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smartctl 7.4 2023-08-01 r5530 [FreeBSD 13.2-RELEASE-p2 amd64] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar SE Serial ATA
Device Model: WDC WD800JD-60LSA5
Serial Number: --
Firmware Version: 10.01E03
User Capacity: 80,026,361,856 bytes [80.0 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database 7.3/5528
ATA Version is: ATA/ATAPI-7 (minor revision not indicated)
Local Time is: Thu Aug 10 18:20:53 2023 -03
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 2460) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 33) minutes.
Conveyance self-test routine
recommended polling time: ( 6) minutes.
SCT capabilities: (0x103f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-- 200 200 051 - 0
3 Spin_Up_Time PO---- 166 164 021 - 2683
4 Start_Stop_Count -O--CK 097 097 000 - 3169
5 Reallocated_Sector_Ct PO--CK 200 200 140 - 0
7 Seek_Error_Rate POSR-- 200 200 051 - 0
9 Power_On_Hours -O--CK 028 028 000 - 53248
10 Spin_Retry_Count PO--C- 100 100 051 - 0
11 Calibration_Retry_Count -O--C- 100 100 051 - 0
12 Power_Cycle_Count -O--CK 097 097 000 - 3157
190 Airflow_Temperature_Cel -O---K 058 044 045 Past 42
194 Temperature_Celsius -O---K 101 087 000 - 42
196 Reallocated_Event_Count -O--CK 200 200 000 - 0
197 Current_Pending_Sector -O--C- 200 200 000 - 0
198 Offline_Uncorrectable ----C- 200 200 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 991
200 Multi_Zone_Error_Rate P--R-- 200 200 051 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 5 Comprehensive SMART error log
0x03 GPL R/O 6 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0-0xa7 GPL,SL VS 16 Device vendor specific log
0xa8-0xb7 GPL,SL VS 1 Device vendor specific log
0xc0 GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (6 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 2
SCT Version (vendor specific): 258 (0x0102)
Device State: Active (0)
Current Temperature: 41 Celsius
Power Cycle Min/Max Temperature: --/46 Celsius
Lifetime Min/Max Temperature: --/58 Celsius
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 5/65 Celsius
Min/Max Temperature Limit: 1/70 Celsius
Temperature History Size (Index): 128 (39)
SCT Error Recovery Control:
Read: 75 (7.5 seconds)
Write: 75 (7.5 seconds)
Device Statistics (GP/SMART Log 0x04) not supported
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x000a 2 11 Device-to-host register FISes sent due to a COMRESET
0x8000 4 18132 Vendor specific