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https://github.com/bsdhw/SMART.git
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147 lines
5.9 KiB
Plaintext
147 lines
5.9 KiB
Plaintext
smartctl 7.1 2019-12-30 r5022 [FreeBSD 11.3-RELEASE-p11 i386] (local build)
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Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
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=== START OF INFORMATION SECTION ===
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Model Family: Seagate U6
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Device Model: ST320410A
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Serial Number: --
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Firmware Version: 3.39
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User Capacity: 20,020,396,032 bytes [20.0 GB]
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Sector Size: 512 bytes logical/physical
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Device is: In smartctl database [for details use: -P show]
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ATA Version is: ATA/ATAPI-6 (minor revision not indicated)
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Local Time is: Thu Aug 6 09:23:26 2020 +07
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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AAM level is: 128 (quiet), recommended: 128
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APM level is: 64 (intermediate level with standby)
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Rd look-ahead is: Enabled
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Write cache is: Enabled
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DSN feature is: Unavailable
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ATA Security is: Disabled, frozen [SEC2]
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Wt Cache Reorder: Unavailable
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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General SMART Values:
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Offline data collection status: (0x82) Offline data collection activity
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was completed without error.
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Auto Offline Data Collection: Enabled.
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Self-test execution status: ( 0) The previous self-test routine completed
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without error or no self-test has ever
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been run.
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Total time to complete Offline
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data collection: ( 420) seconds.
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Offline data collection
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capabilities: (0x1d) SMART execute Offline immediate.
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No Auto Offline data collection support.
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Abort Offline collection upon new
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command.
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Offline surface scan supported.
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Self-test supported.
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No Conveyance Self-test supported.
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No Selective Self-test supported.
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SMART capabilities: (0x0003) Saves SMART data before entering
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power-saving mode.
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Supports SMART auto save timer.
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Error logging capability: (0x01) Error logging supported.
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No General Purpose Logging support.
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Short self-test routine
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recommended polling time: ( 1) minutes.
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Extended self-test routine
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recommended polling time: ( 42) minutes.
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SMART Attributes Data Structure revision number: 16
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate POSR-- 062 052 025 - 182602739
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3 Spin_Up_Time PO---- 098 098 000 - 0
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4 Start_Stop_Count -O--CK 100 100 020 - 784
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5 Reallocated_Sector_Ct PO--CK 100 100 036 - 2
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7 Seek_Error_Rate POSR-- 077 060 030 - 61036697775
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9 Power_On_Hours -O--CK 030 030 000 - 61916
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10 Spin_Retry_Count PO--C- 100 100 097 - 0
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12 Power_Cycle_Count -O--CK 098 098 020 - 2229
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194 Temperature_Celsius -O---K 031 054 000 - 31
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195 Hardware_ECC_Recovered -O-RC- 100 253 000 - 0
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197 Current_Pending_Sector -O--C- 100 100 000 - 0
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198 Offline_Uncorrectable ----C- 100 100 000 - 0
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199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 0
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200 Multi_Zone_Error_Rate ------ 100 253 000 - 0
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202 Data_Address_Mark_Errs -O--CK 100 253 000 - 0
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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General Purpose Log Directory not supported
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SMART Log Directory Version 1 [multi-sector log support]
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Address Access R/W Size Description
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0x00 SL R/O 1 Log Directory
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0x01 SL R/O 1 Summary SMART error log
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0x02 SL R/O 5 Comprehensive SMART error log
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0x06 SL R/O 1 SMART self-test log
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0x80-0x9f SL R/W 16 Host vendor specific log
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0xa0 SL VS 1 Device vendor specific log
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0xa1 SL VS 20 Device vendor specific log
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0xa2 SL VS 101 Device vendor specific log
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0xa8 SL VS 20 Device vendor specific log
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0xa9 SL VS 1 Device vendor specific log
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SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
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SMART Error Log Version: 1
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ATA Error Count: 1
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CR = Command Register [HEX]
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FR = Features Register [HEX]
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SC = Sector Count Register [HEX]
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SN = Sector Number Register [HEX]
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CL = Cylinder Low Register [HEX]
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CH = Cylinder High Register [HEX]
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DH = Device/Head Register [HEX]
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DC = Device Command Register [HEX]
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ER = Error register [HEX]
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ST = Status register [HEX]
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Powered_Up_Time is measured from power on, and printed as
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DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
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SS=sec, and sss=millisec. It "wraps" after 49.710 days.
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Error 1 occurred at disk power-on lifetime: 75 hours (3 days + 3 hours)
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When the command that caused the error occurred, the device was active or idle.
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After command completion occurred, registers were:
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ER ST SC SN CL CH DH
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-- -- -- -- -- -- --
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00 51 20 71 17 8d eb Error: 32 sectors at LBA = 0x0b8d1771 = 193795953
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Commands leading to the command that caused the error were:
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CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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-- -- -- -- -- -- -- -- ---------------- --------------------
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c8 ff 20 b1 10 2d e0 00 00:00:00.021 READ DMA
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c8 ff 01 4b ee 6d e0 00 00:00:01.261 READ DMA
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c8 ff 01 5f 66 00 e0 00 00:00:12.631 READ DMA
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c8 ff 03 5f f0 18 e0 00 00:00:00.020 READ DMA
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c8 ff 03 29 b9 01 e0 00 00:00:00.027 READ DMA
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SMART Extended Self-test Log (GP Log 0x07) not supported
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SMART Self-test log structure revision number 1
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No self-tests have been logged. [To run self-tests, use: smartctl -t]
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Selective Self-tests/Logging not supported
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SCT Commands not supported
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Device Statistics (GP/SMART Log 0x04) not supported
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Pending Defects log (GP Log 0x0c) not supported
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SATA Phy Event Counters (GP Log 0x11) not supported
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