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https://github.com/bsdhw/SMART.git
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156 lines
6.6 KiB
Plaintext
156 lines
6.6 KiB
Plaintext
smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.0-STABLE amd64] (local build)
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Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Family: SAMSUNG SpinPoint P120
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Device Model: SAMSUNG SP2004C
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Serial Number: --
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Firmware Version: VM100-50
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User Capacity: 200,049,647,616 bytes [200 GB]
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Sector Size: 512 bytes logical/physical
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Device is: In smartctl database 7.3/5319
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ATA Version is: ATA/ATAPI-7 T13/1532D revision 4a
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Local Time is: Wed Apr 6 21:45:36 2022 MSK
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==> WARNING: May need -F samsung3 enabled; see manual for details.
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM feature is: Disabled
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APM feature is: Unavailable
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Rd look-ahead is: Enabled
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Write cache is: Enabled
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DSN feature is: Unavailable
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ATA Security is: Disabled, NOT FROZEN [SEC1]
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Wt Cache Reorder: Enabled
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x02) Offline data collection activity
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was completed without error.
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Auto Offline Data Collection: Disabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 4542) seconds.
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Offline data collection
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capabilities: (0x5b) SMART execute Offline immediate.
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Auto Offline data collection on/off support.
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Suspend Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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No Conveyance Self-test supported.
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Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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General Purpose Logging supported.
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Short self-test routine
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recommended polling time: ( 1) minutes.
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Extended self-test routine
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recommended polling time: ( 75) minutes.
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SCT capabilities: (0x003f) SCT Status supported.
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SCT Error Recovery Control supported.
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SCT Feature Control supported.
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SCT Data Table supported.
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SMART Attributes Data Structure revision number: 16
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate POSR-- 100 100 051 - 0
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3 Spin_Up_Time POS--- 253 253 025 - 5760
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4 Start_Stop_Count -O--CK 096 096 000 - 4388
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5 Reallocated_Sector_Ct PO--CK 253 253 010 - 0
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7 Seek_Error_Rate POSR-- 253 253 051 - 0
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8 Seek_Time_Performance P-S--K 253 253 015 - 0
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9 Power_On_Hours -O--CK 100 100 000 - 3736
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10 Spin_Retry_Count PO--CK 253 253 051 - 0
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11 Calibration_Retry_Count -O--C- 253 253 000 - 0
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12 Power_Cycle_Count -O--CK 097 097 000 - 3786
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187 Reported_Uncorrect -O--CK 097 097 000 - 4
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190 Airflow_Temperature_Cel -O---K 148 118 000 - 30
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194 Temperature_Celsius -O---K 148 118 000 - 30
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195 Hardware_ECC_Recovered -O-RC- 100 100 000 - 570833
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196 Reallocated_Event_Count -O--CK 253 253 000 - 0
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197 Current_Pending_Sector -O--C- 253 100 000 - 0
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198 Offline_Uncorrectable ----CK 253 253 000 - 0
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199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 0
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200 Multi_Zone_Error_Rate -O-R-- 100 100 000 - 0
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201 Soft_Read_Error_Rate -O-R-- 253 100 000 - 0
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202 Data_Address_Mark_Errs -O--CK 100 100 000 - 3
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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General Purpose Log Directory Version 1
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SMART Log Directory Version 1 [multi-sector log support]
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Address Access R/W Size Description
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0x00 GPL,SL R/O 1 Log Directory
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0x01 SL R/O 1 Summary SMART error log
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0x02 SL R/O 2 Comprehensive SMART error log
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0x03 GPL R/O 2 Ext. Comprehensive SMART error log
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0x06 SL R/O 1 SMART self-test log
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0x10 GPL R/O 1 NCQ Command Error log
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0x11 GPL R/O 1 SATA Phy Event Counters log
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0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
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Invalid Error Log index = 0x0500 (reserved = 0x00)
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SMART Extended Self-test Log (GP Log 0x07) not supported
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SMART Self-test log structure revision number 1
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No self-tests have been logged. [To run self-tests, use: smartctl -t]
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SMART Selective self-test log data structure revision number 0
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Note: revision number not 1 implies that no selective self-test has ever been run
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SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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1 0 0 Not_testing
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2 0 0 Not_testing
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3 0 0 Not_testing
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4 0 0 Not_testing
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5 0 0 Not_testing
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Selective self-test flags (0x0):
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After scanning selected spans, do NOT read-scan remainder of disk.
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If Selective self-test is pending on power-up, resume after 0 minute delay.
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SCT Status Version: 2
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SCT Version (vendor specific): 256 (0x0100)
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Device State: Active (0)
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Current Temperature: 30 Celsius
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Power Cycle Min/Max Temperature: --/31 Celsius
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Lifetime Min/Max Temperature: --/40 Celsius
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SCT Temperature History Version: 2
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Temperature Sampling Period: 1 minute
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Temperature Logging Interval: 1 minute
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Min/Max recommended Temperature: 10/55 Celsius
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Min/Max Temperature Limit: 5/60 Celsius
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Temperature History Size (Index): 128 (63)
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SCT Error Recovery Control:
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Read: Disabled
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Write: Disabled
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Device Statistics (GP/SMART Log 0x04) not supported
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Pending Defects log (GP Log 0x0c) not supported
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SATA Phy Event Counters (GP Log 0x11)
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ID Size Value Description
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0x0001 2 0 Command failed due to ICRC error
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0x000a 2 2 Device-to-host register FISes sent due to a COMRESET
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0x0008 2 0 Device-to-host non-data FIS retries
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0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
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0x000b 2 0 CRC errors within host-to-device FIS
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0x000d 2 0 Non-CRC errors within host-to-device FIS
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0x8001 2 0 Vendor specific
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