error_Rate PO-R-- 253 253 051 - 0
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8 Seek_Time_Performance --S--K 253 253 000 - 0
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9 Power_On_Hours -O--CK 098 098 000 - 1459740
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10 Spin_Retry_Count PO--C- 253 253 049 - 0
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12 Power_Cycle_Count -O--CK 098 098 000 - 2223
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194 Temperature_Celsius -O---K 127 058 000 - 37
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195 Hardware_ECC_Recovered -O-R-- 100 100 000 - 100878490
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196 Reallocated_Event_Count -O--C- 099 099 000 - 4
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197 Current_Pending_Sector PO--CK 253 253 010 - 0
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198 Offline_Uncorrectable P---CK 099 099 010 - 4
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199 UDMA_CRC_Error_Count PO-R-- 100 100 051 - 76
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200 Multi_Zone_Error_Rate PO-R-- 100 100 051 - 0
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201 Soft_Read_Error_Rate PO-R-- 100 100 051 - 3
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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General Purpose Log Directory not supported
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SMART Log Directory Version 1 [multi-sector log support]
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Address Access R/W Size Description
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0x00 SL R/O 1 Log Directory
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0x01 SL R/O 1 Summary SMART error log
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0x02 SL R/O 2 Comprehensive SMART error log
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0x06 SL R/O 2 SMART self-test log
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0x80-0x9f SL R/W 16 Host vendor specific log
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SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
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SMART Error Log Version: 1
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Warning: ATA error count 37632 inconsistent with error log pointer 5
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ATA Error Count: 37632 (device log contains only the most recent five errors)
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CR = Command Register [HEX]
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FR = Features Register [HEX]
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SC = Sector Count Register [HEX]
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SN = Sector Number Register [HEX]
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CL = Cylinder Low Register [HEX]
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CH = Cylinder High Register [HEX]
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DH = Device/Head Register [HEX]
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DC = Device Command Register [HEX]
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ER = Error register [HEX]
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ST = Status register [HEX]
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Powered_Up_Time is measured from power on, and printed as
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DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
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SS=sec, and sss=millisec. It "wraps" after 49.710 days.
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Error 37632 occurred at disk power-on lifetime: 12069 hours (502 days + 21 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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01 51 40 00 58 53 f1 Error: AMNF 64 sectors at LBA = 0x01535800 = 22239232
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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c8 00 40 00 58 53 f1 00 20d+23:36:49.938 READ DMA
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ca 00 08 c0 00 00 f0 00 20d+23:36:43.938 WRITE DMA
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ca 00 40 c0 ae 47 f2 00 20d+23:36:43.938 WRITE DMA
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ca 00 08 40 00 9e f0 00 20d+23:36:43.938 WRITE DMA
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c8 00 08 88 12 c3 f4 00 20d+23:36:43.438 READ DMA
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Error 37631 occurred at disk power-on lifetime: 10748 hours (447 days + 20 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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84 51 00 e8 05 88 f0 Error: ICRC, ABRT at LBA = 0x008805e8 = 8914408
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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c8 00 00 e8 05 88 f0 00 00:17:40.313 READ DMA
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c8 00 00 e8 05 87 f0 00 00:17:40.313 READ DMA
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c8 00 00 e8 05 86 f0 00 00:17:40.313 READ DMA
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c8 00 00 e8 05 85 f0 00 00:17:40.313 READ DMA
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c8 00 00 e8 05 84 f0 00 00:17:40.313 READ DMA
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Error 37630 occurred at disk power-on lifetime: 9893 hours (412 days + 5 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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04 51 01 01 00 00 b0
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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b1 10 01 01 00 00 b0 00 00:12:06.000 DEVICE CONFIGURATION [Reserved subcommand] [OBS-ACS-3]
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Error 37629 occurred at disk power-on lifetime: 9893 hours (412 days + 5 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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04 51 01 01 00 00 b0
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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b1 10 01 01 00 00 b0 00 00:11:28.938 DEVICE CONFIGURATION [Reserved subcommand] [OBS-ACS-3]
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Error 37628 occurred at disk power-on lifetime: 9893 hours (412 days + 5 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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04 51 01 01 00 00 b0
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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b1 10 01 01 00 00 b0 00 00:06:12.000 DEVICE CONFIGURATION [Reserved subcommand] [OBS-ACS-3]
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SMART Extended Self-test Log (GP Log 0x07) not supported
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SMART Self-test log structure revision number 1
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Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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# 1 Short offline Completed without error 00% 11545 -
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Selective Self-tests/Logging not supported
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SCT Commands not supported
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Device Statistics (GP/SMART Log 0x04) not supported
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Pending Defects log (GP Log 0x0c) not supported
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SATA Phy Event Counters (GP Log 0x11) not supported
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